Inventor
HARTMANN UDO
DE18 patents
⚠️ This page may combine multiple inventors who share the name “HARTMANN UDO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
16 patentsUS7088122B2Aug 8, 2006
Test arrangement for testing semiconductor circuit chips
INFINEON TECHNOLOGIES AG20 citations86
US7355911B2Apr 8, 2008
Semiconductor memory component and method for testing semiconductor memory components having a restricted memory area (partial good memories)
INFINEON TECHNOLOGIES AG8 citations73
US6903565B2Jun 7, 2005
Apparatus and method for the parallel and independent testing of voltage-supplied semiconductor devices
INFINEON TECHNOLOGIES AG11 citations73
US6836137B2Dec 28, 2004
Configuration for testing semiconductor devices
INFINEON TECHNOLOGIES AG9 citations73
US6774649B2Aug 10, 2004
Test system for conducting a function test of a semiconductor element on a wafer, and operating method
INFINEON TECHNOLOGIES AG7 citations73
US6858447B2Feb 22, 2005
Method for testing semiconductor chips
INFINEON TECHNOLOGIES AG7 citations72
US7124325B2Oct 17, 2006
Method and apparatus for internally trimming output drivers and terminations in semiconductor devices
INFINEON TECHNOLOGIES AG7 citations65
US7454662B2Nov 18, 2008
Integrated memory having a circuit for testing the operation of the integrated memory, and method for operating the integrated memory
INFINEON TECHNOLOGIES AG2 citations62
US6968483B2Nov 22, 2005
Circuit and method for testing a data memory
INFINEON TECHNOLOGIES AG6 citations62
US6756699B2Jun 29, 2004
Device and method for calibrating the pulse duration of a signal source
INFINEON TECHNOLOGIES AG6 citations62
US6650577B2Nov 18, 2003
Integrated semiconductor memory having memory cells in a plurality of memory cell arrays and method for repairing such a memory
INFINEON TECHNOLOGIES AG5 citations62
US6442063B2Aug 27, 2002
Integrated memory having memory cells with magnetoresistive memory effect
INFINEON TECHNOLOGIES AG6 citations62
US7454676B2Nov 18, 2008
Method for testing semiconductor chips using register sets
INFINEON TECHNOLOGIES AG2 citations56
US7382669B2Jun 3, 2008
Semiconductor memory component and method for testing semiconductor memory components
INFINEON TECHNOLOGIES AG1 citations51
US6750671B2Jun 15, 2004
Apparatus for testing semiconductor devices
INFINEON TECHNOLOGIES AG0 citations51
US7461308B2Dec 2, 2008
Method for testing semiconductor chips by means of bit masks
INFINEON TECHNOLOGIES AG0 citations46