Inventor · disambiguated record
Abhishek Shendre
Also filed as: SHENDRE ABHISHEK
5 granted patents·6 pending applications·2 citations·filing 2020–2024
64Inventor score
Files withD2S INC11
Top patents by PatentIndex Score
11 records- 0191US11756765B2Method and system for determining a charged particle beam exposure for a local pattern densityD2S INC·Filed 2021·Granted Sep 12, 2023·2 cites·16 claims
- 0280US12243712B2Method and system for determining a charged particle beam exposure for a local pattern densityD2S INC·Filed 2023·Granted Mar 4, 2025·0 cites·17 claims
- 0379US11886166B2Method and system of reducing charged particle beam write timeD2S INC·Filed 2023·Granted Jan 30, 2024·0 cites·20 claims
- 0475US2025190673A1Correcting rule violations in a layoutD2S INC·Filed 2024·Application pending·0 cites
- 0575US2025189885A1Correcting rule violations in a layoutD2S INC·Filed 2024·Application pending·0 cites
- 0675US2025190675A1Pixel-based rule check for layoutsD2S INC·Filed 2024·Application pending·0 cites
- 0772US2023124768A1Method and system for determining a charged particle beam exposure for a local pattern densityD2S INC·Filed 2022·Application pending·0 cites
- 0869US11604451B2Method and system of reducing charged particle beam write timeD2S INC·Filed 2021·Granted Mar 14, 2023·0 cites·19 claims
- 0961US2025189948A1Pixel-based rule check for layoutsD2S INC·Filed 2024·Application pending·0 cites
- 1053US2025190674A1Correcting rule violations in a layoutD2S INC·Filed 2024·Application pending·0 cites
- 1150US11263496B2Methods and systems to classify features in electronic designsD2S INC·Filed 2020·Granted Mar 1, 2022·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →