Inventor
CADLONI GERALD L
US43 patents
⚠️ This page may combine multiple inventors who share the name “CADLONI GERALD L”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
40 patentsUS8862969B2Oct 14, 2014
Memory quality monitor based compensation method and apparatus
MICRON TECHNOLOGY INC28 citations92
US11188416B2Nov 30, 2021
Enhanced block management for a memory sub-system
MICRON TECHNOLOGY INC7 citations84
US10990466B2Apr 27, 2021
Memory sub-system with dynamic calibration using component-based function(s)
MICRON TECHNOLOGY INC6 citations84
US10770168B2Sep 8, 2020
Memory sub-system with background scan and histogram statistics
MICRON TECHNOLOGY INC6 citations84
US10529433B1Jan 7, 2020
Offset memory component automatic calibration (AUTOCAL) error recovery for a memory sub-system
MICRON TECHNOLOGY INC10 citations84
US10446241B1Oct 15, 2019
Automatic calibration (autocal) error recovery for a memory sub-system
MICRON TECHNOLOGY INC7 citations84
US11953980B2Apr 9, 2024
Memory sub-system with dynamic calibration using component-based function(s)
MICRON TECHNOLOGY INC1 citations73
US11715530B2Aug 1, 2023
Offset memory component automatic calibration (autocal) error recovery for a memory sub-system
MICRON TECHNOLOGY INC2 citations73
US11714709B2Aug 1, 2023
Enhanced block management for a memory subsystem
MICRON TECHNOLOGY INC2 citations73
US11526393B2Dec 13, 2022
Memory sub-system with dynamic calibration using component-based function(s)
MICRON TECHNOLOGY INC2 citations73
US11361833B2Jun 14, 2022
Offset memory component automatic calibration (autocal) error recovery for a memory subsystem
MICRON TECHNOLOGY INC2 citations73
US10936246B2Mar 2, 2021
Dynamic background scan optimization in a memory sub-system
MICRON TECHNOLOGY INC3 citations73
US10535417B2Jan 14, 2020
Memory system quality margin analysis and configuration
MICRON TECHNOLOGY INC2 citations73
US9985651B2May 29, 2018
Read threshold calibration for LDPC
MICRON TECHNOLOGY INC3 citations73
US9306600B2Apr 5, 2016
Read threshold calibration for LDPC
MICRON TECHNOLOGY INC3 citations73
US11709732B2Jul 25, 2023
Mitigating read disturb effects in memory devices
MICRON TECHNOLOGY INC3 citations72
US11379304B1Jul 5, 2022
Mitigating read disturb effects in memory devices
MICRON TECHNOLOGY INC2 citations72
US12265447B2Apr 1, 2025
Memory sub-system with dynamic calibration using component-based function(s)
MICRON TECHNOLOGY INC0 citations62
US11714580B2Aug 1, 2023
Dynamic background scan optimization in a memory sub-system
MICRON TECHNOLOGY INC0 citations62
US11705215B2Jul 18, 2023
Memory sub-system with background scan and histogram statistics
MICRON TECHNOLOGY INC0 citations62
US11687408B2Jun 27, 2023
Memory sub-system codeword quality metrics streaming
MICRON TECHNOLOGY INC0 citations62
US11669398B2Jun 6, 2023
Memory components with ordered sweep error recovery
MICRON TECHNOLOGY INC1 citations62
US11392328B2Jul 19, 2022
Dynamic background scan optimization in a memory sub-system
MICRON TECHNOLOGY INC0 citations62
US11335425B2May 17, 2022
Memory system quality integral analysis and configuration
MICRON TECHNOLOGY INC0 citations62
US11264116B2Mar 1, 2022
Memory sub-system with background scan and histogram statistics
MICRON TECHNOLOGY INC0 citations62
US11138068B2Oct 5, 2021
Memory sub-system codeword quality metrics streaming
MICRON TECHNOLOGY INC0 citations62
US11127479B2Sep 21, 2021
Memory system quality margin analysis and configuration
MICRON TECHNOLOGY INC0 citations62
US10896092B2Jan 19, 2021
Memory components with ordered sweep error recovery
MICRON TECHNOLOGY INC1 citations62
US10825540B2Nov 3, 2020
Memory system quality integral analysis and configuration
MICRON TECHNOLOGY INC1 citations62
US10761769B2Sep 1, 2020
Accessible accumulated memory temperature readings in a memory sub-system
MICRON TECHNOLOGY INC1 citations62
US10242751B2Mar 26, 2019
Method and apparatus for providing preloaded non-volatile memory content
MICRON TECHNOLOGY INC1 citations62
US9081717B2Jul 14, 2015
Memory quality monitor based compensation method and apparatus
MICRON TECHNOLOGY INC3 citations60
US10878910B2Dec 29, 2020
Memory start voltage management
MICRON TECHNOLOGY INC0 citations52
US10762968B2Sep 1, 2020
Dynamic user-selectable trim profile in a memory component
MICRON TECHNOLOGY INC0 citations52
US10482965B1Nov 19, 2019
Memory start voltage management
MICRON TECHNOLOGY INC0 citations52
US10355815B2Jul 16, 2019
Bitwise operations and apparatus in a multi-level system
MICRON TECHNOLOGY INC0 citations52
US9692449B2Jun 27, 2017
Read threshold calibration for LDPC
MICRON TECHNOLOGY INC0 citations52
US9374343B2Jun 21, 2016
Bitwise operations and apparatus in a multi-level system
MICRON TECHNOLOGY INC0 citations52
US11113129B2Sep 7, 2021
Real time block failure analysis for a memory sub-system
MICRON TECHNOLOGY INC0 citations51
US10509579B2Dec 17, 2019
Memory system quality threshold intersection analysis and configuration
MICRON TECHNOLOGY INC0 citations42