Inventor · disambiguated record
Hagen Eckert
Also filed as: ECKERT HAGEN
16 granted patents·175 citations·filing 1998–2020
92Inventor score
Top patents by PatentIndex Score
16 records- 0193US8442789B2Method and device for determining a frequency mask for a frequency spectrumECKERT HAGEN·Filed 2010·Granted May 14, 2013·103 cites·39 claims
- 0287US7840384B2Method and system for the detection and/or removal of sinusoidal interference signals in a noise signalROHDE & SCHWARZ·Filed 2006·Granted Nov 23, 2010·14 cites·16 claims
- 0365US7840385B2Method and system for the detection and/or removal of sinusoidal interference signals in a noise signalROHDE & SCHWARZ·Filed 2007·Granted Nov 23, 2010·2 cites·4 claims
- 0461US9244106B2Method and device for measuring the phase-noise spectrum of a pulsed sinusoidal signalECKERT HAGEN·Filed 2012·Granted Jan 26, 2016·1 cites·12 claims
- 0561US6232760B1Method for determining and compensating the transmission function of a measurement apparatus, in particular of a spectrum analyzerROHDE & SCHWARZ·Filed 1998·Granted May 15, 2001·23 cites·7 claims
- 0659US7765075B2Method and device for spectral analysis in several frequency bands with different frequency resolutionROHDE & SCHWARZ·Filed 2005·Granted Jul 27, 2010·3 cites·17 claims
- 0756US6377902B1Arrangement for continuous and uninterrupted reading of a large volume of data from an electronic measuring device into a memoryROHDE & SCHWARZ·Filed 1999·Granted Apr 23, 2002·19 cites·6 claims
- 0855US7957940B2Method and system for the detection and/or removal of sinusoidal interference signals in a noise signalROHDE & SCHWARZ·Filed 2009·Granted Jun 7, 2011·0 cites·11 claims
- 0953US11005583B1Method of performing a distance-to-fault measurement as well as measurement instrumentROHDE & SCHWARZ·Filed 2020·Granted May 11, 2021·0 cites·17 claims
- 1052US7366233B1Assembly for measurement demodulation and modulation error detection of a digitally modulated receive signalROHDE & SCHWARZ·Filed 2000·Granted Apr 29, 2008·2 cites·11 claims
- 1150US7092456B2Process for synchronizationROHDE & SCHWARZ·Filed 2001·Granted Aug 15, 2006·1 cites·12 claims
- 1249US8093909B2Method and device for measuring phase noiseWENDLER WOLFGANG·Filed 2008·Granted Jan 10, 2012·2 cites·12 claims
- 1349US7885421B2Method and system for noise measurement with combinable subroutines for the measurement, identification and removal of sinusoidal interference signals in a noise signalROHDE & SCHWARZ·Filed 2006·Granted Feb 8, 2011·1 cites·10 claims
- 1448US8768638B2Method and device for performing spectrum analysis of a wanted signal or noise signalFELDHAUS GREGOR·Filed 2005·Granted Jul 1, 2014·2 cites·11 claims
- 1544US10295568B2Measuring device and method for automatic adjustment of contrast in the screen displayROHDE & SCHWARZ·Filed 2013·Granted May 21, 2019·0 cites·17 claims
- 1639US6973401B2Measuring device and method for determining a characteristic curve of a high frequency unitROHDE & SCHWARZ·Filed 2003·Granted Dec 6, 2005·2 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →