Inventor
ROHRBAUGH JOHN G
US23 patents
⚠️ This page may combine multiple inventors who share the name “ROHRBAUGH JOHN G”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AGILENT TECHNOLOGIES INC
13 patentsUS6556938B1Apr 29, 2003
Systems and methods for facilitating automated test equipment functionality within integrated circuits
AGILENT TECHNOLOGIES INC55 citations95
US6865706B1Mar 8, 2005
Apparatus and method for generating a set of test vectors using nonrandom filling
AGILENT TECHNOLOGIES INC32 citations92
US6859059B2Feb 22, 2005
Systems and methods for testing receiver terminations in integrated circuits
AGILENT TECHNOLOGIES INC17 citations92
US6762614B2Jul 13, 2004
Systems and methods for facilitating driver strength testing of integrated circuits
AGILENT TECHNOLOGIES INC31 citations92
US6707313B1Mar 16, 2004
Systems and methods for testing integrated circuits
AGILENT TECHNOLOGIES INC34 citations92
US6658613B2Dec 2, 2003
Systems and methods for facilitating testing of pad receivers of integrated circuits
AGILENT TECHNOLOGIES INC23 citations92
US6396312B1May 28, 2002
Gate transition counter
AGILENT TECHNOLOGIES INC21 citations92
US6986085B2Jan 10, 2006
Systems and methods for facilitating testing of pad drivers of integrated circuits
AGILENT TECHNOLOGIES INC8 citations73
US6577980B1Jun 10, 2003
Systems and methods for facilitating testing of pad receivers of integrated circuits
AGILENT TECHNOLOGIES INC12 citations73
US6907376B2Jun 14, 2005
Systems and methods for facilitating testing of pad receivers of integrated circuits
AGILENT TECHNOLOGIES INC3 citations62
US6741946B2May 25, 2004
Systems and methods for facilitating automated test equipment functionality within integrated circuits
AGILENT TECHNOLOGIES INC2 citations62
US6944837B2Sep 13, 2005
System and method for evaluating an integrated circuit design
AGILENT TECHNOLOGIES INC3 citations60
US6895562B2May 17, 2005
Partitioning integrated circuit hierarchy
AGILENT TECHNOLOGIES INC2 citations59
HEWLETT PACKARD CO
7 patentsUS6067651AMay 23, 2000
Test pattern generator having improved test sequence compaction
HEWLETT PACKARD CO67 citations96
US5905986AMay 18, 1999
Highly compressible representation of test pattern data
HEWLETT PACKARD CO60 citations96
US5495578AFeb 27, 1996
Apparatus and method for changing the behavior of a computer program while retaining control of program execution
HEWLETT PACKARD CO22 citations92
US5400263AMar 21, 1995
Apparatus and method for specifying the flow of test execution and the binning for a testing system
HEWLETT PACKARD CO39 citations92
US5390131AFeb 14, 1995
Apparatus and method for displaying wafer test results in real time
HEWLETT PACKARD CO51 citations92
US6234689B1May 22, 2001
Apparatus and method for mapping a custom routine to an interface button
HEWLETT PACKARD CO10 citations73
US5381344AJan 10, 1995
Apparatus and method for obtaining a list of numbers of wafers for integrated circuit testing
HEWLETT PACKARD CO12 citations70
AVAGO TECHNOLOGIES GENERAL IP
2 patentsUS7516379B2Apr 7, 2009
Circuit and method for comparing circuit performance between functional and AC scan testing in an integrated circuit (IC)
AVAGO TECHNOLOGIES GENERAL IP21 citations92
US7139955B2Nov 21, 2006
Hierarchically-controlled automatic test pattern generation
AVAGO TECHNOLOGIES GENERAL IP25 citations92