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Inventor

LUO TIEN-YING

US22 patents
⚠️ This page may combine multiple inventors who share the name “LUO TIEN-YING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FREESCALE SEMICONDUCTOR INC

15 patents
US7144825B2Dec 5, 2006

Multi-layer dielectric containing diffusion barrier material

FREESCALE SEMICONDUCTOR INC55 citations95
US6884685B2Apr 26, 2005

Radical oxidation and/or nitridation during metal oxide layer deposition process

FREESCALE SEMICONDUCTOR INC22 citations92
US7981808B2Jul 19, 2011

Method of forming a gate dielectric by in-situ plasma

FREESCALE SEMICONDUCTOR INC8 citations84
US7445984B2Nov 4, 2008

Method for removing nanoclusters from selected regions

FREESCALE SEMICONDUCTOR INC10 citations83
US7432158B1Oct 7, 2008

Method for retaining nanocluster size and electrical characteristics during processing

FREESCALE SEMICONDUCTOR INC11 citations83
US7402472B2Jul 22, 2008

Method of making a nitrided gate dielectric

FREESCALE SEMICONDUCTOR INC9 citations83
US7651935B2Jan 26, 2010

Process of forming an electronic device including active regions and gate electrodes of different compositions overlying the active regions

FREESCALE SEMICONDUCTOR INC10 citations82
US8017469B2Sep 13, 2011

Dual high-k oxides with sige channel

FREESCALE SEMICONDUCTOR INC14 citations80
US7829447B2Nov 9, 2010

Semiconductor structure pattern formation

FREESCALE SEMICONDUCTOR INC7 citations73
US7001852B2Feb 21, 2006

Method of making a high quality thin dielectric layer

FREESCALE SEMICONDUCTOR INC2 citations63
US7776731B2Aug 17, 2010

Method of removing defects from a dielectric material in a semiconductor

FREESCALE SEMICONDUCTOR INC2 citations62
US7767588B2Aug 3, 2010

Method for forming a deposited oxide layer

FREESCALE SEMICONDUCTOR INC6 citations62
US7741183B2Jun 22, 2010

Method of forming a gate dielectric

FREESCALE SEMICONDUCTOR INC3 citations62
US7678698B2Mar 16, 2010

Method of forming a semiconductor device with multiple tensile stressor layers

FREESCALE SEMICONDUCTOR INC3 citations62
US7700499B2Apr 20, 2010

Multilayer silicon nitride deposition for a semiconductor device

FREESCALE SEMICONDUCTOR INC0 citations41

GLOBALFOUNDRIES INC

5 patents

LUO TIEN YING

1 patent

ADETUTU OLUBUNMI O

1 patent