Inventor · disambiguated record
Junji Nishiura
Also filed as: NISHIURA JUNJI
6 granted patents·194 citations·filing 1979–1992
86Inventor score
Top patents by PatentIndex Score
6 records- 0189US4313200ALogic test system permitting test pattern changes without dummy cyclesTAKEDA RIKEN IND CO LTD·Filed 1979·Granted Jan 26, 1982·52 cites·15 claims
- 0284US4835774ASemiconductor memory test systemADVANTEST CORP·Filed 1987·Granted May 30, 1989·57 cites·4 claims
- 0374US4862071AHigh speed circuit testing apparatus having plural test conditionsADVANTEST CORP·Filed 1988·Granted Aug 29, 1989·29 cites·18 claims
- 0473US5062109AMemory testerADVANTEST CORP·Filed 1989·Granted Oct 29, 1991·32 cites·10 claims
- 0565US4553100ACounter-address memory for multi-channel timing signalsTAKEDA RIKEN IND CO LTD·Filed 1983·Granted Nov 12, 1985·14 cites·22 claims
- 0641US5241264AIC test apparatusADVANTEST CORP·Filed 1992·Granted Aug 31, 1993·10 cites·1 claims
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