Inventor
KARVE GAURI
US70 patents
⚠️ This page may combine multiple inventors who share the name “KARVE GAURI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
48 patentsUS9721848B1Aug 1, 2017
Cutting fins and gates in CMOS devices
IBM32 citations94
US9881937B2Jan 30, 2018
Preventing strained fin relaxation
IBM6 citations84
US9640640B1May 2, 2017
FinFET device with channel strain
IBM5 citations84
US9576979B2Feb 21, 2017
Preventing strained fin relaxation by sealing fin ends
IBM5 citations84
US9496371B1Nov 15, 2016
Channel protection during fin fabrication
IBM7 citations84
US9331148B1May 3, 2016
FinFET device with channel strain
IBM6 citations84
US11239316B2Feb 1, 2022
Semiconductor device and method of forming the semiconductor device
IBM4 citations83
US11127815B2Sep 21, 2021
Semiconductor device and method of forming the semiconductor device
IBM4 citations83
US10381437B2Aug 13, 2019
Semiconductor device and method of forming the semiconductor device
IBM6 citations83
US9917196B1Mar 13, 2018
Semiconductor device and method of forming the semiconductor device
IBM8 citations83
US11462631B2Oct 4, 2022
Sublithography gate cut physical unclonable function
IBM2 citations73
US10833190B2Nov 10, 2020
Super long channel device within VFET architecture
IBM4 citations73
US10615278B2Apr 7, 2020
Preventing strained fin relaxation
IBM4 citations73
US10062714B2Aug 28, 2018
FinFET device having a high germanium content fin structure and method of making same
IBM2 citations73
US9997369B2Jun 12, 2018
Margin for fin cut using self-aligned triple patterning
IBM2 citations73
US9741856B2Aug 22, 2017
Stress retention in fins of fin field-effect transistors
IBM2 citations73
US9502411B1Nov 22, 2016
Strained finFET device fabrication
IBM3 citations73
US10734523B2Aug 4, 2020
Nanosheet substrate to source/drain isolation
IBM6 citations72
US10727273B2Jul 28, 2020
Magnetoresistive random access memory thin film transistor unit cell
IBM2 citations72
US11615992B2Mar 28, 2023
Substrate isolated VTFET devices
IBM2 citations71
US9711507B1Jul 18, 2017
Separate N and P fin etching for reduced CMOS device leakage
IBM3 citations71
US10964812B2Mar 30, 2021
Integration of input/output device in vertical field-effect transistor technology
IBM0 citations63
US10937810B2Mar 2, 2021
Sub-fin removal for SOI like isolation with uniform active fin height
IBM0 citations63
US10424663B2Sep 24, 2019
Super long channel device within VFET architecture
IBM1 citations63
US11869936B2Jan 9, 2024
Semiconductor device and method of forming the semiconductor device
IBM0 citations62
US11869937B2Jan 9, 2024
Semiconductor device and method of forming the semiconductor device
IBM0 citations62
US11398377B2Jul 26, 2022
Bilayer hardmask for direct print lithography
IBM0 citations62
US10170477B2Jan 1, 2019
Forming MOSFET structures with work function modification
IBM1 citations62
US12086528B2Sep 10, 2024
Secure fingerprinting of a trusted photomask
IBM0 citations61
US11043494B2Jun 22, 2021
Structure and method for equal substrate to channel height between N and P fin-FETs
IBM0 citations60
US12327798B2Jun 10, 2025
Physical unclonable function
IBM0 citations52
US11673766B2Jun 13, 2023
Elevator analytics facilitating passenger destination prediction and resource optimization
IBM0 citations52
US11075299B2Jul 27, 2021
Transistor gate having tapered segments positioned above the fin channel
IBM0 citations52
US10840373B2Nov 17, 2020
Integration of input/output device in vertical field-effect transistor technology
IBM0 citations52
US10818751B2Oct 27, 2020
Nanosheet transistor barrier for electrically isolating the substrate from the source or drain regions
IBM0 citations52
US10790393B2Sep 29, 2020
Utilizing multilayer gate spacer to reduce erosion of semiconductor Fin during spacer patterning
IBM0 citations52
US10615276B2Apr 7, 2020
Integration of input/output device in vertical field-effect transistor technology
IBM0 citations52
US10573745B2Feb 25, 2020
Super long channel device within VFET architecture
IBM0 citations52
US10438972B2Oct 8, 2019
Sub-fin removal for SOI like isolation with uniform active fin height
IBM0 citations52
US10304689B2May 28, 2019
Margin for fin cut using self-aligned triple patterning
IBM0 citations52
US10243079B2Mar 26, 2019
Utilizing multilayer gate spacer to reduce erosion of semiconductor fin during spacer patterning
IBM0 citations52
US10211321B2Feb 19, 2019
Stress retention in fins of fin field-effect transistors
IBM0 citations52
US10211319B2Feb 19, 2019
Stress retention in fins of fin field-effect transistors
IBM0 citations52
US10199503B2Feb 5, 2019
Under-channel gate transistors
IBM0 citations52
US10147725B2Dec 4, 2018
Forming MOSFET structures with work function modification
IBM0 citations52
US10121853B2Nov 6, 2018
Structure and process to tuck fin tips self-aligned to gates
IBM0 citations52
US10121852B2Nov 6, 2018
Structure and process to tuck fin tips self-aligned to gates
IBM0 citations52
US10032885B2Jul 24, 2018
Channel replacement and bimodal doping scheme for bulk finFet threshold voltage modulation with reduced performance penalty
IBM0 citations52
ST MICROELECTRONICS INC
1 patentTESSERA LLC
1 patentShowing the top 50 of 70 patents by PatentIndex Score.