Inventor
LEE HYUNUI
KR22 patents
⚠️ This page may combine multiple inventors who share the name “LEE HYUNUI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
16 patentsUS10790039B1Sep 29, 2020
Semiconductor device having a test circuit
MICRON TECHNOLOGY INC7 citations83
US10839889B1Nov 17, 2020
Apparatuses and methods for providing clocks to data paths
MICRON TECHNOLOGY INC3 citations73
US11145383B1Oct 12, 2021
Impedance calibration via a number of calibration circuits, and associated methods, devices, and systems
MICRON TECHNOLOGY INC3 citations72
US11960906B2Apr 16, 2024
Output impedance calibration, and related devices, systems, and methods
MICRON TECHNOLOGY INC0 citations62
US11922996B2Mar 5, 2024
Apparatuses, systems, and methods for ZQ calibration
MICRON TECHNOLOGY INC0 citations62
US11848065B2Dec 19, 2023
Impedance calibration via a number of calibration circuits, and associated methods, devices and systems
MICRON TECHNOLOGY INC0 citations62
US11677537B2Jun 13, 2023
Signal delay control and related apparatuses, systems, and methods
MICRON TECHNOLOGY INC0 citations62
US11646073B2May 9, 2023
Reference-voltage-generators within integrated assemblies
MICRON TECHNOLOGY INC0 citations62
US11619964B2Apr 4, 2023
Methods for improving timing in memory devices, and related devices and systems
MICRON TECHNOLOGY INC0 citations62
US11494198B2Nov 8, 2022
Output impedance calibration, and related devices, systems, and methods
MICRON TECHNOLOGY INC0 citations62
US11443788B1Sep 13, 2022
Reference-voltage-generators within integrated assemblies
MICRON TECHNOLOGY INC0 citations62
US11398266B1Jul 26, 2022
Integrated assemblies having memory cells with capacitive units and reference-voltage-generators with resistive units
MICRON TECHNOLOGY INC0 citations62
US11302387B2Apr 12, 2022
Input/output capacitance measurement, and related methods, devices, and systems
MICRON TECHNOLOGY INC0 citations62
US10902907B1Jan 26, 2021
Output drivers, and related methods, memory devices, and systems
MICRON TECHNOLOGY INC1 citations62
US11670397B2Jun 6, 2023
Output impedance calibration, and related devices, systems, and methods
MICRON TECHNOLOGY INC1 citations60
US12437826B2Oct 7, 2025
Self timing training using majority decision mechanism
MICRON TECHNOLOGY INC0 citations52
SAMSUNG ELECTRONICS CO LTD
6 patentsUS9870808B2Jan 16, 2018
Memory device for performing calibration operation
SAMSUNG ELECTRONICS CO LTD8 citations83
US10078110B2Sep 18, 2018
Short circuit detecting device of stacked memory chips and method thereof
SAMSUNG ELECTRONICS CO LTD3 citations72
US10243584B2Mar 26, 2019
Memory device including parity error detection circuit
SAMSUNG ELECTRONICS CO LTD4 citations70
US10908212B2Feb 2, 2021
Semiconductor memory device including a shift register
SAMSUNG ELECTRONICS CO LTD0 citations62
US10938416B2Mar 2, 2021
Memory device including parity error detection circuit
SAMSUNG ELECTRONICS CO LTD1 citations59
US10509070B2Dec 17, 2019
Short circuit detecting device of stacked memory chips and method thereof
SAMSUNG ELECTRONICS CO LTD0 citations51