Inventor
OYAMATSU HISATO
JP34 patents
⚠️ This page may combine multiple inventors who share the name “OYAMATSU HISATO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
32 patentsUS6835981B2Dec 28, 2004
Semiconductor chip which combines bulk and SOI regions and separates same with plural isolation regions
TOSHIBA KK88 citations98
US6734506B2May 11, 2004
Semiconductor device including a plurality of kinds of MOS transistors having different gate widths and method of manufacturing the same
TOSHIBA KK62 citations96
US5923969AJul 13, 1999
Method for manufacturing a semiconductor device having a limited pocket region
TOSHIBA KK52 citations96
US7148543B2Dec 12, 2006
Semiconductor chip which combines bulk and SOI regions and separates same with plural isolation regions
TOSHIBA KK16 citations93
US7018904B2Mar 28, 2006
Semiconductor chip having multiple functional blocks integrated in a single chip and method for fabricating the same
TOSHIBA KK17 citations93
US6906384B2Jun 14, 2005
Semiconductor device having one of patterned SOI and SON structure
TOSHIBA KK44 citations92
US6855976B2Feb 15, 2005
Semiconductor device using partial SOI substrate and manufacturing method thereof
TOSHIBA KK24 citations92
US6724046B2Apr 20, 2004
Semiconductor device having patterned SOI structure and method for fabricating the same
TOSHIBA KK30 citations92
US6593654B2Jul 15, 2003
Semiconductor device and method for manufacturing same
TOSHIBA KK19 citations92
US6261920B1Jul 17, 2001
N-channel MOSFET having STI structure and method for manufacturing the same
TOSHIBA KK20 citations92
US6204539B1Mar 20, 2001
Semiconductor apparatus and manufacturing method therefor
TOSHIBA KK20 citations92
US6197648B1Mar 6, 2001
Manufacturing method of MOSFET having salicide structure
TOSHIBA KK21 citations92
US5424229AJun 13, 1995
Method for manufacturing MOSFET having an LDD structure
TOSHIBA KK31 citations92
US6091130AJul 18, 2000
Semiconductor device having structure suitable for CMP process
TOSHIBA KK20 citations91
US7187035B2Mar 6, 2007
Semiconductor device comprising multiple layers with trenches formed on a semiconductor substrate
TOSHIBA KK9 citations74
US7098146B2Aug 29, 2006
Semiconductor device having patterned SOI structure and method for fabricating the same
TOSHIBA KK10 citations74
US6861374B2Mar 1, 2005
Semiconductor device having patterned SOI structure and method for fabricating the same
TOSHIBA KK7 citations74
US6828222B2Dec 7, 2004
Method for manufacturing multilayer wiring structure semiconductor device
TOSHIBA KK7 citations74
US6768182B2Jul 27, 2004
Semiconductor device
TOSHIBA KK12 citations74
US5512500AApr 30, 1996
Method of fabricating semiconductor device
TOSHIBA KK8 citations74
US7741159B2Jun 22, 2010
Semiconductor device having channel with cooling fluid and manufacturing method thereof
TOSHIBA KK2 citations63
US7439112B2Oct 21, 2008
Semiconductor device using partial SOI substrate and manufacturing method thereof
TOSHIBA KK4 citations63
US7112822B2Sep 26, 2006
Semiconductor device using partial SOI substrate and manufacturing method thereof
TOSHIBA KK2 citations63
US6653695B2Nov 25, 2003
Semiconductor device with an improved gate electrode pattern
TOSHIBA KK4 citations63
US5691564ANov 25, 1997
Semiconductor device with high speed operation and high integration
TOSHIBA KK4 citations63
US6525402B1Feb 25, 2003
Semiconductor wafer, method of manufacturing the same and semiconductor device
TOSHIBA KK6 citations61
US9041130B2May 26, 2015
Magnetic memory device
TOSHIBA KK1 citations52
USRE42180EMar 1, 2011
Semiconductor device having metal silicide layer on source/drain region and gate electrode and method of manufacturing the same
TOSHIBA KK0 citations52
US7569931B2Aug 4, 2009
Cooling semiconductor device and manufacturing method thereof
TOSHIBA KK0 citations52
US7521300B2Apr 21, 2009
Semiconductor device substrate including a single-crystalline layer and method of manufacturing semiconductor device substrate
TOSHIBA KK0 citations52
US7176536B2Feb 13, 2007
Semiconductor device having metal silicide layer on source/drain region and gate electrode and method of manufacturing the same
TOSHIBA KK1 citations52
US6833301B2Dec 21, 2004
Semiconductor device with an improved gate electrode pattern and a method of manufacturing the same
TOSHIBA KK1 citations52