Inventor
HWANG YOUNG NAM
KR34 patents
⚠️ This page may combine multiple inventors who share the name “HWANG YOUNG NAM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
23 patentsUS7323708B2Jan 29, 2008
Phase change memory devices having phase change area in porous dielectric layer
SAMSUNG ELECTRONICS CO LTD152 citations99
US7067837B2Jun 27, 2006
Phase-change memory devices
SAMSUNG ELECTRONICS CO LTD108 citations98
US7042001B2May 9, 2006
Phase change memory devices including memory elements having variable cross-sectional areas
SAMSUNG ELECTRONICS CO LTD284 citations98
US7042760B2May 9, 2006
Phase-change memory and method having restore function
SAMSUNG ELECTRONICS CO LTD67 citations98
US6806528B2Oct 19, 2004
Phase-changeable memory devices having phase-changeable material regions with lateral contacts and methods of fabrication therefor
SAMSUNG ELECTRONICS CO LTD53 citations96
US7105396B2Sep 12, 2006
Phase changeable memory cells and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD22 citations93
US7018911B2Mar 28, 2006
Methods for fabrication for phase-changeable memory devices having phase-changeable material regions with lateral contacts
SAMSUNG ELECTRONICS CO LTD31 citations93
US6995388B2Feb 7, 2006
Phase changeable memory devices and methods of forming the same in which an upper electrode includes a tip that extends toward a lower electrode
SAMSUNG ELECTRONICS CO LTD24 citations93
US7482616B2Jan 27, 2009
Semiconductor devices having phase change memory cells, electronic systems employing the same and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD39 citations92
US7411208B2Aug 12, 2008
Phase-change memory device having a barrier layer and manufacturing method
SAMSUNG ELECTRONICS CO LTD20 citations92
US7214957B2May 8, 2007
PRAMS having phase-change layer pattern with electrode contact area and methods of forming the same
SAMSUNG ELECTRONICS CO LTD28 citations92
US7969798B2Jun 28, 2011
Phase change memory devices and read methods using elapsed time-based read voltages
SAMSUNG ELECTRONICS CO LTD40 citations91
US7295463B2Nov 13, 2007
Phase-changeable memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD20 citations89
US8026543B2Sep 27, 2011
Semiconductor devices having phase change memory cells, electronic systems employing the same and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD12 citations84
US11995417B2May 28, 2024
Neural processing unit, neural processing system, and application system
SAMSUNG ELECTRONICS CO LTD3 citations74
US11733968B2Aug 22, 2023
Neural processing unit, neural processing system, and application system
SAMSUNG ELECTRONICS CO LTD0 citations62
US9583705B2Feb 28, 2017
Method of fabricating semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations52
US9136474B2Sep 15, 2015
Method of fabricating phase-change random access memory device
SAMSUNG ELECTRONICS CO LTD0 citations52
US7910398B2Mar 22, 2011
Phase-change memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US7514704B2Apr 7, 2009
Phase-change memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD1 citations52
US7351991B2Apr 1, 2008
Methods for forming phase-change memory devices
SAMSUNG ELECTRONICS CO LTD0 citations52
US11651201B2May 16, 2023
Memory device including arithmetic circuit and neural network system including the same
SAMSUNG ELECTRONICS CO LTD0 citations51
US7700430B2Apr 20, 2010
Phase-changeable memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD1 citations49
SAMSUNG ELECTRO MECH
6 patentsUS7781778B2Aug 24, 2010
Semiconductor light emitting device and method of manufacturing the same employing nanowires and a phosphor film
SAMSUNG ELECTRO MECH39 citations92
US7116456B2Oct 3, 2006
Light modulator module package
SAMSUNG ELECTRO MECH5 citations61
US9155192B2Oct 6, 2015
Electronic component package
SAMSUNG ELECTRO MECH0 citations50
US9504169B2Nov 22, 2016
Printed circuit board having embedded electronic device and method of manufacturing the same
SAMSUNG ELECTRO MECH0 citations45
US9171780B2Oct 27, 2015
Method for manufacturing semiconductor package
SAMSUNG ELECTRO MECH0 citations45
US9470635B2Oct 18, 2016
System of measuring warpage and method of measuring warpage
SAMSUNG ELECTRO MECH0 citations39