P

Inventor

GANDHI JASPREET S

US66 patents
⚠️ This page may combine multiple inventors who share the name “GANDHI JASPREET S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MICRON TECHNOLOGY INC

46 patents
US9768149B2Sep 19, 2017

Semiconductor device assembly with heat transfer structure formed from semiconductor material

MICRON TECHNOLOGY INC24 citations94
US9905539B2Feb 27, 2018

Interconnect structures with intermetallic palladium joints and associated systems and methods

MICRON TECHNOLOGY INC4 citations84
US9768147B2Sep 19, 2017

Thermal pads between stacked semiconductor dies and associated systems and methods

MICRON TECHNOLOGY INC5 citations84
US9733304B2Aug 15, 2017

Semiconductor device test apparatuses

MICRON TECHNOLOGY INC5 citations84
US9691746B2Jun 27, 2017

Methods of manufacturing stacked semiconductor die assemblies with high efficiency thermal paths

MICRON TECHNOLOGY INC9 citations84
US9520370B2Dec 13, 2016

Methods of forming semiconductor device assemblies and interconnect structures, and related semiconductor device assemblies and interconnect structures

MICRON TECHNOLOGY INC8 citations84
US9515002B2Dec 6, 2016

Bonding pads with thermal pathways

MICRON TECHNOLOGY INC6 citations84
US9412675B2Aug 9, 2016

Interconnect structure with improved conductive properties and associated systems and methods

MICRON TECHNOLOGY INC8 citations84
US9337119B2May 10, 2016

Stacked semiconductor die assemblies with high efficiency thermal paths and associated systems

MICRON TECHNOLOGY INC10 citations84
US8962449B1Feb 24, 2015

Methods for processing semiconductor devices

MICRON TECHNOLOGY INC9 citations84
US10916487B2Feb 9, 2021

Method for manufacturing a semiconductor device assembly with through-mold cooling channel formed in encapsulant

MICRON TECHNOLOGY INC5 citations83
US10424531B2Sep 24, 2019

Method for manufacturing a semiconductor device assembly with through-mold cooling channel formed in encapsulant

MICRON TECHNOLOGY INC5 citations83
US9960150B2May 1, 2018

Semiconductor device assembly with through-mold cooling channel formed in encapsulant

MICRON TECHNOLOGY INC5 citations83
US9299663B2Mar 29, 2016

Semiconductor devices and methods for backside photo alignment

MICRON TECHNOLOGY INC10 citations80
US10741468B2Aug 11, 2020

Stacked semiconductor die assemblies with multiple thermal paths and associated systems and methods

MICRON TECHNOLOGY INC1 citations73
US10580746B2Mar 3, 2020

Bonding pads with thermal pathways

MICRON TECHNOLOGY INC1 citations73
US10573612B2Feb 25, 2020

Bonding pads with thermal pathways

MICRON TECHNOLOGY INC1 citations73
US10481200B2Nov 19, 2019

Semiconductor device test apparatuses comprising at least one test site having an array of pockets

MICRON TECHNOLOGY INC1 citations73
US10256216B2Apr 9, 2019

Interconnect structures with intermetallic palladium joints and associated systems and methods

MICRON TECHNOLOGY INC1 citations73
US10170389B2Jan 1, 2019

Stacked semiconductor die assemblies with multiple thermal paths and associated systems and methods

MICRON TECHNOLOGY INC3 citations73
US10163830B2Dec 25, 2018

Bonding pads with thermal pathways

MICRON TECHNOLOGY INC3 citations73
US9837383B2Dec 5, 2017

Interconnect structure with improved conductive properties and associated systems and methods

MICRON TECHNOLOGY INC2 citations73
US9564418B2Feb 7, 2017

Interconnect structures with intermetallic palladium joints and associated systems and methods

MICRON TECHNOLOGY INC2 citations73
US10410879B2Sep 10, 2019

Uniform back side exposure of through-silicon vias

MICRON TECHNOLOGY INC2 citations72
US9941190B2Apr 10, 2018

Semiconductor device having through-silicon-via and methods of forming the same

MICRON TECHNOLOGY INC2 citations72
US9318438B2Apr 19, 2016

Semiconductor structures comprising at least one through-substrate via filled with conductive materials

MICRON TECHNOLOGY INC4 citations71
US9704781B2Jul 11, 2017

Under-bump metal structures for interconnecting semiconductor dies or packages and associated systems and methods

MICRON TECHNOLOGY INC3 citations70
US10410882B2Sep 10, 2019

Solder bond site including an opening with discontinuous profile

MICRON TECHNOLOGY INC1 citations69
US9741612B2Aug 22, 2017

Semiconductor devices and methods for backside photo alignment

MICRON TECHNOLOGY INC2 citations69
US12033980B2Jul 9, 2024

Thermal pads between stacked semiconductor dies and associated systems and methods

MICRON TECHNOLOGY INC0 citations63
US10126357B2Nov 13, 2018

Methods of testing semiconductor devices comprising a die stack having protruding conductive elements

MICRON TECHNOLOGY INC1 citations63
US9443744B2Sep 13, 2016

Stacked semiconductor die assemblies with high efficiency thermal paths and associated methods

MICRON TECHNOLOGY INC2 citations63
US11776877B2Oct 3, 2023

Methods of manufacturing stacked semiconductor die assemblies with high efficiency thermal paths

MICRON TECHNOLOGY INC0 citations62
US11688664B2Jun 27, 2023

Semiconductor device assembly with through-mold cooling channel formed in encapsulant

MICRON TECHNOLOGY INC0 citations62
US11594462B2Feb 28, 2023

Stacked semiconductor die assemblies with multiple thermal paths and associated systems and methods

MICRON TECHNOLOGY INC0 citations62
US11139258B2Oct 5, 2021

Bonding pads with thermal pathways

MICRON TECHNOLOGY INC0 citations62
US9818622B2Nov 14, 2017

Uniform back side exposure of through-silicon vias

MICRON TECHNOLOGY INC1 citations62
US10886196B2Jan 5, 2021

Semiconductor devices having conductive vias and methods of forming the same

MICRON TECHNOLOGY INC0 citations52
US10861825B2Dec 8, 2020

Interconnect structures with intermetallic palladium joints and associated systems and methods

MICRON TECHNOLOGY INC0 citations52
US10748878B2Aug 18, 2020

Semiconductor device assembly with heat transfer structure formed from semiconductor material

MICRON TECHNOLOGY INC0 citations52
US10741460B2Aug 11, 2020

Methods for forming interconnect assemblies with probed bond pads

MICRON TECHNOLOGY INC0 citations52
US10651155B2May 12, 2020

Thermal pads between stacked semiconductor dies and associated systems and methods

MICRON TECHNOLOGY INC0 citations52
US10559551B2Feb 11, 2020

Semiconductor device assembly with heat transfer structure formed from semiconductor material

MICRON TECHNOLOGY INC0 citations52
US10297577B2May 21, 2019

Semiconductor device assembly with heat transfer structure formed from semiconductor material

MICRON TECHNOLOGY INC0 citations52
US10224313B2Mar 5, 2019

Interconnect structures with intermetallic palladium joints and associated systems and methods

MICRON TECHNOLOGY INC0 citations52
US10163755B2Dec 25, 2018

Methods of manufacturing stacked semiconductor die assemblies with high efficiency thermal paths

MICRON TECHNOLOGY INC1 citations52

GANDHI JASPREET S

3 patents

SUN YANGYANG

1 patent

Showing the top 50 of 66 patents by PatentIndex Score.