Inventor
WAAYERS TOM
NL10 patents
⚠️ This page may combine multiple inventors who share the name “WAAYERS TOM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NXP BV
8 patentsUS7941717B2May 10, 2011
IC testing methods and apparatus
NXP BV18 citations82
US10571518B1Feb 25, 2020
Limited pin test interface with analog test bus
NXP BV15 citations76
US7941719B2May 10, 2011
IC testing methods and apparatus
NXP BV3 citations60
US7870449B2Jan 11, 2011
IC testing methods and apparatus
NXP BV6 citations60
US7945834B2May 17, 2011
IC testing methods and apparatus
NXP BV6 citations57
US9465072B2Oct 11, 2016
Method and system for digital circuit scan testing
NXP BV0 citations50
US11301607B2Apr 12, 2022
Testing of asynchronous reset logic
NXP BV0 citations39
US7685488B2Mar 23, 2010
Circuit interconnect testing arrangement and approach therefor
NXP BV0 citations39