Inventor
KANAMORI KOHJI
JP120 patents
⚠️ This page may combine multiple inventors who share the name “KANAMORI KOHJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
26 patentsUS10748923B2Aug 18, 2020
Vertical memory devices and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD14 citations94
US10068917B2Sep 4, 2018
Vertical memory devices and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD22 citations94
US10367003B2Jul 30, 2019
Vertical non-volatile memory device and method for fabricating the same
SAMSUNG ELECTRONICS CO LTD20 citations93
US9634024B2Apr 25, 2017
Semiconductor device having vertical channel and air gap, and method of manufacturing thereof
SAMSUNG ELECTRONICS CO LTD28 citations91
US10998301B2May 4, 2021
Semiconductor device
SAMSUNG ELECTRONICS CO LTD13 citations86
US10896711B2Jan 19, 2021
Memory device with memory cell structure including ferroelectric data storage layer, and a first gate and a second gate
SAMSUNG ELECTRONICS CO LTD9 citations86
US10559591B2Feb 11, 2020
Vertical memory devices and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD15 citations85
US10411033B2Sep 10, 2019
Semiconductor device including vertical channel layer
SAMSUNG ELECTRONICS CO LTD15 citations85
US11088163B2Aug 10, 2021
Semiconductor devices including upper and lower selectors
SAMSUNG ELECTRONICS CO LTD6 citations84
US10566345B2Feb 18, 2020
Three-dimensional semiconductor memory device
SAMSUNG ELECTRONICS CO LTD14 citations84
US10522562B2Dec 31, 2019
Memory device
SAMSUNG ELECTRONICS CO LTD6 citations84
US11792994B2Oct 17, 2023
Three-dimensional memory device including a string selection line gate electrode having a silicide layer
SAMSUNG ELECTRONICS CO LTD4 citations73
US11729976B2Aug 15, 2023
Semiconductor devices including upper and lower selectors
SAMSUNG ELECTRONICS CO LTD2 citations73
US11538859B2Dec 27, 2022
Semiconductor memory device including variable resistance layer
SAMSUNG ELECTRONICS CO LTD2 citations73
US11289507B2Mar 29, 2022
Vertical memory devices
SAMSUNG ELECTRONICS CO LTD4 citations73
US11158651B2Oct 26, 2021
Vertical memory devices
SAMSUNG ELECTRONICS CO LTD3 citations73
US11069709B2Jul 20, 2021
Vertical memory devices
SAMSUNG ELECTRONICS CO LTD2 citations73
US11056645B2Jul 6, 2021
Vertical memory devices
SAMSUNG ELECTRONICS CO LTD2 citations73
US11049847B2Jun 29, 2021
Semiconductor device for preventing defects between bit lines and channels
SAMSUNG ELECTRONICS CO LTD2 citations73
US10896728B2Jan 19, 2021
Method of writing data in nonvolatile memory device, with divided subpages or subblocks, and method of erasing data in nonvolatile memory device with divided subpages or subblocks
SAMSUNG ELECTRONICS CO LTD5 citations73
US10763167B2Sep 1, 2020
Vertical semiconductor devices and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD2 citations73
US11374017B2Jun 28, 2022
Three-dimensional memory device including a string selection line gate electrode having a silicide layer
SAMSUNG ELECTRONICS CO LTD2 citations72
US10854630B2Dec 1, 2020
Semiconductor device including vertical channel layer
SAMSUNG ELECTRONICS CO LTD2 citations72
US11594544B2Feb 28, 2023
Semiconductor devices with string select channel for improved upper connection
SAMSUNG ELECTRONICS CO LTD5 citations71
US10714495B2Jul 14, 2020
Three-dimensional semiconductor memory devices including through-interconnection structures
SAMSUNG ELECTRONICS CO LTD3 citations71
US10707231B2Jul 7, 2020
Semiconductor memory device having vertical supporter penetrating the gate stack structure and through dielectric pattern
SAMSUNG ELECTRONICS CO LTD5 citations71
NEC CORP
11 patentsUS6010946AJan 4, 2000
Semiconductor device with isolation insulating film tapered and method of manufacturing the same
NEC CORP245 citations98
US6436769B1Aug 20, 2002
Split gate flash memory with virtual ground array structure and method of fabricating the same
NEC CORP34 citations93
US6317360B1Nov 13, 2001
Flash memory and methods of writing and erasing the same as well as a method of forming the same
NEC CORP40 citations93
US7064382B2Jun 20, 2006
Nonvolatile memory and nonvolatile memory manufacturing method
NEC CORP16 citations82
US6426257B1Jul 30, 2002
Flash memory and manufacturing method therefor
NEC CORP8 citations74
US6414346B1Jul 2, 2002
Semiconductor memory and manufacturing method thereof
NEC CORP7 citations74
US6201274B1Mar 13, 2001
Semiconductor device with no step between well regions
NEC CORP10 citations74
US6165847ADec 26, 2000
Nonvolatile semiconductor memory device and method for manufacturing the same
NEC CORP7 citations74
US6151254ANov 21, 2000
Non-volatile semiconductor memory device and data erase method of non-volatile semiconductor memory device
NEC CORP14 citations74
US5592002AJan 7, 1997
Non-volatile semiconductor memory device having reduced current consumption
NEC CORP14 citations74
US5863822AJan 26, 1999
Method of making non-volatile semiconductor memory devices having large capacitance between floating and control gates
NEC CORP9 citations73
NEC ELECTRONICS CORP
5 patentsUS7116581B2Oct 3, 2006
Nonvolatile semiconductor memory device and method of programming in nonvolatile semiconductor memory device
NEC ELECTRONICS CORP29 citations93
US6869849B2Mar 22, 2005
Semiconductor device and its manufacturing method
NEC ELECTRONICS CORP12 citations84
US6747321B2Jun 8, 2004
Semiconductor memory device with a silicide layer formed on regions other than source regions
NEC ELECTRONICS CORP8 citations74
US7268385B2Sep 11, 2007
Semiconductor memory device
NEC ELECTRONICS CORP7 citations72
US7327019B2Feb 5, 2008
Semiconductor device of a charge storage type
NEC ELECTRONICS CORP4 citations71
KANAMORI KOHJI
3 patentsPARK JINTAEK
2 patentsKIM KWANG SOO
1 patentSON YONG HOON
1 patentLEE JAEDUK
1 patentShowing the top 50 of 120 patents by PatentIndex Score.