P

Inventor

BULUCEA CONSTANTIN

US71 patents
⚠️ This page may combine multiple inventors who share the name “BULUCEA CONSTANTIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NAT SEMICONDUCTOR CORP

37 patents
US6548842B1Apr 15, 2003

Field-effect transistor for alleviating short-channel effects

NAT SEMICONDUCTOR CORP240 citations99
US6078082AJun 20, 2000

Field-effect transistor having multi-part channel

NAT SEMICONDUCTOR CORP117 citations99
US6020227AFeb 1, 2000

Fabrication of multiple field-effect transistor structure having local threshold-adjust doping

NAT SEMICONDUCTOR CORP182 citations99
US5744372AApr 28, 1998

Fabrication of complementary field-effect transistors each having multi-part channel

NAT SEMICONDUCTOR CORP128 citations99
US7595243B1Sep 29, 2009

Fabrication of semiconductor structure having N-channel channel-junction field-effect transistor

NAT SEMICONDUCTOR CORP115 citations98
US7419863B1Sep 2, 2008

Fabrication of semiconductor structure in which complementary field-effect transistors each have hypoabrupt body dopant distribution below at least one source/drain zone

NAT SEMICONDUCTOR CORP55 citations98
US7176530B1Feb 13, 2007

Configuration and fabrication of semiconductor structure having n-channel channel-junction field-effect transistor

NAT SEMICONDUCTOR CORP91 citations98
US6566204B1May 20, 2003

Use of mask shadowing and angled implantation in fabricating asymmetrical field-effect transistors

NAT SEMICONDUCTOR CORP142 citations98
US6127700AOct 3, 2000

Field-effect transistor having local threshold-adjust doping

NAT SEMICONDUCTOR CORP108 citations98
US5952701ASep 14, 1999

Design and fabrication of semiconductor structure having complementary channel-junction insulated-gate field-effect transistors whose gate electrodes have work functions close to mid-gap semiconductor value

NAT SEMICONDUCTOR CORP177 citations97
US7701005B1Apr 20, 2010

Semiconductor structure in which like-polarity insulated-gate field-effect transistors have multiple vertical body dopant concentration maxima and different halo pocket characteristics

NAT SEMICONDUCTOR CORP33 citations96
US6599804B2Jul 29, 2003

Fabrication of field-effect transistor for alleviating short-channel effects

NAT SEMICONDUCTOR CORP57 citations96
US5698459ADec 16, 1997

Fabrication of bipolar transistors using selective doping to improve performance characteristics

NAT SEMICONDUCTOR CORP48 citations96
US7145191B1Dec 5, 2006

P-channel field-effect transistor with reduced junction capacitance

NAT SEMICONDUCTOR CORP57 citations95
US5441900AAug 15, 1995

CMOS latchup suppression by localized minority carrier lifetime reduction

NAT SEMICONDUCTOR CORP51 citations94
US8034679B1Oct 11, 2011

Fabrication of field-effect transistor having hypoabrupt body dopant distribution below source/drain zone

NAT SEMICONDUCTOR CORP15 citations93
US7642574B2Jan 5, 2010

Semiconductor architecture having field-effect transistors especially suitable for analog applications

NAT SEMICONDUCTOR CORP40 citations93
US7579642B1Aug 25, 2009

Gate-enhanced junction varactor

NAT SEMICONDUCTOR CORP21 citations93
US7081663B2Jul 25, 2006

Gate-enhanced junction varactor with gradual capacitance variation

NAT SEMICONDUCTOR CORP28 citations93
US6576966B1Jun 10, 2003

Field-effect transistor having multi-part channel

NAT SEMICONDUCTOR CORP36 citations93
US5897355AApr 27, 1999

Method of manufacturing insulated gate semiconductor device to improve ruggedness

NAT SEMICONDUCTOR CORP21 citations93
US5701023ADec 23, 1997

Insulated gate semiconductor device typically having subsurface-peaked portion of body region for improved ruggedness

NAT SEMICONDUCTOR CORP41 citations93
US5217907AJun 8, 1993

Array spreading resistance probe (ASRP) method for profile extraction from semiconductor chips of cellular construction

NAT SEMICONDUCTOR CORP58 citations93
US7879669B1Feb 1, 2011

Fabrication of field-effect transistor with reduced junction capacitance and threshold voltage of magnitude that decreases with increasing channel length

NAT SEMICONDUCTOR CORP17 citations92
US7595244B1Sep 29, 2009

Fabrication of like-polarity insulated-gate field-effect transistors having multiple vertical body dopant concentration maxima and different halo pocket characteristics

NAT SEMICONDUCTOR CORP18 citations92
US6797576B1Sep 28, 2004

Fabrication of p-channel field-effect transistor for reducing junction capacitance

NAT SEMICONDUCTOR CORP35 citations92
US5589409ADec 31, 1996

Fabrication of bipolar transistors with improved output current-voltage characteristics

NAT SEMICONDUCTOR CORP25 citations92
US5581115ADec 3, 1996

Bipolar transistors using isolated selective doping to improve performance characteristics

NAT SEMICONDUCTOR CORP41 citations92
US5384477AJan 24, 1995

CMOS latchup suppression by localized minority carrier lifetime reduction

NAT SEMICONDUCTOR CORP29 citations91
US7067879B1Jun 27, 2006

Integration of trench power transistors into a 1.5 μm BCD process

NAT SEMICONDUCTOR CORP18 citations90
US7863681B1Jan 4, 2011

Semiconductor structure utilizing empty and filled wells

NAT SEMICONDUCTOR CORP7 citations84
US7838369B2Nov 23, 2010

Fabrication of semiconductor architecture having field-effect transistors especially suitable for analog applications

NAT SEMICONDUCTOR CORP8 citations84
US7235862B2Jun 26, 2007

Gate-enhanced junction varactor

NAT SEMICONDUCTOR CORP15 citations84
US8735980B2May 27, 2014

Configuration and fabrication of semiconductor structure using empty and filled wells

NAT SEMICONDUCTOR CORP7 citations83
US8013390B1Sep 6, 2011

Semiconductor architecture having field-effect transistors especially suitable for analog applications

NAT SEMICONDUCTOR CORP5 citations74
US7838930B1Nov 23, 2010

Insulated-gate field-effect transistor with hypoabrupt step change in body dopant concentration below source/drain zone

NAT SEMICONDUCTOR CORP4 citations74
US7785971B1Aug 31, 2010

Fabrication of complementary field-effect transistors with vertical body-material dopant profiles tailored to alleviate punchthrough and reduce current leakage

NAT SEMICONDUCTOR CORP6 citations74

BULUCEA CONSTANTIN

5 patents

SILICONIX INC

5 patents

YANG JENG-JIUN

1 patent

PARKER D COURTNEY

1 patent

IDEAL POWER INC

1 patent

Showing the top 50 of 71 patents by PatentIndex Score.