P

Inventor

MATSUSHITA HIROSHI

JP53 patents
⚠️ This page may combine multiple inventors who share the name “MATSUSHITA HIROSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOSHIBA KK

15 patents
US7221991B2May 22, 2007

System and method for monitoring manufacturing apparatuses

TOSHIBA KK24 citations92
US7057259B2Jun 6, 2006

Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them

TOSHIBA KK35 citations92
US7043384B2May 9, 2006

Failure detection system, failure detection method, and computer program product

TOSHIBA KK21 citations92
US6320655B1Nov 20, 2001

Defect-position identifying method for semiconductor substrate

TOSHIBA KK68 citations92
US7742834B2Jun 22, 2010

Management system of semiconductor fabrication apparatus, abnormality factor extraction method of semiconductor fabrication apparatus, and management method of the same

TOSHIBA KK11 citations84
US7599817B2Oct 6, 2009

Abnormality cause specifying method, abnormality cause specifying system, and semiconductor device fabrication method

TOSHIBA KK9 citations84
US7405088B2Jul 29, 2008

Method for analyzing fail bit maps of waters and apparatus therefor

TOSHIBA KK13 citations84
US7197414B2Mar 27, 2007

System and method for identifying a manufacturing tool causing a fault

TOSHIBA KK14 citations84
US7138283B2Nov 21, 2006

Method for analyzing fail bit maps of wafers

TOSHIBA KK12 citations84
US7222026B2May 22, 2007

Equipment for and method of detecting faults in semiconductor integrated circuits

TOSHIBA KK10 citations83
US7529631B2May 5, 2009

Defect detection system, defect detection method, and defect detection program

TOSHIBA KK13 citations80
US6146911ANov 14, 2000

Semiconductor wafer and method of manufacturing the same

TOSHIBA KK14 citations74
US7162072B2Jan 9, 2007

Semiconductor processing device, semiconductor processing system and semiconductor processing management method

TOSHIBA KK3 citations63
US7979154B2Jul 12, 2011

Method and system for managing semiconductor manufacturing device

TOSHIBA KK3 citations62
US7970486B2Jun 28, 2011

Method for controlling semiconductor manufacturing apparatus and control system of semiconductor manufacturing apparatus

TOSHIBA KK1 citations52

SUMITOMO HEAVY INDUSTRIES ION TECH CO LTD

5 patents

SEIKO EPSON CORP

4 patents

NEC CORP

3 patents

SUMITOMO EATON NOVA

3 patents

FUJI ELECTRIC CO LTD

2 patents

MATSUSHITA HIROSHI

2 patents

IBM

2 patents

INST ADVANCED SKIN RES INC

1 patent

TOMOEGAWA PAPER CO LTD

1 patent

SEN CORP

1 patent

MATSUDA RYOTARO

1 patent

KABUSHIKIA KAISHA TOSHIBA

1 patent

CHUGAI PHARMACEUTICAL CO LTD

1 patent

ERIDE INC

1 patent

TOSHIBA MEMORY CORP

1 patent

FUJITSU LTD

1 patent

SEN CORP AN SHI & AXCELIS CO

1 patent

SEN CORP AN SHI AND AXCELIS CO

1 patent

TODA MASAHIRO

1 patent

PANASONIC CORP

1 patent

SUMITOMO HEAVY IND ION TECH CO LTD

1 patent

Showing the top 50 of 53 patents by PatentIndex Score.