P
US7456504B2ExpiredUtilityPatentIndex 74

Electronic component assemblies with electrically conductive bonds

Assignee: MICRON TECHNOLOGY INCPriority: Apr 23, 2003Filed: Nov 13, 2006Granted: Nov 25, 2008
Est. expiryApr 23, 2023(expired)· nominal 20-yr term from priority
Inventors:HAMREN STEVEN LCRAM DANIEL P
G01R 1/0433G01R 1/0408H05K 3/321H10W 72/9415H10W 72/07251H10W 72/90H10W 72/20
74
PatentIndex Score
5
Cited by
39
References
8
Claims

Abstract

Improved methods and apparatus are provided for the handling and testing of semiconductor devices. One embodiment comprises a die carrier for one or more semiconductor dice having very fine pitch electrical I/O (input/output) elements. The semiconductor dice are temporarily attached to the die carrier in singulated form to enable testing the dice with conventional contact technology. The die carrier may include a flex circuit base substrate and a rigid support frame. Further embodiments comprise materials and methods for attaching the semiconductor dice to the die carrier and for providing a temporary electrical connection with the semiconductor dice during testing. Exemplary materials for providing the temporary electrical connection may comprise a conductive film or tape, a conductive or conductor-filled epoxy, resin or RTV adhesive-based materials, a water-soluble material impregnated with a conductive filler or non-reflowed solder paste.

Claims

exact text as granted — not AI-modified
1. An electronic component assembly, comprising:
 an electronic component including a conductive element; 
 a substrate including a conductive element on a surface thereof connected to a conductive element on an opposing surface thereof; and 
 an electrically conductive bond comprising an at least partially solidified water-soluble mask material impregnated with a conductive filler of discrete particles joining the conductive element of the electronic component to the conductive element on the surface of the substrate. 
 
     
     
       2. The assembly of  claim 1 , wherein the conductive filler comprises discrete particles of a metal or metal alloy. 
     
     
       3. The assembly of  claim 1 , wherein the water-soluble mask material comprises a polymer or copolymer-based material. 
     
     
       4. The assembly of  claim 1 , wherein the electronic component comprises a semiconductor die in either packaged or bare form. 
     
     
       5. An electronic component assembly comprising:
 an electronic component including a conductive element; 
 a substrate including a conductive element on a surface thereof facing the electronic component connected to a conductive element on an opposing surface thereof; and 
 an electrically conductive bond comprising discrete particles of a metal or metal alloy entrained within a solidified flux carrier joining the conductive element of the electronic component and the conductive element on the surface of the substrate facing the electronic component. 
 
     
     
       6. The assembly of  claim 5 , wherein the electronic component comprises a semiconductor die in either packaged or bare form. 
     
     
       7. An electronic component assembly, comprising:
 a semiconductor device including at least one conductive I/O element; 
 a substrate including at least one conductive attachment pad in direct contact with the at least one conductive I/O element; and 
 an at least partially solidified, nonconductive water-soluble mask material bonding a peripheral edge of the semiconductor device to the substrate. 
 
     
     
       8. The assembly of  claim 7 , wherein the at least partially solidified,
 nonconductive water-soluble mask material extends substantially around a periphery of the semiconductor device.

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