Inventor
NIIJIMA HIRONOBU
JP9 patents
⚠️ This page may combine multiple inventors who share the name “NIIJIMA HIRONOBU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANTEST CORP
8 patentsUS5757198AMay 26, 1998
Method and apparatus for detecting an IC defect using charged particle beam
ADVANTEST CORP63 citations95
US4789945ADec 6, 1988
Method and apparatus for charged particle beam exposure
ADVANTEST CORP62 citations95
US5821761AOct 13, 1998
Apparatus detecting an IC defect by comparing electron emissions from two integrated circuits
ADVANTEST CORP19 citations91
US5640098AJun 17, 1997
IC fault analysis system having charged particle beam tester
ADVANTEST CORP27 citations91
US5592100AJan 7, 1997
Method for detecting an IC defect using charged particle beam
ADVANTEST CORP28 citations91
US5521517AMay 28, 1996
Method and apparatus for detecting an IC defect using a charged particle beam
ADVANTEST CORP27 citations91
US5825191AOct 20, 1998
IC fault location tracing apparatus and method
ADVANTEST CORP16 citations73
US5892779AApr 6, 1999
Scan test apparatus
ADVANTEST CORP6 citations56