Inventor

KABBANI SAMER

US45 patents

⚠️ This page may combine multiple inventors who share the name “KABBANI SAMER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KABBANI SAMER

ADVANTEST TEST SOLUTIONS INC

Testing system including active thermal interposer device

Integrated test cell using active thermal interposer (ATI) with parallel socket actuation

Multi-input multi-zone thermal control for device testing

Wafer scale active thermal interposer for device testing

Carrier based high volume system level testing of devices with pop structures

Multi-input multi-zone thermal control for device testing

Shielded socket and carrier for high-volume test of semiconductor devices

Carrier based high volume system level testing of devices with pop structures

DUT placement and handling for active thermal interposer device

Wafer scale active thermal interposer for device testing

Wafer scale active thermal interposer for device testing

Wafer scale active thermal interposer for device testing

Carrier based high volume system level testing of devices with pop structures

Wafer scale active thermal interposer for device testing

Passive carrier-based device delivery for slot-based high-volume semiconductor test system

Active thermal interposer device

Multi-input multi-zone thermal control for device testing

Thermal solution for massively parallel testing

Active thermal interposer device

Passive carrier-based device delivery for slot-based high-volume semiconductor test system

Active thermal interposer device

Thermal solution for massively parallel testing

Shielded socket and carrier for high-volume test of semiconductor devices

Test system including active thermal interposer device

Integrated test cell using active thermal interposer (ATI) with parallel socket actuation

Integrated test cell using active thermal interposer (ATI) with parallel socket actuation

High current device testing apparatus and systems

DELTA DESIGN INC

Miniature fluid-cooled heat sink with integral heater

Active thermal control system with miniature liquid-cooled temperature control device for electronic device testing

LED lighting system for line scan camera based multiple data matrix scanners

Group vision alignment for double sided IC device testing

Miniature fluid-cooled heat sink with integral heater

Process for handling semiconductor devices and transport media in automated sorting equipment

Micro-vision alignment system with guiding rings for IC testing

AEM SINGAPORE PTE LTD

Thermal head comprising a plurality of adapters for independent thermal control of zones

Thermal control wafer with integrated heating-sensing elements

Thermal control wafer with integrated heating-sensing elements

Multiplexed thermal control wafer and coldplate

Multiplexed thermal control wafer and coldplate

AEM HOLDINGS LTD

Test system with a thermal head comprising a plurality of adapters for independent thermal control of zones

Thermal head for independent control of zones

Test system with a thermal head comprising a plurality of adapters and one or more cold plates for independent control of zones

Thermal head for independent control of zones

SEMINET INC

Robotic storage buffer system for substrate carrier pods

DING KEXIANG KEN

Imaging system with defocused and aperture-cropped light sources for detecting surface characteristics