P

Inventor

VARGHESE SONY

US54 patents
⚠️ This page may combine multiple inventors who share the name “VARGHESE SONY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

25 patents
US11152373B1Oct 19, 2021

Structures and methods for forming dynamic random-access devices

APPLIED MATERIALS INC6 citations84
US11380691B1Jul 5, 2022

CMOS over array of 3-D DRAM device

APPLIED MATERIALS INC3 citations73
US10607847B1Mar 31, 2020

Gate all around device and method of formation using angled ions

APPLIED MATERIALS INC4 citations73
US11749564B2Sep 5, 2023

Techniques for void-free material depositions

APPLIED MATERIALS INC2 citations70
US10930735B2Feb 23, 2021

Gate all around device and method of formation using angled ions

APPLIED MATERIALS INC0 citations63
US12581637B2Mar 17, 2026

Methods and structures for three-dimensional dynamic random-access memory

APPLIED MATERIALS INC0 citations62
US12482749B2Nov 25, 2025

L-type wordline connection structure for three-dimensional memory

APPLIED MATERIALS INC0 citations62
US11980021B2May 7, 2024

CMOS over array of 3-D DRAM device

APPLIED MATERIALS INC0 citations62
US11700721B2Jul 11, 2023

Structures and methods for forming dynamic random-access devices

APPLIED MATERIALS INC0 citations62
US11569242B2Jan 31, 2023

DRAM memory device having angled structures with sidewalls extending over bitlines

APPLIED MATERIALS INC0 citations62
US11557515B2Jan 17, 2023

Methods for sub-lithography resolution patterning

APPLIED MATERIALS INC0 citations62
US11037788B2Jun 15, 2021

Integration of device regions

APPLIED MATERIALS INC0 citations62
US11018138B2May 25, 2021

Methods for forming dynamic random-access devices by implanting a drain through a spacer opening at the bottom of angled structures

APPLIED MATERIALS INC0 citations62
US12354973B2Jul 8, 2025

Stress and overlay management for semiconductor processing

APPLIED MATERIALS INC0 citations61
US10903211B1Jan 26, 2021

Gate devices and methods of formation using angled ions

APPLIED MATERIALS INC0 citations61
US12131948B2Oct 29, 2024

Techniques for void-free material depositions

APPLIED MATERIALS INC0 citations60
US12217974B2Feb 4, 2025

Localized stress modulation by implant to back of wafer

APPLIED MATERIALS INC0 citations59
US11956978B2Apr 9, 2024

Techniques and device structure based upon directional seeding and selective deposition

APPLIED MATERIALS INC1 citations59
US11404314B2Aug 2, 2022

Metal line patterning

APPLIED MATERIALS INC0 citations59
US12477723B2Nov 18, 2025

Three dimensional memory device and method of fabrication

APPLIED MATERIALS INC0 citations52
US10580651B2Mar 3, 2020

Integration of device regions

APPLIED MATERIALS INC0 citations52
US10692775B2Jun 23, 2020

Fin damage reduction during punch through implantation of FinFET device

APPLIED MATERIALS INC0 citations51
US10686033B2Jun 16, 2020

Fin damage reduction during punch through implantation of FinFET device

APPLIED MATERIALS INC0 citations51
US11974423B2Apr 30, 2024

Replacement channel process for three-dimensional dynamic random access memory

APPLIED MATERIALS INC0 citations50
US12464702B2Nov 4, 2025

Three-dimensional dynamic random-access memory (3D DRAM) gate all-around (GAA) design using stacked Si/SiGe

APPLIED MATERIALS INC0 citations49

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC

15 patents
US10403738B1Sep 3, 2019

Techniques for improved spacer in nanosheet device

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC11 citations84
US10403552B1Sep 3, 2019

Replacement gate formation with angled etch and deposition

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC7 citations83
US10811304B2Oct 20, 2020

Increased isolation of diffusion breaks in FinFET devices using an angled etch

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC3 citations73
US10685865B2Jun 16, 2020

Method and device for power rail in a fin type field effect transistor

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC5 citations73
US11462546B2Oct 4, 2022

Dynamic random access device including two-dimensional array of fin structures

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC3 citations70
US11532483B2Dec 20, 2022

Spacer sculpting for forming semiconductor devices

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC0 citations62
US11217491B2Jan 4, 2022

Replacement gate formation with angled etch and deposition

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC0 citations62
US10971403B2Apr 6, 2021

Structure and method of forming fin device having improved fin liner

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC0 citations62
US10903082B2Jan 26, 2021

Spacer sculpting for forming semiconductor devices

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC0 citations62
US10510610B2Dec 17, 2019

Structure and method of forming fin device having improved fin liner

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC1 citations62
US10886279B2Jan 5, 2021

Device structure for forming semiconductor device having angled contacts

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC0 citations61
US10692872B2Jun 23, 2020

Device structure for forming semiconductor device having angled contacts

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC1 citations61
US10607999B2Mar 31, 2020

Techniques and structure for forming dynamic random access device

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC1 citations59
US11101183B2Aug 24, 2021

Gate spacer formation for scaled CMOS devices

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC0 citations52
US10644117B2May 5, 2020

Techniques for contact formation in self-aligned replacement gate device

VARIAN SEMICONDUCTOR EQUIPMENT ASS INC0 citations52

MICRON TECHNOLOGY INC

10 patents

Showing the top 50 of 54 patents by PatentIndex Score.