Inventor · disambiguated record
Abhilash Srikantha
Also filed as: SRIKANTHA ABHILASH
3 granted patents·9 pending applications·2 citations·filing 2020–2025
50Inventor score
Files withZEISS CARL SMT GMBH12
Top patents by PatentIndex Score
12 records- 0187US12175650B2Processing image data setsZEISS CARL SMT GMBH·Filed 2021·Granted Dec 24, 2024·2 cites·24 claims
- 0261US2024411296A1Computer implemented method for the detection and classification of anomalies in an imaging dataset of a wafer, and systems making use of such methodsZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 0360US2025272946A1Sensor fusion for thin film segmentationZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0457US2025209603A1Computer implemented method for defect recognition in an imaging dataset of a wafer, corresponding computer readable-medium, computer program product and systems making use of such methodsZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0556US11436506B2Method and devices for determining metrology sitesZEISS CARL SMT GMBH·Filed 2020·Granted Sep 6, 2022·0 cites·27 claims
- 0656US2025021828A1Computer implemented method for the detection of anomalies in an imaging dataset of a wafer, and systems making use of such methodsZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 0755US2025216842A1Computer implemented method for defect detection in an imaging dataset of a wafer, corresponding computer-readable medium, computer program product and systems making use of such methodsZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0854US2024087134A1Segmentation or cross sections of high aspect ratio structuresZEISS CARL SMT GMBH·Filed 2023·Application pending·0 cites
- 0953US2025173655A1Methods, systems, computer programs and computer-readable media for automatically designing a workflow to perform a semiconductor inspection taskZEISS CARL SMT GMBH·Filed 2023·Application pending·0 cites
- 1046US12045969B2Automated root cause analysis for defect detection during fabrication processes of semiconductor structuresZEISS CARL SMT GMBH·Filed 2020·Granted Jul 23, 2024·0 cites·20 claims
- 1145US2020258212A1Error reduction in images which were generated with charged particles and with the aid of machine-learning-based methodsZEISS CARL SMT GMBH·Filed 2020·Application pending·0 cites
- 1244US2022044949A1Interactive and iterative training of a classification algorithm for classifying anomalies in imaging datasetsZEISS CARL SMT GMBH·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →