Inventor
CHO HO JIN
KR31 patents
⚠️ This page may combine multiple inventors who share the name “CHO HO JIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HYNIX SEMICONDUCTOR INC
12 patentsUS6800567B2Oct 5, 2004
Method for forming polyatomic layers
HYNIX SEMICONDUCTOR INC98 citations98
US7985645B2Jul 26, 2011
Semiconductor device having a high aspect cylindrical capacitor and method for fabricating the same
HYNIX SEMICONDUCTOR INC6 citations73
US7208419B2Apr 24, 2007
Method for fabricating semiconductor device
HYNIX SEMICONDUCTOR INC2 citations63
US7723183B2May 25, 2010
Capacitor having tapered cylindrical storage node and method for manufacturing the same
HYNIX SEMICONDUCTOR INC2 citations62
US7638407B2Dec 29, 2009
Method for forming capacitor of semiconductor device
HYNIX SEMICONDUCTOR INC3 citations62
US7576383B2Aug 18, 2009
Capacitor having tapered cylindrical storage node and method for manufacturing the same
HYNIX SEMICONDUCTOR INC2 citations62
US7688570B2Mar 30, 2010
Capacitor with nanotubes and method for fabricating the same
HYNIX SEMICONDUCTOR INC3 citations61
US7463476B2Dec 9, 2008
Capacitor with nanotubes and method for fabricating the same
HYNIX SEMICONDUCTOR INC2 citations61
US7300852B2Nov 27, 2007
Method for manufacturing capacitor of semiconductor element
HYNIX SEMICONDUCTOR INC2 citations61
US6955974B2Oct 18, 2005
Method for forming isolation layer of semiconductor device
HYNIX SEMICONDUCTOR INC5 citations61
US7906419B2Mar 15, 2011
Laser annealing method for manufacturing semiconductor device
HYNIX SEMICONDUCTOR INC0 citations52
US7871939B2Jan 18, 2011
Method for manufacturing semiconductor device using a free radical assisted chemical vapor deposition nitrifying process
HYNIX SEMICONDUCTOR INC0 citations45
SK HYNIX INC
4 patentsUS9634011B2Apr 25, 2017
Semiconductor device having buried gate structure and method for manufacturing the same, memory cell having the same and electronic device having the same
SK HYNIX INC21 citations94
US10153284B2Dec 11, 2018
Semiconductor device having buried gate structure and method for manufacturing the same, memory cell having the same and electronic device having the same
SK HYNIX INC4 citations84
US10037997B1Jul 31, 2018
Semiconductor device having buried gate structure and method for manufacturing the same, memory cell having the same and electronic device having the same
SK HYNIX INC4 citations84
US9947667B2Apr 17, 2018
Semiconductor device having buried gate structure and method for manufacturing the same, memory cell having the same and electronic device having the same
SK HYNIX INC5 citations84
HYUNDAI ELECTRONICS IND
3 patentsUS6319765B1Nov 20, 2001
Method for fabricating a memory device with a high dielectric capacitor
HYUNDAI ELECTRONICS IND22 citations92
US6355521B1Mar 12, 2002
Method of manufacturing a capacitor in a semiconductor device
HYUNDAI ELECTRONICS IND7 citations74
US6054332AApr 25, 2000
Method for fabricating capacitor of semiconductor memory device
HYUNDAI ELECTRONICS IND3 citations63
SAMSUNG ELECTRONICS CO LTD
3 patentsUS9042673B2May 26, 2015
Method and apparatus for deblurring non-uniform motion blur in large scale input image based on tile unit
SAMSUNG ELECTRONICS CO LTD9 citations84
US9189835B2Nov 17, 2015
Method and apparatus for robust estimation of non-uniform motion blur
SAMSUNG ELECTRONICS CO LTD2 citations63
US8995781B2Mar 31, 2015
Method and apparatus for deblurring non-uniform motion blur using multi-frame including blurred image and noise image
SAMSUNG ELECTRONICS CO LTD2 citations63
SAMSUNG ELECTRO MECH
3 patentsUS6437522B1Aug 20, 2002
Method for controlling digital dynamic convergence and system thereof
SAMSUNG ELECTRO MECH7 citations67
US6841925B2Jan 11, 2005
Deflection yoke
SAMSUNG ELECTRO MECH1 citations48
US6685522B2Feb 3, 2004
Magnetic field measuring system of deflection yoke
SAMSUNG ELECTRO MECH0 citations47
CHO HO JIN
2 patentsUS8470668B2Jun 25, 2013
Method for forming pillar type capacitor of semiconductor device
CHO HO JIN30 citations90
US8476688B2Jul 2, 2013
Semiconductor device and method for manufacturing the same,which prevents leaning of a storage node when forming a capacitor having a plurality of storage nodes of “L” or “+” shape support patterns
CHO HO JIN3 citations56