Inventor
SIVAKUMAR SWAMINATHAN
US71 patents
⚠️ This page may combine multiple inventors who share the name “SIVAKUMAR SWAMINATHAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
45 patentsUS7265431B2Sep 4, 2007
Imageable bottom anti-reflective coating for high resolution lithography
INTEL CORP27 citations93
US5933759AAug 3, 1999
Method of controlling etch bias with a fixed lithography pattern for sub-micron critical dimension shallow trench applications
INTEL CORP37 citations90
US10892223B2Jan 12, 2021
Advanced lithography and self-assembled devices
INTEL CORP11 citations86
US11056492B1Jul 6, 2021
Dense memory arrays utilizing access transistors with back-side contacts
INTEL CORP9 citations85
US10325814B2Jun 18, 2019
Patterning of vertical nanowire transistor channel and gate with directed self assembly
INTEL CORP5 citations84
US10211088B2Feb 19, 2019
Self-aligned isotropic etch of pre-formed vias and plugs for back end of line (BEOL) interconnects
INTEL CORP11 citations84
US9793159B2Oct 17, 2017
Previous layer self-aligned via and plug patterning for back end of line (BEOL) interconnects
INTEL CORP13 citations84
US10409152B2Sep 10, 2019
Pattern decomposition lithography techniques
INTEL CORP4 citations83
US7820550B2Oct 26, 2010
Negative tone double patterning method
INTEL CORP10 citations83
US7915171B2Mar 29, 2011
Double patterning techniques and structures
INTEL CORP10 citations82
US12342612B2Jun 24, 2025
Neighboring gate-all-around integrated circuit structures having disjoined epitaxial source or drain regions
INTEL CORP2 citations75
US12218052B2Feb 4, 2025
Advanced lithography and self-assembled devices
INTEL CORP1 citations75
US7312155B2Dec 25, 2007
Forming self-aligned nano-electrodes
INTEL CORP8 citations74
US11862635B2Jan 2, 2024
Neighboring gate-all-around integrated circuit structures having disjoined epitaxial source or drain regions
INTEL CORP2 citations73
US11854787B2Dec 26, 2023
Advanced lithography and self-assembled devices
INTEL CORP1 citations73
US11398474B2Jul 26, 2022
Neighboring gate-all-around integrated circuit structures having disjoined epitaxial source or drain regions
INTEL CORP4 citations73
US11373950B2Jun 28, 2022
Advanced lithography and self-assembled devices
INTEL CORP1 citations73
US11302790B2Apr 12, 2022
Fin shaping using templates and integrated circuit structures resulting therefrom
INTEL CORP3 citations73
US11139300B2Oct 5, 2021
Three-dimensional memory arrays with layer selector transistors
INTEL CORP5 citations73
US10204830B2Feb 12, 2019
Previous layer self-aligned via and plug patterning for back end of line (BEOL) interconnects
INTEL CORP3 citations73
US11107786B2Aug 31, 2021
Pattern decomposition lithography techniques
INTEL CORP2 citations72
US10490519B2Nov 26, 2019
Pattern decomposition lithography techniques
INTEL CORP2 citations72
US6977219B2Dec 20, 2005
Solvent vapor-assisted plasticization of photoresist films to achieve critical dimension reduction during temperature reflow
INTEL CORP8 citations71
US11652060B2May 16, 2023
Die interconnection scheme for providing a high yielding process for high performance microprocessors
INTEL CORP3 citations70
US12432897B2Sep 30, 2025
Cooling approaches for stitched dies
INTEL CORP1 citations63
US12211925B2Jan 28, 2025
Gate-all-around integrated circuit structures having oxide sub-fins
INTEL CORP0 citations63
US12033894B2Jul 9, 2024
Gate aligned contact and method to fabricate same
INTEL CORP0 citations63
US11756829B2Sep 12, 2023
Gate aligned contact and method to fabricate same
INTEL CORP0 citations63
US11749733B2Sep 5, 2023
FIN shaping using templates and integrated circuit structures resulting therefrom
INTEL CORP0 citations63
US11742410B2Aug 29, 2023
Gate-all-around integrated circuit structures having oxide sub-fins
INTEL CORP0 citations63
US11715775B2Aug 1, 2023
Self-aligned gate endcap (SAGE) architectures with gate-all-around devices having epitaxial source or drain structures
INTEL CORP0 citations63
US11495496B2Nov 8, 2022
Gate aligned contact and method to fabricate same
INTEL CORP0 citations63
US11355608B2Jun 7, 2022
Self-aligned gate endcap (SAGE) architectures with gate-all-around devices having epitaxial source or drain structures
INTEL CORP0 citations63
US10910265B2Feb 2, 2021
Gate aligned contact and method to fabricate same
INTEL CORP0 citations63
US9431518B2Aug 30, 2016
Patterning of vertical nanowire transistor channel and gate with directed self assembly
INTEL CORP2 citations63
US9269630B2Feb 23, 2016
Patterning of vertical nanowire transistor channel and gate with directed self assembly
INTEL CORP1 citations63
US7981756B2Jul 19, 2011
Common plate capacitor array connections, and processes of making same
INTEL CORP5 citations63
US7358111B2Apr 15, 2008
Imageable bottom anti-reflective coating for high resolution lithography
INTEL CORP2 citations63
US12426316B2Sep 23, 2025
Method of fabricating integrated circuits with fin trim plug structures having an oxidation catalyst layer surrounded by a recessed dielectric material
INTEL CORP0 citations62
US12114479B2Oct 8, 2024
Three-dimensional memory arrays with layer selector transistors
INTEL CORP0 citations62
US11538937B2Dec 27, 2022
Fin trim plug structures having an oxidation catalyst layer surrounded by a recessed dielectric material
INTEL CORP0 citations62
US10459338B2Oct 29, 2019
Exposure activated chemically amplified directed self-assembly (DSA) for back end of line (BEOL) pattern cutting and plugging
INTEL CORP1 citations62
US12278204B2Apr 15, 2025
Pattern decomposition lithography techniques
INTEL CORP0 citations61
US7927959B2Apr 19, 2011
Method of patterning a metal on a vertical sidewall of an excavated feature, method of forming an embedded MIM capacitor using same, and embedded memory device produced thereby
INTEL CORP3 citations61
US7572557B2Aug 11, 2009
Non-collinear end-to-end structures with sub-resolution assist features
INTEL CORP6 citations61
GOLONZKA OLEG
1 patentWANG YIH
1 patentNYHUS PAUL A
1 patentWALLACE CHARLES H
1 patentSIVAKUMAR SWAMINATHAN
1 patentShowing the top 50 of 71 patents by PatentIndex Score.