Inventor

FARWELL WILLIAM D

US39 patents

⚠️ This page may combine multiple inventors who share the name “FARWELL WILLIAM D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FARWELL WILLIAM D

HUGHES AIRCRAFT CO

Sample and hold flip-flop for CMOS logic

Method of testing interconnections in digital systems by the use of bidirectional drivers

Conformal circuit for structural health monitoring and assessment

Method for self regulating CMOS digital microcircuit burn-in without ovens

Scan testing digital logic with differing frequencies of system clock and test clock

Circuit to improve the transient response of step-down DC to DC converters

High impedance technique for testing interconnections in digital systems

Method for testing the electrical parameters of inputs and outputs of integrated circuits without direct physical contact

Method of cancelling offset errors in phase detectors

Built-in test circuitry providing simple and accurate AC test of digital microcircuits with low bandwidth test equipment and probe stations

Boundary test cell with self masking capability

Contactless testing of inputs and outputs of integrated circuits

Real time dynamic range compression for image enhancement

Series connection of multiple digital devices to a single power source

Method of testing the output propagation delay of digital devices

Test flip-flop with an auxillary latch enabling two (2) bits of storage

Pseudo-random vector generated testable counter

Method for continuously measuring delay margins in digital systems

Method for continuously measuring delay margins in digital systems

Controllable precision on-chip delay element

Programmable hold-off for integrated circuit I/O pins

Method of applying boundary test patterns

Test for hold time margins in digital systems

Method of testing the interconnection between logic devices

Method by which to detect direction of current flow in outputs of integrated circuits

Circuitry for controlled rate of power application to CMOS microcircuits

RAYTHEON CO

Preheating device for electronic circuits

Digital circuits with adaptive resistance to single event upset

Reconfigurable processor with alternately interconnected arithmetic and memory nodes of crossbar switched cluster

Frequency independent clock synchronizer

Digital circuits with adaptive resistance to single event upset

System and method for minimizing upsets in digital microcircuits via ambient radiation monitoring

Techniques for alignment of multiple asynchronous data sources

Mixed technology microcircuits

Means for testing dynamic integrated circuits

Programmable bandwidth allocation between send and receive in a duplex communication path

HUGHES ELECTRONICS CORP

Error correction of system transfer function by use of input compensation

FARWELL WILLIAM D

Digital circuits with adaptive resistance to single event upset

LEWINS LLOYD J

Means of control for reconfigurable computers