Inventor
HAMREN STEVEN L
US23 patents
⚠️ This page may combine multiple inventors who share the name “HAMREN STEVEN L”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
22 patentsUS6490188B2Dec 3, 2002
Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devices
MICRON TECHNOLOGY INC168 citations97
US6307769B1Oct 23, 2001
Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devices
MICRON TECHNOLOGY INC115 citations97
US6579399B1Jun 17, 2003
Method and system for handling semiconductor components
MICRON TECHNOLOGY INC16 citations92
US5927503AJul 27, 1999
Tray for processing and/or shipping integrated circuit device
MICRON TECHNOLOGY INC33 citations92
US5731230AMar 24, 1998
Method for processing and/or shipping integrated circuit devices
MICRON TECHNOLOGY INC23 citations92
US6265886B1Jul 24, 2001
Conductive bump array contactors having an ejector and methods of testing using same
MICRON TECHNOLOGY INC9 citations82
US7456504B2Nov 25, 2008
Electronic component assemblies with electrically conductive bonds
MICRON TECHNOLOGY INC5 citations74
US7135345B2Nov 14, 2006
Methods for processing semiconductor devices in a singulated form
MICRON TECHNOLOGY INC8 citations74
US7126228B2Oct 24, 2006
Apparatus for processing semiconductor devices in a singulated form
MICRON TECHNOLOGY INC7 citations74
US7122389B2Oct 17, 2006
Method for processing semiconductor devices in a singulated form
MICRON TECHNOLOGY INC5 citations74
US6543512B1Apr 8, 2003
Carrier, method and system for handling semiconductor components
MICRON TECHNOLOGY INC12 citations74
US6504390B2Jan 7, 2003
Conductive bump array contactors having an ejector and methods of testing using same
MICRON TECHNOLOGY INC5 citations74
US6504391B2Jan 7, 2003
Conductive bump array contactors having an ejector and methods of testing using same
MICRON TECHNOLOGY INC4 citations74
US6459288B2Oct 1, 2002
Conductive bump array contactors having an ejector and methods of testing using same
MICRON TECHNOLOGY INC3 citations74
US6442056B2Aug 27, 2002
Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devices
MICRON TECHNOLOGY INC9 citations72
US6259263B1Jul 10, 2001
Compliant contactor for testing semiconductors
MICRON TECHNOLOGY INC13 citations71
US6492826B2Dec 10, 2002
Conductive bump array contactors having an ejector and methods of testing using same
MICRON TECHNOLOGY INC2 citations63
US6388459B2May 14, 2002
Conductive bump array contactors having an ejector and methods of testing using same
MICRON TECHNOLOGY INC2 citations63
US6362639B2Mar 26, 2002
Compliant contactor for testing semiconductors
MICRON TECHNOLOGY INC2 citations60
US6293817B1Sep 25, 2001
Extended length, high frequency contactor block
MICRON TECHNOLOGY INC2 citations60
US6483332B2Nov 19, 2002
Conductive bump array contactors having an ejector and methods of testing using same
MICRON TECHNOLOGY INC0 citations52
US6459289B2Oct 1, 2002
Conductive bump array contactors having an ejector and methods of testing using same
MICRON TECHNOLOGY INC0 citations52