Inventor
MCGOWAN ROBERT A
US28 patents
⚠️ This page may combine multiple inventors who share the name “MCGOWAN ROBERT A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
19 patentsUS6985848B2Jan 10, 2006
Obtaining and exporting on-chip data processor trace and timing information
TEXAS INSTRUMENTS INC77 citations99
US7315808B2Jan 1, 2008
Correlating on-chip data processor trace information for export
TEXAS INSTRUMENTS INC31 citations96
US7043418B2May 9, 2006
Synchronizing on-chip data processor trace and timing information for export
TEXAS INSTRUMENTS INC31 citations96
US7890316B2Feb 15, 2011
Synchronizing on-chip data processor trace and timing information for export
TEXAS INSTRUMENTS INC9 citations92
US7536597B2May 19, 2009
Apparatus and method for controlling power, clock, and reset during test and debug procedures for a plurality of processor/cores
TEXAS INSTRUMENTS INC33 citations92
US6754599B2Jun 22, 2004
Debug output loosely coupled with processor block
TEXAS INSTRUMENTS INC12 citations82
US7558984B2Jul 7, 2009
Apparatus and method for test and debug of a processor/core having advanced power management
TEXAS INSTRUMENTS INC5 citations74
US9063197B2Jun 23, 2015
Blocking the effects of scan chain testing upon a change in scan chain topology
TEXAS INSTRUMENTS INC1 citations63
US7676698B2Mar 9, 2010
Apparatus and method for coupling a plurality of test access ports to external test and debug facility
TEXAS INSTRUMENTS INC6 citations63
US10048314B2Aug 14, 2018
Scan path only one-bit scan register when component not selected
TEXAS INSTRUMENTS INC0 citations52
US9903912B2Feb 27, 2018
Status register between test data I/O of scan port SUT
TEXAS INSTRUMENTS INC0 citations52
US9612283B2Apr 4, 2017
Blocking the effects of scan chain testing upon a change in scan chain topology
TEXAS INSTRUMENTS INC0 citations52
US9395413B2Jul 19, 2016
Blocking the effects of scan chain testing upon a change in scan chain topology
TEXAS INSTRUMENTS INC0 citations52
US9285426B2Mar 15, 2016
Blocking the effects of scan chain testing upon a change in scan chain topology
TEXAS INSTRUMENTS INC0 citations52
US9157958B2Oct 13, 2015
Blocking the effects of scan chain testing upon a change in scan chain topology
TEXAS INSTRUMENTS INC0 citations52
US8938651B2Jan 20, 2015
Blocking the effects of scan chain testing upon a change in scan chain topology
TEXAS INSTRUMENTS INC0 citations52
US8656234B2Feb 18, 2014
Test port connected to master output of override selection logic
TEXAS INSTRUMENTS INC0 citations52
US8464111B2Jun 11, 2013
Select, override and master override controlling multiplexing TDI and TDO
TEXAS INSTRUMENTS INC0 citations52
US8359502B2Jan 22, 2013
TDI multiplexer gating controlled by override selection logic
TEXAS INSTRUMENTS INC0 citations52