P

Inventor

KARVE GAURI

US70 patents
⚠️ This page may combine multiple inventors who share the name “KARVE GAURI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

48 patents
US9721848B1Aug 1, 2017

Cutting fins and gates in CMOS devices

IBM32 citations94
US9881937B2Jan 30, 2018

Preventing strained fin relaxation

IBM6 citations84
US9640640B1May 2, 2017

FinFET device with channel strain

IBM5 citations84
US9576979B2Feb 21, 2017

Preventing strained fin relaxation by sealing fin ends

IBM5 citations84
US9496371B1Nov 15, 2016

Channel protection during fin fabrication

IBM7 citations84
US9331148B1May 3, 2016

FinFET device with channel strain

IBM6 citations84
US11239316B2Feb 1, 2022

Semiconductor device and method of forming the semiconductor device

IBM4 citations83
US11127815B2Sep 21, 2021

Semiconductor device and method of forming the semiconductor device

IBM4 citations83
US10381437B2Aug 13, 2019

Semiconductor device and method of forming the semiconductor device

IBM6 citations83
US9917196B1Mar 13, 2018

Semiconductor device and method of forming the semiconductor device

IBM8 citations83
US11462631B2Oct 4, 2022

Sublithography gate cut physical unclonable function

IBM2 citations73
US10833190B2Nov 10, 2020

Super long channel device within VFET architecture

IBM4 citations73
US10615278B2Apr 7, 2020

Preventing strained fin relaxation

IBM4 citations73
US10062714B2Aug 28, 2018

FinFET device having a high germanium content fin structure and method of making same

IBM2 citations73
US9997369B2Jun 12, 2018

Margin for fin cut using self-aligned triple patterning

IBM2 citations73
US9741856B2Aug 22, 2017

Stress retention in fins of fin field-effect transistors

IBM2 citations73
US9502411B1Nov 22, 2016

Strained finFET device fabrication

IBM3 citations73
US10734523B2Aug 4, 2020

Nanosheet substrate to source/drain isolation

IBM6 citations72
US10727273B2Jul 28, 2020

Magnetoresistive random access memory thin film transistor unit cell

IBM2 citations72
US11615992B2Mar 28, 2023

Substrate isolated VTFET devices

IBM2 citations71
US9711507B1Jul 18, 2017

Separate N and P fin etching for reduced CMOS device leakage

IBM3 citations71
US10964812B2Mar 30, 2021

Integration of input/output device in vertical field-effect transistor technology

IBM0 citations63
US10937810B2Mar 2, 2021

Sub-fin removal for SOI like isolation with uniform active fin height

IBM0 citations63
US10424663B2Sep 24, 2019

Super long channel device within VFET architecture

IBM1 citations63
US11869936B2Jan 9, 2024

Semiconductor device and method of forming the semiconductor device

IBM0 citations62
US11869937B2Jan 9, 2024

Semiconductor device and method of forming the semiconductor device

IBM0 citations62
US11398377B2Jul 26, 2022

Bilayer hardmask for direct print lithography

IBM0 citations62
US10170477B2Jan 1, 2019

Forming MOSFET structures with work function modification

IBM1 citations62
US12086528B2Sep 10, 2024

Secure fingerprinting of a trusted photomask

IBM0 citations61
US11043494B2Jun 22, 2021

Structure and method for equal substrate to channel height between N and P fin-FETs

IBM0 citations60
US12327798B2Jun 10, 2025

Physical unclonable function

IBM0 citations52
US11673766B2Jun 13, 2023

Elevator analytics facilitating passenger destination prediction and resource optimization

IBM0 citations52
US11075299B2Jul 27, 2021

Transistor gate having tapered segments positioned above the fin channel

IBM0 citations52
US10840373B2Nov 17, 2020

Integration of input/output device in vertical field-effect transistor technology

IBM0 citations52
US10818751B2Oct 27, 2020

Nanosheet transistor barrier for electrically isolating the substrate from the source or drain regions

IBM0 citations52
US10790393B2Sep 29, 2020

Utilizing multilayer gate spacer to reduce erosion of semiconductor Fin during spacer patterning

IBM0 citations52
US10615276B2Apr 7, 2020

Integration of input/output device in vertical field-effect transistor technology

IBM0 citations52
US10573745B2Feb 25, 2020

Super long channel device within VFET architecture

IBM0 citations52
US10438972B2Oct 8, 2019

Sub-fin removal for SOI like isolation with uniform active fin height

IBM0 citations52
US10304689B2May 28, 2019

Margin for fin cut using self-aligned triple patterning

IBM0 citations52
US10243079B2Mar 26, 2019

Utilizing multilayer gate spacer to reduce erosion of semiconductor fin during spacer patterning

IBM0 citations52
US10211321B2Feb 19, 2019

Stress retention in fins of fin field-effect transistors

IBM0 citations52
US10211319B2Feb 19, 2019

Stress retention in fins of fin field-effect transistors

IBM0 citations52
US10199503B2Feb 5, 2019

Under-channel gate transistors

IBM0 citations52
US10147725B2Dec 4, 2018

Forming MOSFET structures with work function modification

IBM0 citations52
US10121853B2Nov 6, 2018

Structure and process to tuck fin tips self-aligned to gates

IBM0 citations52
US10121852B2Nov 6, 2018

Structure and process to tuck fin tips self-aligned to gates

IBM0 citations52
US10032885B2Jul 24, 2018

Channel replacement and bimodal doping scheme for bulk finFet threshold voltage modulation with reduced performance penalty

IBM0 citations52

ST MICROELECTRONICS INC

1 patent

TESSERA LLC

1 patent

Showing the top 50 of 70 patents by PatentIndex Score.