Inventor
KIM JONGSU
KR31 patents
⚠️ This page may combine multiple inventors who share the name “KIM JONGSU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LG ELECTRONICS INC
12 patentsUS10952582B2Mar 23, 2021
Robot cleaner
LG ELECTRONICS INC22 citations92
US9801515B2Oct 31, 2017
Robot cleaner
LG ELECTRONICS INC6 citations84
US9504365B2Nov 29, 2016
Robot cleaner
LG ELECTRONICS INC9 citations84
US9888819B2Feb 13, 2018
Robot cleaner
LG ELECTRONICS INC2 citations73
US9687129B2Jun 27, 2017
Robot cleaner
LG ELECTRONICS INC4 citations73
US9622633B2Apr 18, 2017
Robot cleaner
LG ELECTRONICS INC4 citations73
US10517457B2Dec 31, 2019
Robot cleaner
LG ELECTRONICS INC3 citations72
US11011955B2May 18, 2021
Motor
LG ELECTRONICS INC4 citations68
US10702110B2Jul 7, 2020
Robot cleaner
LG ELECTRONICS INC1 citations60
US9572468B2Feb 21, 2017
Robot cleaner
LG ELECTRONICS INC0 citations52
US9750381B2Sep 5, 2017
Robot cleaner
LG ELECTRONICS INC1 citations51
US10398275B2Sep 3, 2019
Robot cleaner
LG ELECTRONICS INC0 citations41
SAMSUNG ELECTRONICS CO LTD
9 patentsUS11921857B2Mar 5, 2024
Electronic device for providing service by using secure element, and operating method thereof
SAMSUNG ELECTRONICS CO LTD1 citations59
US12581959B2Mar 17, 2026
Semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations55
US11488875B2Nov 1, 2022
Semiconductor substrate measuring apparatus and plasma treatment apparatus using the same
SAMSUNG ELECTRONICS CO LTD0 citations49
US12026064B2Jul 2, 2024
Electronic device and method of backing up secure element
SAMSUNG ELECTRONICS CO LTD0 citations46
US12093955B2Sep 17, 2024
Electronic device and payment method using the same
SAMSUNG ELECTRONICS CO LTD0 citations45
US12521769B2Jan 13, 2026
Wafer polishing apparatus and method of detecting defect of retainer ring included in the wafer polishing apparatus
SAMSUNG ELECTRONICS CO LTD0 citations43
US11668558B2Jun 6, 2023
Thickness estimation method and processing control method
SAMSUNG ELECTRONICS CO LTD0 citations41
US11579096B2Feb 14, 2023
Wafer inspection apparatus and method
SAMSUNG ELECTRONICS CO LTD0 citations41
US10871396B2Dec 22, 2020
Optical emission spectroscopy calibration device and system including the same
SAMSUNG ELECTRONICS CO LTD0 citations41
ASM IP HOLDING BV
3 patentsUSD981973SMar 28, 2023
Reactor wall for substrate processing apparatus
ASM IP HOLDING BV1 citations62
US11866823B2Jan 9, 2024
Substrate supporting unit and a substrate processing device including the same
ASM IP HOLDING BV0 citations59
US11499226B2Nov 15, 2022
Substrate supporting unit and a substrate processing device including the same
ASM IP HOLDING BV0 citations59