Inventor

KISTER JANUARY

US65 patents

⚠️ This page may combine multiple inventors who share the name “KISTER JANUARY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KISTER JANUARY

MICROPROBE INC

Vertical probe array arranged to provide space transformation

Vertical probe array arranged to provide space transformation

Low profile probe having improved mechanical scrub and reduced contact inductance

Probes with self-cleaning blunt skates for contacting conductive pads

Knee probe having increased scrub motion

Vertical guided probe array providing sideways scrub motion

Low profile probe having improved mechanical scrub and reduced contact inductance

Probe skates for electrical testing of convex pad topologies

Probe cards employing probes having retaining portions for potting in a retention arrangement

Probe cards employing probes having retaining portions for potting in a retention arrangement

Space transformers employing wire bonds for interconnections with fine pitch contacts

Freely deflecting knee probe with controlled scrub motion

KISTER JANUARY

Probes with offset arm and suspension structure

Layered probes with core

Low profile probe having improved mechanical scrub and reduced contact inductance

Probe bonding method having improved control of bonding material

Knee probe having reduced thickness section for control of scrub motion

Probe skates for electrical testing of convex pad topologies

Probes with high current carrying capability and laser machining methods

Vertical guided layered probe

PROBE TECHNOLOGY

Method for making a probe preserving a uniform stress distribution under deflection

Dual contact probe assembly for testing integrated circuits

Membrane for holding a probe tip in proper location

Method and apparatus for aligning probes

Assembly structure for making integrated circuit chip probe cards

Method and circuit testing apparatus for equalizing a contact force between probes and pads

KULICKE & SOFFA INVESTMENT INC

Probe assembly having floatable buckling beam probes and apparatus for abrading the same

Probe apparatus having removable beam probes

Interface structure for contacting probe beams

Modulated space transformer for high density buckling beam probe and method for making the same

K & S INTERCONNECT INC

Straight protruding probe beam contour surfaces

Prefabricated and attached interconnect structure

Continuously profiled probe beam

See-saw interconnect assembly with dielectric carrier grid providing spring suspension

ANTARES CONTECH INC

Multipath interconnect with meandering contact cantilevers

Sheet metal interconnect array

Bundled probe apparatus for multiple terminal contacting

See-saw interconnect assembly with dielectric carrier grid providing spring suspension

KULICKE & SOFFA INVESTMENTS

Method for making a probe apparatus for testing integrated circuits

Modular probe apparatus

PROBE TECHNOLOGY INC

High temperature probe card for testing integrated circuits

Assembly structure for making integrated circuit chip probe cards

PROBE TECHNOLOGY CORP

Large scale protrusion membrane for semiconductor devices under test with very high pin counts

FORMFACTOR INC

Multiple contact probes

KULICKE & SOFFA INTERCONNECT I

Multipath interconnect with meandering contact cantilevers

ASTRIA SEMICONDUCTOR HOLDINGS

Probe cards employing probes having retaining portions for potting in a potting region

MICRO PORBE INC

Knee probe having reduced thickness section for control of scrub motion

MICRO PROBE

Cantilever probe with dual plane fixture and probe apparatus therewith

MICROPROBE

Double acting spring probe

SV PROBE PTE LTD

Prefabricated and attached interconnect structure