Inventor
WEINER KURT H
US36 patents
⚠️ This page may combine multiple inventors who share the name “WEINER KURT H”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR TECH CORP
9 patentsUS6751519B1Jun 15, 2004
Methods and systems for predicting IC chip yield
KLA TENCOR TECH CORP222 citations99
US7280945B1Oct 9, 2007
Apparatus and methods for detection of systematic defects
KLA TENCOR TECH CORP121 citations98
US7198963B2Apr 3, 2007
Methodologies for efficient inspection of test structures using electron beam scanning and step and repeat systems
KLA TENCOR TECH CORP87 citations98
US7067335B2Jun 27, 2006
Apparatus and methods for semiconductor IC failure detection
KLA TENCOR TECH CORP93 citations98
US6995393B2Feb 7, 2006
Apparatus and methods for semiconductor IC failure detection
KLA TENCOR TECH CORP72 citations98
US6861666B1Mar 1, 2005
Apparatus and methods for determining and localization of failures in test structures using voltage contrast
KLA TENCOR TECH CORP106 citations97
US6921672B2Jul 26, 2005
Test structures and methods for inspection of semiconductor integrated circuits
KLA TENCOR TECH CORP59 citations96
US6813572B2Nov 2, 2004
Apparatus and methods for managing reliability of semiconductor devices
KLA TENCOR TECH CORP69 citations96
US7560939B1Jul 14, 2009
Electrical defect detection using pre-charge and sense scanning with prescribed delays
KLA TENCOR TECH CORP10 citations84
INTERMOLECULAR INC
7 patentsUS8011317B2Sep 6, 2011
Advanced mixing system for integrated tool having site-isolated reactors
INTERMOLECULAR INC23 citations92
US8633039B2Jan 21, 2014
Methods of combinatorial processing for screening multiple samples on a semiconductor substrate
INTERMOLECULAR INC1 citations63
US8501505B2Aug 6, 2013
Methods of combinatorial processing for screening multiple samples on a semiconductor substrate
INTERMOLECULAR INC2 citations62
US8383430B2Feb 26, 2013
Methods of combinatorial processing for screening multiple samples on a semiconductor substrate
INTERMOLECULAR INC3 citations62
US7955436B2Jun 7, 2011
Systems and methods for sealing in site-isolated reactors
INTERMOLECULAR INC1 citations62
US8500908B2Aug 6, 2013
Method and system for mask handling in high productivity chamber
INTERMOLECULAR INC0 citations51
US8603245B2Dec 10, 2013
Systems and methods for sealing in site-isolated reactors
INTERMOLECULAR INC0 citations50
UNIV CALIFORNIA
6 patentsUS5346850ASep 13, 1994
Crystallization and doping of amorphous silicon on low temperature plastic
UNIV CALIFORNIA154 citations97
US5569624AOct 29, 1996
Method for shallow junction formation
UNIV CALIFORNIA57 citations96
US5773309AJun 30, 1998
Method for producing silicon thin-film transistors with enhanced forward current drive
UNIV CALIFORNIA32 citations92
US5565377AOct 15, 1996
Process for forming retrograde profiles in silicon
UNIV CALIFORNIA23 citations92
US5508065AApr 16, 1996
Method for materials deposition by ablation transfer processing
UNIV CALIFORNIA19 citations92
US6303446B1Oct 16, 2001
Method of making self-aligned lightly-doped-drain structure for MOS transistors
UNIV CALIFORNIA9 citations74
WEINER KURT H
4 patentsUS8414703B2Apr 9, 2013
Advanced mixing system for integrated tool having site-isolated reactors
WEINER KURT H4 citations61
US8207069B2Jun 26, 2012
Advanced mixing method for integrated tool having site-isolated reactors
WEINER KURT H4 citations61
US8772772B2Jul 8, 2014
System and method for increasing productivity of combinatorial screening
WEINER KURT H1 citations51
US9960312B2May 1, 2018
Apparatus and methods for fast chemical electrodeposition for fabrication of solar cells
WEINER KURT H0 citations40
KLA TENCOR CORP
3 patentsUS6642726B2Nov 4, 2003
Apparatus and methods for reliable and efficient detection of voltage contrast defects
KLA TENCOR CORP23 citations92
US6855568B2Feb 15, 2005
Apparatus and methods for monitoring self-aligned contact arrays using voltage contrast inspection
KLA TENCOR CORP27 citations90
US6732002B1May 4, 2004
Apparatus and methods for predicting multiple product chip yields through critical area matching
KLA TENCOR CORP9 citations74