Inventor

SCHAMBERGER FLORIAN

DE34 patents

⚠️ This page may combine multiple inventors who share the name “SCHAMBERGER FLORIAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SCHAMBERGER FLORIAN

INFINEON TECHNOLOGIES AG

Integrated circuit having a self-test device for carrying out a self-test of the integrated circuit

Method of repairing defective memory cells of an integrated memory

Method for repairing hardware faults in memory chips

Method for comparing the address of a memory access with an already known address of a faulty memory cell

Circuit configuration for driving a programmable link

Integrated semiconductor circuit with an increased operating voltage

Method and circuit for adjusting a resistance in an integrated circuit

Method for testing semiconductor memory modules

Integrated circuit having a data processing unit and a buffer memory

Circuit configuration for driving a programmable link

Semiconductor component for connection to a test system

Circuit configuration for driving a programmable link

Integrated semiconductor circuit with an increased operating voltage

Circuit configuration for programming an electrically programmable element

Means of mounting for electronic components, arrangement and procedure

Semiconductor circuit configuration

Configuration for generating signal impulses of defined lengths in a module with a bist-function

Semiconductor module

Method for producing an antifuse in a substrate and an antifuse structure for integration in a substrate

Method and apparatus for operating a semiconductor memory at double data transfer rate

Integrated circuit having a programmable element and method of operating the circuit

Method for repairing defective memory cells of an integrated semiconductor memory

Circuit configuration for level boosting, in particular for driving a programmable link

Circuit configuration for programming an electrically programmable element

SIEMENS AG

Vertical field effect transistor with internal annular gate and method of production

Integrated circuit having a self-test device and method for producing the integrated circuit

Integrated memory having a self-repair function

Bonding pad test configuration

Integrated circuit having a self-test device

Configuration and method for storing the test results obtained by a BIST circuit

Method of testing leakage current at a contact-making point in an integrated circuit by determining a potential at the contact-making point

Method for determining the drive capability of a driver circuit of an integrated circuit

INFINEON TECHNOLOGIES

Circuit configuration for monitoring states of a memory device

QIMONDA AG

Integrated circuit