Inventor

KONISHI JUNKO

JP12 patents

⚠️ This page may combine multiple inventors who share the name “KONISHI JUNKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI LTD

2 patents

US6611728B1Aug 26, 2003

Inspection system and method for manufacturing electronic devices using the inspection system

HITACHI LTD71 citations95

US7068834B1Jun 27, 2006

Inspecting method, inspecting system, and method for manufacturing electronic devices

HITACHI LTD35 citations92

ONO MAKOTO

2 patents

US8290241B2Oct 16, 2012

Analyzing apparatus, program, defect inspection apparatus, defect review apparatus, analysis system, and analysis method

ONO MAKOTO2 citations61

US8892494B2Nov 18, 2014

Device for classifying defects and method for adjusting classification

ONO MAKOTO3 citations60

IKEDA YOKO

1 patent

US8428336B2Apr 23, 2013

Inspecting method, inspecting system, and method for manufacturing electronic devices

IKEDA YOKO7 citations79

HIRAI TAKEHIRO

1 patent

US9020237B2Apr 28, 2015

Method for optimizing observed image classification criterion and image classification apparatus

HIRAI TAKEHIRO6 citations71

ISOMAE YUYA

1 patent

US8625906B2Jan 7, 2014

Image classification standard update method, program, and image classification device

ISOMAE YUYA4 citations64

HITACHI HIGH TECH CORP

1 patent

US7424336B2Sep 9, 2008

Test data analyzing system and test data analyzing program

HITACHI HIGH TECH CORP6 citations62

RENESAS ELECTRONICS CORP

1 patent

US8043772B2Oct 25, 2011

Manufacturing method and manufacturing system of semiconductor device

RENESAS ELECTRONICS CORP4 citations60

MIYAKE KOZO

1 patent

US8779360B2Jul 15, 2014

Charged particle beam device, defect observation device, and management server

MIYAKE KOZO2 citations56

KONISHI JUNKO

1 patent

US8472696B2Jun 25, 2013

Observation condition determination support device and observation condition determination support method

KONISHI JUNKO3 citations54

FUNAKOSHI TOMOHIRO

1 patent

US8209135B2Jun 26, 2012

Wafer inspection data handling and defect review tool

FUNAKOSHI TOMOHIRO4 citations53