Inventor
MATSUSHITA HIROSHI
JP53 patents
⚠️ This page may combine multiple inventors who share the name “MATSUSHITA HIROSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
15 patentsUS7221991B2May 22, 2007
System and method for monitoring manufacturing apparatuses
TOSHIBA KK24 citations92
US7057259B2Jun 6, 2006
Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from them
TOSHIBA KK35 citations92
US7043384B2May 9, 2006
Failure detection system, failure detection method, and computer program product
TOSHIBA KK21 citations92
US6320655B1Nov 20, 2001
Defect-position identifying method for semiconductor substrate
TOSHIBA KK68 citations92
US7742834B2Jun 22, 2010
Management system of semiconductor fabrication apparatus, abnormality factor extraction method of semiconductor fabrication apparatus, and management method of the same
TOSHIBA KK11 citations84
US7599817B2Oct 6, 2009
Abnormality cause specifying method, abnormality cause specifying system, and semiconductor device fabrication method
TOSHIBA KK9 citations84
US7405088B2Jul 29, 2008
Method for analyzing fail bit maps of waters and apparatus therefor
TOSHIBA KK13 citations84
US7197414B2Mar 27, 2007
System and method for identifying a manufacturing tool causing a fault
TOSHIBA KK14 citations84
US7138283B2Nov 21, 2006
Method for analyzing fail bit maps of wafers
TOSHIBA KK12 citations84
US7222026B2May 22, 2007
Equipment for and method of detecting faults in semiconductor integrated circuits
TOSHIBA KK10 citations83
US7529631B2May 5, 2009
Defect detection system, defect detection method, and defect detection program
TOSHIBA KK13 citations80
US6146911ANov 14, 2000
Semiconductor wafer and method of manufacturing the same
TOSHIBA KK14 citations74
US7162072B2Jan 9, 2007
Semiconductor processing device, semiconductor processing system and semiconductor processing management method
TOSHIBA KK3 citations63
US7979154B2Jul 12, 2011
Method and system for managing semiconductor manufacturing device
TOSHIBA KK3 citations62
US7970486B2Jun 28, 2011
Method for controlling semiconductor manufacturing apparatus and control system of semiconductor manufacturing apparatus
TOSHIBA KK1 citations52
SUMITOMO HEAVY INDUSTRIES ION TECH CO LTD
5 patentsUS11569058B2Jan 31, 2023
Ion implanter and ion implantation method
SUMITOMO HEAVY INDUSTRIES ION TECH CO LTD2 citations73
US10354835B2Jul 16, 2019
Ion implanter, ion beam irradiated target, and ion implantation method
SUMITOMO HEAVY INDUSTRIES ION TECH CO LTD5 citations73
US10490389B2Nov 26, 2019
Ion implanter and ion implantation method
SUMITOMO HEAVY INDUSTRIES ION TECH CO LTD4 citations65
US11923167B2Mar 5, 2024
Ion implanter and ion implantation method
SUMITOMO HEAVY INDUSTRIES ION TECH CO LTD0 citations63
US11062880B2Jul 13, 2021
Ion implanter
SUMITOMO HEAVY INDUSTRIES ION TECH CO LTD0 citations62
SEIKO EPSON CORP
4 patentsUS6509870B1Jan 21, 2003
Software-compensated crystal oscillator
SEIKO EPSON CORP31 citations93
US10701344B2Jun 30, 2020
Information processing device, information processing system, control method of an information processing device, and parameter setting method
SEIKO EPSON CORP1 citations62
US11150611B2Oct 19, 2021
Wearable device and time correction method
SEIKO EPSON CORP0 citations52
US9967550B2May 8, 2018
Three-dimensional image processing system, three-dimensional image processing apparatus, and three-dimensional image processing method
SEIKO EPSON CORP0 citations52
NEC CORP
3 patentsUS6335648B1Jan 1, 2002
Circuit using internal pull-up/pull-down resistor during reset
NEC CORP22 citations93
US5424675AJun 13, 1995
Full differential type analog circuit having parallel oppositely connected capacitors to eliminate unbalanced parasitic capacitances
NEC CORP18 citations74
US6157240ADec 5, 2000
Output logic setting circuit in semiconductor integrated circuit
NEC CORP0 citations52
SUMITOMO EATON NOVA
3 patentsUS6794661B2Sep 21, 2004
Ion implantation apparatus capable of increasing beam current
SUMITOMO EATON NOVA37 citations91
US6797968B2Sep 28, 2004
Ion beam processing method and apparatus therefor
SUMITOMO EATON NOVA15 citations82
US7138641B2Nov 21, 2006
Beam deflecting method, beam deflector for scanning, ion implantation method, and ion implantation system
SUMITOMO EATON NOVA8 citations73
FUJI ELECTRIC CO LTD
2 patentsMATSUSHITA HIROSHI
2 patentsIBM
2 patentsINST ADVANCED SKIN RES INC
1 patentTOMOEGAWA PAPER CO LTD
1 patentSEN CORP
1 patentMATSUDA RYOTARO
1 patentKABUSHIKIA KAISHA TOSHIBA
1 patentCHUGAI PHARMACEUTICAL CO LTD
1 patentERIDE INC
1 patentTOSHIBA MEMORY CORP
1 patentFUJITSU LTD
1 patentSEN CORP AN SHI & AXCELIS CO
1 patentSEN CORP AN SHI AND AXCELIS CO
1 patentTODA MASAHIRO
1 patentPANASONIC CORP
1 patentSUMITOMO HEAVY IND ION TECH CO LTD
1 patentShowing the top 50 of 53 patents by PatentIndex Score.