Inventor
HAZAMA HIROAKI
JP49 patents
⚠️ This page may combine multiple inventors who share the name “HAZAMA HIROAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
44 patentsUS7079437B2Jul 18, 2006
Nonvolatile semiconductor memory device having configuration of NAND strings with dummy memory cells adjacent to select transistors
TOSHIBA KK129 citations98
US6055181AApr 25, 2000
Nonvolatile semiconductor memory device capable of storing multi-value data of more than one bit in a memory cell
TOSHIBA KK58 citations96
US5815436ASep 29, 1998
Multi-level nonvolatile semiconductor memory device having improved programming level and read/write multi-level data circuits
TOSHIBA KK75 citations96
US5162880ANov 10, 1992
Nonvolatile memory cell having gate insulation film with carrier traps therein
TOSHIBA KK95 citations96
US5514904AMay 7, 1996
Semiconductor device with monocrystalline gate insulating film
TOSHIBA KK57 citations95
US7038291B2May 2, 2006
Semiconductor device and method of fabricating the same
TOSHIBA KK48 citations93
US6844590B2Jan 18, 2005
Semiconductor device with trench isolation between two regions having different gate insulating films
TOSHIBA KK20 citations93
US6667507B2Dec 23, 2003
Flash memory having memory section and peripheral circuit section
TOSHIBA KK24 citations93
US7898867B2Mar 1, 2011
Nonvolatile semiconductor memory device including plural memory cells and a dummy cell coupled to an end of a memory cell
TOSHIBA KK25 citations92
US7196370B2Mar 27, 2007
Nonvolatile semiconductor memory device having trench-type isolation region, and method of fabricating the same
TOSHIBA KK27 citations92
US6828627B2Dec 7, 2004
Semiconductor device
TOSHIBA KK23 citations92
US6828624B1Dec 7, 2004
Nonvolatile semiconductor memory device covered with insulating film which is hard for an oxidizing agent to pass therethrough
TOSHIBA KK33 citations92
US6798038B2Sep 28, 2004
Manufacturing method of semiconductor device with filling insulating film into trench
TOSHIBA KK43 citations92
US6703669B1Mar 9, 2004
Semiconductor device having serially connected memory cell transistors provided between two current terminals
TOSHIBA KK23 citations92
US5907393AMay 25, 1999
Exposure mask and method and apparatus for manufacturing the same
TOSHIBA KK32 citations92
US5837405ANov 17, 1998
Reticle
TOSHIBA KK28 citations92
US5728494AMar 17, 1998
Exposure mask and method and apparatus for manufacturing the same
TOSHIBA KK26 citations92
US5629115AMay 13, 1997
Exposure mask and method and apparatus for manufacturing the same
TOSHIBA KK33 citations92
US5589305ADec 31, 1996
Method of fabricating a reticle
TOSHIBA KK19 citations92
US6228717B1May 8, 2001
Method of manufacturing semiconductor devices with alleviated electric field concentration at gate edge portions
TOSHIBA KK32 citations89
US7263000B2Aug 28, 2007
NAND type memory with dummy cells adjacent to select transistors being biased at different voltage during data erase
TOSHIBA KK20 citations88
US7786524B2Aug 31, 2010
Semiconductor device and method of manufacturing the same
TOSHIBA KK15 citations84
US7038268B2May 2, 2006
Nonvolatile semiconductor memory device
TOSHIBA KK18 citations84
US6943453B2Sep 13, 2005
Superconductor device and method of manufacturing the same
TOSHIBA KK12 citations84
US7795667B2Sep 14, 2010
Semiconductor memory preventing an electric short circuit between a word line and a semiconductor substrate, and manufacturing method for the semiconductor memory
TOSHIBA KK7 citations74
US7361951B2Apr 22, 2008
Flash memory having memory section and peripheral circuit section
TOSHIBA KK6 citations74
US6977409B2Dec 20, 2005
Flash memory having memory section and peripheral circuit section
TOSHIBA KK5 citations74
US6975019B2Dec 13, 2005
Semiconductor memory device having a multi-layered interlayer insulation consisting of deuterium and nitride
TOSHIBA KK9 citations74
US6969660B2Nov 29, 2005
Method of manufacturing a semiconductor device with trench isolation between two regions having different gate insulating films
TOSHIBA KK8 citations74
US7692969B2Apr 6, 2010
Nonvolatile semiconductor memory device including plural memory cells and a dummy cell coupled to an end of a memory cell
TOSHIBA KK4 citations73
US7371654B2May 13, 2008
Manufacturing method of semiconductor device with filling insulating film into trench
TOSHIBA KK8 citations73
US7364951B2Apr 29, 2008
Nonvolatile semiconductor memory device and method for manufacturing the same
TOSHIBA KK5 citations73
US7095085B2Aug 22, 2006
Nonvolatile semiconductor memory device and method for manufacturing the same
TOSHIBA KK5 citations73
US6747311B2Jun 8, 2004
Nonvolatile semiconductor memory device and method for manufacturing the same
TOSHIBA KK11 citations73
US5660956AAug 26, 1997
Reticle and method of fabricating reticle
TOSHIBA KK16 citations73
US5595844AJan 21, 1997
Method of exposing light in a method of fabricating a reticle
TOSHIBA KK12 citations73
US8837225B2Sep 16, 2014
Nonvolatile semiconductor memory device and operation method of the same
TOSHIBA KK3 citations63
US7026241B2Apr 11, 2006
Superconductor device and method of manufacturing the same
TOSHIBA KK4 citations63
US8879326B2Nov 4, 2014
Nonvolatile semiconductor memory device including plural memory cells and a dummy cell coupled to an end of a memory cell
TOSHIBA KK1 citations62
US7297599B2Nov 20, 2007
Method of fabricating semiconductor device
TOSHIBA KK6 citations62
US7195968B2Mar 27, 2007
Method of fabricating semiconductor device
TOSHIBA KK5 citations62
US6759314B1Jul 6, 2004
Method for manufacturing semiconductor devices using thermal nitride films as gate insulating films
TOSHIBA KK5 citations60
US8363480B2Jan 29, 2013
Nonvolatile semiconductor storage device
TOSHIBA KK1 citations52
US7238975B2Jul 3, 2007
Nonvolatile semiconductor memory device and manufacturing method therefor
TOSHIBA KK0 citations40
HAZAMA HIROAKI
5 patentsUS8274834B2Sep 25, 2012
Nonvolatile semiconductor memory device including plural memory cells and a dummy cell coupled to an end of a memory cell
HAZAMA HIROAKI4 citations72
US8130555B2Mar 6, 2012
Nonvolatile semiconductor storage device and method of erase verifying the same
HAZAMA HIROAKI3 citations62
US8098509B2Jan 17, 2012
Nonvolatile semiconductor memory device, method of fabricating the nonvolatile semiconductor memory device and process of writing data on the nonvolatile semiconductor memory device
HAZAMA HIROAKI3 citations62
US8482984B2Jul 9, 2013
Nonvolatile semiconductor memory device including plural memory cells and a dummy cell coupled to an end of a memory cell
HAZAMA HIROAKI2 citations61
US8222106B2Jul 17, 2012
Nonvolatile semiconductor memory device, method of fabricating the nonvolatile semiconductor memory device and process of writing data on the nonvolatile semiconductor memory device
HAZAMA HIROAKI0 citations51