Inventor
OODAIRA HIDEKO
JP26 patents
⚠️ This page may combine multiple inventors who share the name “OODAIRA HIDEKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
22 patentsUS6353242B1Mar 5, 2002
Nonvolatile semiconductor memory
TOSHIBA KK127 citations99
US6512253B2Jan 28, 2003
Nonvolatile semiconductor memory
TOSHIBA KK45 citations96
US6240012B1May 29, 2001
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK22 citations96
US6974979B2Dec 13, 2005
Nonvolatile semiconductor memory
TOSHIBA KK17 citations93
US5477495ADec 19, 1995
Nonvolatile semiconductor memory apparatus
TOSHIBA KK22 citations93
US5734286AMar 31, 1998
Driving device of charge pump circuit and driving pulse generation method thereof
TOSHIBA KK53 citations92
US5812455ASep 22, 1998
Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit device
TOSHIBA KK11 citations82
US7893477B2Feb 22, 2011
Nonvolatile semiconductor memory
TOSHIBA KK6 citations74
US7425739B2Sep 16, 2008
Nonvolatile semiconductor memory
TOSHIBA KK6 citations74
US7359228B2Apr 15, 2008
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK5 citations74
US7332762B2Feb 19, 2008
Nonvolatile semiconductor memory
TOSHIBA KK3 citations74
US7002845B2Feb 21, 2006
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK4 citations74
US6836444B2Dec 28, 2004
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK4 citations74
US6611447B2Aug 26, 2003
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK6 citations74
US6487118B2Nov 26, 2002
Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit device
TOSHIBA KK4 citations74
US6424588B2Jul 23, 2002
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK6 citations74
US5943282AAug 24, 1999
Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit device
TOSHIBA KK9 citations74
US7787277B2Aug 31, 2010
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK2 citations63
US6335894B1Jan 1, 2002
Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit device
TOSHIBA KK3 citations63
US6172930B1Jan 9, 2001
Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit device
TOSHIBA KK2 citations63
US8350309B2Jan 8, 2013
Nonvolatile semiconductor memory
TOSHIBA KK1 citations52
US7151685B2Dec 19, 2006
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
TOSHIBA KK0 citations52
NAKAMURA HIROSHI
3 patentsUS8665661B2Mar 4, 2014
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
NAKAMURA HIROSHI0 citations52
US8259494B2Sep 4, 2012
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
NAKAMURA HIROSHI0 citations52
US8248849B2Aug 21, 2012
Semiconductor memory device capable of realizing a chip with high operation reliability and high yield
NAKAMURA HIROSHI0 citations52