Inventor
SATTLER SEBASTIAN
DE21 patents
⚠️ This page may combine multiple inventors who share the name “SATTLER SEBASTIAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
13 patentsUS7558991B2Jul 7, 2009
Device and method for measuring jitter
INFINEON TECHNOLOGIES AG25 citations92
US7653170B2Jan 26, 2010
Electrical circuit for measuring times and method for measuring times
INFINEON TECHNOLOGIES AG15 citations81
US7400995B2Jul 15, 2008
Device and method for testing integrated circuits
INFINEON TECHNOLOGIES AG7 citations73
US6944810B2Sep 13, 2005
Method and apparatus for the testing of input/output drivers of a circuit
INFINEON TECHNOLOGIES AG11 citations72
US7471220B2Dec 30, 2008
Electronic test circuit for an integrated circuit and methods for testing the driver strength and for testing the input sensitivity of a receiver of the integrated circuit
INFINEON TECHNOLOGIES AG5 citations62
US7256602B2Aug 14, 2007
Electrical circuit and method for testing integrated circuits
INFINEON TECHNOLOGIES AG6 citations62
US7487060B2Feb 3, 2009
Apparatus and method for tolerance analysis for digital and/or digitized measure values
INFINEON TECHNOLOGIES AG4 citations61
US7945406B2May 17, 2011
Measuring device and method for measuring relative phase shifts of digital signals
INFINEON TECHNOLOGIES AG2 citations59
US7391349B2Jun 24, 2008
Test apparatus and method for testing analog/digital converters
INFINEON TECHNOLOGIES AG2 citations58
US7912667B2Mar 22, 2011
Electrical circuit and method for testing electronic component
INFINEON TECHNOLOGIES AG2 citations57
US7254502B2Aug 7, 2007
Method and device for detecting period length fluctuations of periodic signals
INFINEON TECHNOLOGIES AG0 citations51
US7720645B2May 18, 2010
Test apparatus for digitized test responses, method for testing semiconductor devices and diagnosis method for a semiconductor device
INFINEON TECHNOLOGIES AG0 citations49
US7206712B2Apr 17, 2007
Test apparatus and test method for mixed-signal semiconductor components
INFINEON TECHNOLOGIES AG0 citations41
AT & S AUSTRIA TECH & SYSTEMTECHNIK AG
7 patentsUS11322482B2May 3, 2022
Component carrier with opposed stacks having respective connection bodies and a method for manufacturing the component carrier
AT & S AUSTRIA TECH & SYSTEMTECHNIK AG2 citations71
US12112888B2Oct 8, 2024
Component carrier with cavity accommodating at least part of driven body being magnetically drivable to move
AT & S AUSTRIA TECH & SYSTEMTECHNIK AG2 citations68
US11527807B2Dec 13, 2022
Electronic device having first and second component carrier parts with cut-outs therein and adhesively joined to form a cavity that supports an electronic component therein
AT & S AUSTRIA TECH & SYSTEMTECHNIK AG2 citations66
US11864306B2Jan 2, 2024
Component carrier with an embedded thermally conductive block and manufacturing method
AT & S AUSTRIA TECH & SYSTEMTECHNIK AG1 citations61
US12279369B2Apr 15, 2025
Electrically connected component carrier stacks with respective cavities and method of manufacturing the same
AT & S AUSTRIA TECH & SYSTEMTECHNIK AG0 citations60
US12177965B2Dec 24, 2024
Component carrier and method of manufacturing a component carrier
AT & S AUSTRIA TECH & SYSTEMTECHNIK AG0 citations56
US12324091B2Jun 3, 2025
Component carrier for microwave applications with stack pieces interconnected at an electrically conductive connection interface
AT & S AUSTRIA TECH & SYSTEMTECHNIK AG0 citations52