Inventor
CAMPBELL KRISTY A
US128 patents
⚠️ This page may combine multiple inventors who share the name “CAMPBELL KRISTY A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
49 patentsUS7365411B2Apr 29, 2008
Resistance variable memory with temperature tolerant materials
MICRON TECHNOLOGY INC93 citations99
US7151273B2Dec 19, 2006
Silver-selenide/chalcogenide glass stack for resistance variable memory
MICRON TECHNOLOGY INC102 citations99
US7332735B2Feb 19, 2008
Phase change memory cell and method of formation
MICRON TECHNOLOGY INC58 citations98
US7220982B2May 22, 2007
Amorphous carbon-based non-volatile memory
MICRON TECHNOLOGY INC61 citations98
US6955940B2Oct 18, 2005
Method of forming chalcogenide comprising devices
MICRON TECHNOLOGY INC68 citations98
US6930909B2Aug 16, 2005
Memory device and methods of controlling resistance variation and resistance profile drift
MICRON TECHNOLOGY INC83 citations98
US6867996B2Mar 15, 2005
Single-polarity programmable resistance-variable memory element
MICRON TECHNOLOGY INC94 citations98
US6961277B2Nov 1, 2005
Method of refreshing a PCRAM memory device
MICRON TECHNOLOGY INC52 citations96
US6881623B2Apr 19, 2005
Method of forming chalcogenide comprising devices, method of forming a programmable memory cell of memory circuitry, and a chalcogenide comprising device
MICRON TECHNOLOGY INC64 citations96
US6856002B2Feb 15, 2005
Graded GexSe100-x concentration in PCRAM
MICRON TECHNOLOGY INC36 citations96
US6849868B2Feb 1, 2005
Methods and apparatus for resistance variable material cells
MICRON TECHNOLOGY INC57 citations96
US6646902B2Nov 11, 2003
Method of retaining memory state in a programmable conductor RAM
MICRON TECHNOLOGY INC46 citations96
US7785976B2Aug 31, 2010
Method of forming a memory device incorporating a resistance-variable chalcogenide element
MICRON TECHNOLOGY INC11 citations93
US7723713B2May 25, 2010
Layered resistance variable memory device and method of fabrication
MICRON TECHNOLOGY INC14 citations93
US7663137B2Feb 16, 2010
Phase change memory cell and method of formation
MICRON TECHNOLOGY INC19 citations93
US7659205B2Feb 9, 2010
Amorphous carbon-based non-volatile memory
MICRON TECHNOLOGY INC18 citations93
US7646007B2Jan 12, 2010
Silver-selenide/chalcogenide glass stack for resistance variable memory
MICRON TECHNOLOGY INC15 citations93
US7619247B2Nov 17, 2009
Structure for amorphous carbon based non-volatile memory
MICRON TECHNOLOGY INC22 citations93
US7586777B2Sep 8, 2009
Resistance variable memory with temperature tolerant materials
MICRON TECHNOLOGY INC14 citations93
US7518212B2Apr 14, 2009
Graded GexSe100-x concentration in PCRAM
MICRON TECHNOLOGY INC19 citations93
US7491962B2Feb 17, 2009
Resistance variable memory device with nanoparticle electrode and method of fabrication
MICRON TECHNOLOGY INC17 citations93
US7393798B2Jul 1, 2008
Resistance variable memory with temperature tolerant materials
MICRON TECHNOLOGY INC21 citations93
US7385868B2Jun 10, 2008
Method of refreshing a PCRAM memory device
MICRON TECHNOLOGY INC16 citations93
US7354793B2Apr 8, 2008
Method of forming a PCRAM device incorporating a resistance-variable chalocogenide element
MICRON TECHNOLOGY INC15 citations93
US7348209B2Mar 25, 2008
Resistance variable memory device and method of fabrication
MICRON TECHNOLOGY INC12 citations93
US7344946B2Mar 18, 2008
Structure for amorphous carbon based non-volatile memory
MICRON TECHNOLOGY INC24 citations93
US7329558B2Feb 12, 2008
Differential negative resistance memory
MICRON TECHNOLOGY INC14 citations93
US7326950B2Feb 5, 2008
Memory device with switching glass layer
MICRON TECHNOLOGY INC15 citations93
US7315465B2Jan 1, 2008
Methods of operating and forming chalcogenide glass constant current devices
MICRON TECHNOLOGY INC12 citations93
US7288784B2Oct 30, 2007
Structure for amorphous carbon based non-volatile memory
MICRON TECHNOLOGY INC15 citations93
US7282783B2Oct 16, 2007
Resistance variable memory device and method of fabrication
MICRON TECHNOLOGY INC18 citations93
US7190048B2Mar 13, 2007
Resistance variable memory device and method of fabrication
MICRON TECHNOLOGY INC24 citations93
US7087919B2Aug 8, 2006
Layered resistance variable memory device and method of fabrication
MICRON TECHNOLOGY INC28 citations93
US7087454B2Aug 8, 2006
Fabrication of single polarity programmable resistance structure
MICRON TECHNOLOGY INC41 citations93
US7067348B2Jun 27, 2006
Method of forming a programmable memory cell and chalcogenide structure
MICRON TECHNOLOGY INC15 citations93
US7056762B2Jun 6, 2006
Methods to form a memory cell with metal-rich metal chalcogenide
MICRON TECHNOLOGY INC22 citations93
US7050327B2May 23, 2006
Differential negative resistance memory
MICRON TECHNOLOGY INC33 citations93
US7030405B2Apr 18, 2006
Method and apparatus for resistance variable material cells
MICRON TECHNOLOGY INC26 citations93
US7018863B2Mar 28, 2006
Method of manufacture of a resistance variable memory cell
MICRON TECHNOLOGY INC23 citations93
US7015494B2Mar 21, 2006
Assemblies displaying differential negative resistance
MICRON TECHNOLOGY INC23 citations93
US6998697B2Feb 14, 2006
Non-volatile resistance variable devices
MICRON TECHNOLOGY INC23 citations93
US6953720B2Oct 11, 2005
Methods for forming chalcogenide glass-based memory elements
MICRON TECHNOLOGY INC27 citations93
US6921912B2Jul 26, 2005
Diode/superionic conductor/polymer memory structure
MICRON TECHNOLOGY INC18 citations93
US6912147B2Jun 28, 2005
Chalcogenide glass constant current device, and its method of fabrication and operation
MICRON TECHNOLOGY INC13 citations93
US6891749B2May 10, 2005
Resistance variable ‘on ’ memory
MICRON TECHNOLOGY INC44 citations93
US6888155B2May 3, 2005
Stoichiometry for chalcogenide glasses useful for memory devices and method of formation
MICRON TECHNOLOGY INC45 citations93
US6867114B2Mar 15, 2005
Methods to form a memory cell with metal-rich metal chalcogenide
MICRON TECHNOLOGY INC40 citations93
US6867064B2Mar 15, 2005
Method to alter chalcogenide glass for improved switching characteristics
MICRON TECHNOLOGY INC26 citations93
US6864521B2Mar 8, 2005
Method to control silver concentration in a resistance variable memory element
MICRON TECHNOLOGY INC35 citations93
UNIV BOISE STATE
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