Inventor · disambiguated record
Adam Jan Urbanczyk
Also filed as: URBANCZYK ADAM · URBANCZYK ADAM JAN
3 granted patents·2 pending applications·3 citations·filing 2017–2022
55Inventor score
Files withASML NETHERLANDS BV5
Top patents by PatentIndex Score
5 records- 0182US10551750B2Metrology method and apparatus and associated computer productASML NETHERLANDS BV·Filed 2019·Granted Feb 4, 2020·2 cites·20 claims
- 0277US10310388B2Metrology method and apparatus and associated computer productASML NETHERLANDS BV·Filed 2018·Granted Jun 4, 2019·1 cites·20 claims
- 0355US2024402618A1Method of determining a performance parameter distributionASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0449US2022413391A1Method and apparatus for determining control data for a lithographic apparatusASML NETHERLANDS BV·Filed 2020·Application pending·0 cites
- 0542US11300887B2Method to change an etch parameterASML NETHERLANDS BV·Filed 2017·Granted Apr 12, 2022·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →