P

Inventor

AMEMIYA MITSUAKI

JP43 patents
⚠️ This page may combine multiple inventors who share the name “AMEMIYA MITSUAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CANON KK

42 patents
US5231291AJul 27, 1993

Wafer table and exposure apparatus with the same

CANON KK149 citations98
US5093579AMar 3, 1992

Exposure apparatus with a substrate holding mechanism

CANON KK61 citations96
US5524131AJun 4, 1996

Alignment apparatus and SOR x-ray exposure apparatus having same

CANON KK46 citations95
US6647086B2Nov 11, 2003

X-ray exposure apparatus

CANON KK39 citations93
US5606586AFeb 25, 1997

X-ray exposure method and apparatus and device manufacturing method

CANON KK21 citations93
US5440394AAug 8, 1995

Length-measuring device and exposure apparatus

CANON KK25 citations93
US5323440AJun 21, 1994

X-ray lithography apparatus including a dose detectable mask

CANON KK21 citations93
US5159621AOct 27, 1992

X-ray transmitting window and method of mounting the same

CANON KK22 citations93
US5157700AOct 20, 1992

Exposure apparatus for controlling intensity of exposure radiation

CANON KK41 citations93
US4906326AMar 6, 1990

Mask repair system

CANON KK40 citations93
US6331709B1Dec 18, 2001

Alignment mark detection method, and alignment method, exposure method and device, and device production method making use of the alignment mark detection method

CANON KK17 citations92
US5835560ANov 10, 1998

Exposure apparatus

CANON KK33 citations92
US5822389AOct 13, 1998

Alignment apparatus and SOR X-ray exposure apparatus having same

CANON KK36 citations92
US5138643AAug 11, 1992

Exposure apparatus

CANON KK42 citations92
US7312459B2Dec 25, 2007

Apparatus for evaluating EUV light source, and evaluation method using the same

CANON KK12 citations84
US5131022AJul 14, 1992

Exposure method and apparatus

CANON KK20 citations82
US6455203B1Sep 24, 2002

Mask structure and method of manufacturing the same

CANON KK10 citations74
US6453001B2Sep 17, 2002

X-ray exposure apparatus

CANON KK6 citations74
US6324250B1Nov 27, 2001

Exposure method

CANON KK9 citations74
US6272202B1Aug 7, 2001

Exposure method and X-ray mask structure for use with the same

CANON KK14 citations74
US5680428AOct 21, 1997

Process for holding an object

CANON KK9 citations74
US5604779AFeb 18, 1997

Optical exposure method and device formed by the method

CANON KK17 citations74
US5581590ADec 3, 1996

SOR exposure system and method of manufacturing semiconductor devices using same

CANON KK13 citations74
US5444758AAug 22, 1995

Beam position detecting device

CANON KK17 citations74
US5400386AMar 21, 1995

Angle detecting device and optical apparatus, such as exposure apparatus, employing the same

CANON KK9 citations74
US5267292ANov 30, 1993

X-ray exposure apparatus

CANON KK16 citations74
US5172403ADec 15, 1992

X-ray exposure apparatus

CANON KK19 citations74
US4935947AJun 19, 1990

X-ray exposure apparatus

CANON KK8 citations74
US4604345AAug 5, 1986

Exposure method

CANON KK7 citations74
US7465936B2Dec 16, 2008

Measuring method, exposure apparatus, and device manufacturing method

CANON KK4 citations63
US7014707B2Mar 21, 2006

Apparatus and process for producing crystal article, and thermocouple used therein

CANON KK5 citations63
US6647087B2Nov 11, 2003

Exposure method

CANON KK3 citations63
US6327332B1Dec 4, 2001

Exposure method

CANON KK3 citations63
US9036789B2May 19, 2015

X-ray apparatus and its adjusting method

CANON KK3 citations61
US11112511B2Sep 7, 2021

Radiation detector and compton camera

CANON KK0 citations52
US7633598B2Dec 15, 2009

Filter exposure apparatus, and device manufacturing method

CANON KK1 citations52
US6645707B2Nov 11, 2003

Device manufacturing method

CANON KK1 citations52
US6642528B2Nov 4, 2003

Alignment mark detection method, and alignment method, exposure method and device, and device production method, making use of the alignment mark detection method

CANON KK1 citations52
US9020104B2Apr 28, 2015

X-ray optical apparatus and adjusting method thereof

CANON KK0 citations51
US7271875B2Sep 18, 2007

Alignment apparatus, exposure apparatus and device fabrication method

CANON KK0 citations51
US9020102B2Apr 28, 2015

X-ray optical apparatus

CANON KK0 citations42
US9020098B2Apr 28, 2015

Radiation imaging apparatus

CANON KK0 citations42

CANON KABUHIKI KAISHA

1 patent