Inventor

TING YU-WEI

TW59 patents

⚠️ This page may combine multiple inventors who share the name “TING YU-WEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TING YU-WEI

TAIWAN SEMICONDUCTOR MFG CO LTD

Embedded transistor

Embedded transistor

Embedded transistor

Metal line connection for improved RRAM reliability, semiconductor arrangement comprising the same, and manufacture thereof

Embedded transistor

Device and method for forming resistive random access memory cell

Vertical BJT for high density memory

Metal line connection for improved RRAM reliability, semiconductor arrangement comprising the same, and manufacture thereof

Embedded transistor

Innovative approach of 4F2 driver formation for high-density RRAM and MRAM

Metal line connection for improved RRAM reliability, semiconductor arrangement comprising the same, and manufacture thereof

Vertical BJT for high density memory

Phase-change material (PCM) radio frequency (RF) switching device with thin self-aligned dielectric layer

High-frequency, low-voltage switch devices and methods of manufacturing thereof

Heat controlled switch

Ferroelectric tunnel junction memory devices with enhanced read window

Memory device structure and manufacturing method thereof

Selector for memory device

Vertical 1T1R structure for embedded memory

Voltage regulator having variable output capacitance and methods for forming the same

Embedded transistor

Innovative approach of 4F2 driver formation for high-density RRAM and MRAM

Device and method for setting resistive random access memory cell

Vertical BJT for high density memory

Memory cell with decoupled read/write path

Innovative approach of 4F2 driver formation for high-density RRAM and MRAM

NANYA TECHNOLOGY CORP

Device and method for detecting alignment of active areas and memory cell structures in DRAM devices

Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices

Device and method for detecting alignment of bit lines and bit line contacts in DRAM devices

Test structure of DRAM

Device and method for detecting alignment of active areas and memory cell structures in DRAM devices

Misalignment test structure and method thereof

Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal

Test key for validating the position of a word line overlaying a trench capacitor in DRAMs

Memory device and fabrication method thereof

Device and method for detecting alignment of deep trench capacitors and active areas in DRAM devices

Test key and method for validating the doping concentration of buried layers within a deep trench capacitors

Memory device and fabrication method thereof

Method and device for detecting whether the alignment of bit line contacts and active areas in DRAM devices is normal

TAIWAN SEMICONDUCTOR MFG

Resistive switching random access memory structure and method to recreate filament and recover resistance window

Method and structure for resistive switching random access memory with high reliable and high density

RRAM array using multiple reset voltages and method of resetting RRAM array using multiple reset voltages

Resistive random access memory and method of resetting a resistive random access memory

Device and method for forming resistive random access memory cell

Method and structure for resistive switching random access memory with high reliable and high density

Hybrid memory

Memory cell with decoupled read/write path

TAIWAN SEMICONDCUTOR MFG COMPANY LTD

Structure and method for a forming free resistive random access memory with multi-level cell

TING YU-WEI

Embedded transistor

NANYA TECHONOLGY CORP

Misalignment test structure and method thereof