Inventor
GANDHI JASPREET S
US66 patents
⚠️ This page may combine multiple inventors who share the name “GANDHI JASPREET S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
46 patentsUS9768149B2Sep 19, 2017
Semiconductor device assembly with heat transfer structure formed from semiconductor material
MICRON TECHNOLOGY INC24 citations94
US9905539B2Feb 27, 2018
Interconnect structures with intermetallic palladium joints and associated systems and methods
MICRON TECHNOLOGY INC4 citations84
US9768147B2Sep 19, 2017
Thermal pads between stacked semiconductor dies and associated systems and methods
MICRON TECHNOLOGY INC5 citations84
US9733304B2Aug 15, 2017
Semiconductor device test apparatuses
MICRON TECHNOLOGY INC5 citations84
US9691746B2Jun 27, 2017
Methods of manufacturing stacked semiconductor die assemblies with high efficiency thermal paths
MICRON TECHNOLOGY INC9 citations84
US9520370B2Dec 13, 2016
Methods of forming semiconductor device assemblies and interconnect structures, and related semiconductor device assemblies and interconnect structures
MICRON TECHNOLOGY INC8 citations84
US9515002B2Dec 6, 2016
Bonding pads with thermal pathways
MICRON TECHNOLOGY INC6 citations84
US9412675B2Aug 9, 2016
Interconnect structure with improved conductive properties and associated systems and methods
MICRON TECHNOLOGY INC8 citations84
US9337119B2May 10, 2016
Stacked semiconductor die assemblies with high efficiency thermal paths and associated systems
MICRON TECHNOLOGY INC10 citations84
US8962449B1Feb 24, 2015
Methods for processing semiconductor devices
MICRON TECHNOLOGY INC9 citations84
US10916487B2Feb 9, 2021
Method for manufacturing a semiconductor device assembly with through-mold cooling channel formed in encapsulant
MICRON TECHNOLOGY INC5 citations83
US10424531B2Sep 24, 2019
Method for manufacturing a semiconductor device assembly with through-mold cooling channel formed in encapsulant
MICRON TECHNOLOGY INC5 citations83
US9960150B2May 1, 2018
Semiconductor device assembly with through-mold cooling channel formed in encapsulant
MICRON TECHNOLOGY INC5 citations83
US9299663B2Mar 29, 2016
Semiconductor devices and methods for backside photo alignment
MICRON TECHNOLOGY INC10 citations80
US10741468B2Aug 11, 2020
Stacked semiconductor die assemblies with multiple thermal paths and associated systems and methods
MICRON TECHNOLOGY INC1 citations73
US10580746B2Mar 3, 2020
Bonding pads with thermal pathways
MICRON TECHNOLOGY INC1 citations73
US10573612B2Feb 25, 2020
Bonding pads with thermal pathways
MICRON TECHNOLOGY INC1 citations73
US10481200B2Nov 19, 2019
Semiconductor device test apparatuses comprising at least one test site having an array of pockets
MICRON TECHNOLOGY INC1 citations73
US10256216B2Apr 9, 2019
Interconnect structures with intermetallic palladium joints and associated systems and methods
MICRON TECHNOLOGY INC1 citations73
US10170389B2Jan 1, 2019
Stacked semiconductor die assemblies with multiple thermal paths and associated systems and methods
MICRON TECHNOLOGY INC3 citations73
US10163830B2Dec 25, 2018
Bonding pads with thermal pathways
MICRON TECHNOLOGY INC3 citations73
US9837383B2Dec 5, 2017
Interconnect structure with improved conductive properties and associated systems and methods
MICRON TECHNOLOGY INC2 citations73
US9564418B2Feb 7, 2017
Interconnect structures with intermetallic palladium joints and associated systems and methods
MICRON TECHNOLOGY INC2 citations73
US10410879B2Sep 10, 2019
Uniform back side exposure of through-silicon vias
MICRON TECHNOLOGY INC2 citations72
US9941190B2Apr 10, 2018
Semiconductor device having through-silicon-via and methods of forming the same
MICRON TECHNOLOGY INC2 citations72
US9318438B2Apr 19, 2016
Semiconductor structures comprising at least one through-substrate via filled with conductive materials
MICRON TECHNOLOGY INC4 citations71
US9704781B2Jul 11, 2017
Under-bump metal structures for interconnecting semiconductor dies or packages and associated systems and methods
MICRON TECHNOLOGY INC3 citations70
US10410882B2Sep 10, 2019
Solder bond site including an opening with discontinuous profile
MICRON TECHNOLOGY INC1 citations69
US9741612B2Aug 22, 2017
Semiconductor devices and methods for backside photo alignment
MICRON TECHNOLOGY INC2 citations69
US12033980B2Jul 9, 2024
Thermal pads between stacked semiconductor dies and associated systems and methods
MICRON TECHNOLOGY INC0 citations63
US10126357B2Nov 13, 2018
Methods of testing semiconductor devices comprising a die stack having protruding conductive elements
MICRON TECHNOLOGY INC1 citations63
US9443744B2Sep 13, 2016
Stacked semiconductor die assemblies with high efficiency thermal paths and associated methods
MICRON TECHNOLOGY INC2 citations63
US11776877B2Oct 3, 2023
Methods of manufacturing stacked semiconductor die assemblies with high efficiency thermal paths
MICRON TECHNOLOGY INC0 citations62
US11688664B2Jun 27, 2023
Semiconductor device assembly with through-mold cooling channel formed in encapsulant
MICRON TECHNOLOGY INC0 citations62
US11594462B2Feb 28, 2023
Stacked semiconductor die assemblies with multiple thermal paths and associated systems and methods
MICRON TECHNOLOGY INC0 citations62
US11139258B2Oct 5, 2021
Bonding pads with thermal pathways
MICRON TECHNOLOGY INC0 citations62
US9818622B2Nov 14, 2017
Uniform back side exposure of through-silicon vias
MICRON TECHNOLOGY INC1 citations62
US10886196B2Jan 5, 2021
Semiconductor devices having conductive vias and methods of forming the same
MICRON TECHNOLOGY INC0 citations52
US10861825B2Dec 8, 2020
Interconnect structures with intermetallic palladium joints and associated systems and methods
MICRON TECHNOLOGY INC0 citations52
US10748878B2Aug 18, 2020
Semiconductor device assembly with heat transfer structure formed from semiconductor material
MICRON TECHNOLOGY INC0 citations52
US10741460B2Aug 11, 2020
Methods for forming interconnect assemblies with probed bond pads
MICRON TECHNOLOGY INC0 citations52
US10651155B2May 12, 2020
Thermal pads between stacked semiconductor dies and associated systems and methods
MICRON TECHNOLOGY INC0 citations52
US10559551B2Feb 11, 2020
Semiconductor device assembly with heat transfer structure formed from semiconductor material
MICRON TECHNOLOGY INC0 citations52
US10297577B2May 21, 2019
Semiconductor device assembly with heat transfer structure formed from semiconductor material
MICRON TECHNOLOGY INC0 citations52
US10224313B2Mar 5, 2019
Interconnect structures with intermetallic palladium joints and associated systems and methods
MICRON TECHNOLOGY INC0 citations52
US10163755B2Dec 25, 2018
Methods of manufacturing stacked semiconductor die assemblies with high efficiency thermal paths
MICRON TECHNOLOGY INC1 citations52
GANDHI JASPREET S
3 patentsSUN YANGYANG
1 patentShowing the top 50 of 66 patents by PatentIndex Score.