Inventor · disambiguated record
Ahmet S. Ozcan
Also filed as: OZCAN AHMET · OZCAN AHMET S · OZCAN AHMET SERKAN
88 granted patents·20 pending applications·176 citations·filing 2008–2022
99Inventor score
Top patents by PatentIndex Score
108 records- 0194US8603881B1Raised trench metal semiconductor alloy formationIBM·Filed 2012·Granted Dec 10, 2013·19 cites·20 claims
- 0293US9379012B2Oxide mediated epitaxial nickel disilicide alloy contact formationGLOBALFOUNDRIES INC·Filed 2016·Granted Jun 28, 2016·7 cites·18 claims
- 0392US8030154B1Method for forming a protection layer over metal semiconductor contact and structure formed thereonIBM·Filed 2010·Granted Oct 4, 2011·15 cites·23 claims
- 0490US11101219B2Low resistance contacts including intermetallic alloy of nickel, platinum, titanium, aluminum and type IV semiconductor elementsIBM·Filed 2019·Granted Aug 24, 2021·3 cites·18 claims
- 0590US10269714B2Low resistance contacts including intermetallic alloy of nickel, platinum, titanium, aluminum and type IV semiconductor elementsIBM·Filed 2016·Granted Apr 23, 2019·4 cites·9 claims
- 0689US10985105B2Low resistance contacts including intermetallic alloy of nickel, platinum, titanium, aluminum and type IV semiconductor elementsIBM·Filed 2018·Granted Apr 20, 2021·3 cites·18 claims
- 0789US8614107B2Liner-free tungsten contactIBM·Filed 2013·Granted Dec 24, 2013·8 cites·7 claims
- 0888US10546941B2Forming thermally stable salicide for salicide first contactsIBM·Filed 2017·Granted Jan 28, 2020·3 cites·18 claims
- 0988US9236345B2Oxide mediated epitaxial nickel disilicide alloy contact formationGLOBALFOUNDRIES INC·Filed 2014·Granted Jan 12, 2016·6 cites·12 claims
- 1087US10685888B2Low resistance source-drain contacts using high temperature silicidesIBM·Filed 2016·Granted Jun 16, 2020·3 cites·10 claims
- 1187US9882005B2Fully depleted silicon-on-insulator device formationIBM·Filed 2015·Granted Jan 30, 2018·4 cites·7 claims
- 1287US8614106B2Liner-free tungsten contactLAVOIE CHRISTIAN·Filed 2011·Granted Dec 24, 2013·7 cites·15 claims
- 1387US8598006B2Strain preserving ion implantation methodsDE SOUZA JOEL P·Filed 2010·Granted Dec 3, 2013·9 cites·16 claims
- 1487US8278200B2Metal-semiconductor intermixed regionsLAVOIE CHRISTIAN·Filed 2011·Granted Oct 2, 2012·8 cites·15 claims
- 1587US7993987B1Surface cleaning using sacrificial getter layerIBM·Filed 2010·Granted Aug 9, 2011·8 cites·20 claims
- 1687US7759208B1Low temperature ion implantation for improved silicide contactsIBM·Filed 2009·Granted Jul 20, 2010·14 cites·20 claims
- 1786US8796099B2Inducing channel strain via encapsulated silicide formationIBM·Filed 2012·Granted Aug 5, 2014·7 cites·16 claims
- 1885US9093425B1Self-aligned liner formed on metal semiconductor alloy contactsIBM·Filed 2014·Granted Jul 28, 2015·6 cites·9 claims
- 1983US8349716B2Semiconductor device with reduced junction leakage and an associated method of forming such a semiconductor deviceIBM·Filed 2010·Granted Jan 8, 2013·7 cites·20 claims
- 2081US10541191B2Elbow contact for field-effect transistor and manufacture thereofIBM·Filed 2017·Granted Jan 21, 2020·2 cites·6 claims
- 2179US10943988B2Thermally stable salicide formation for salicide first contactsIBM·Filed 2019·Granted Mar 9, 2021·1 cites·14 claims
- 2279US10937889B2Forming thermally stable salicide for salicide first contactsIBM·Filed 2019·Granted Mar 2, 2021·1 cites·20 claims
- 2379US10423877B2High memory bandwidth neuromorphic computing systemIBM·Filed 2016·Granted Sep 24, 2019·3 cites·20 claims
- 2478US9786547B2Channel silicon germanium formation methodIBM·Filed 2016·Granted Oct 10, 2017·2 cites·13 claims
- 2577US12430868B2Guided multi-spectral inspectionIBM·Filed 2020·Granted Sep 30, 2025·1 cites·17 claims
- 2677US12062614B2Low resistance contacts including intermetallic alloy of nickel, platinum, titanium, aluminum and type IV semiconductor elementsIBM·Filed 2021·Granted Aug 13, 2024·0 cites·19 claims
- 2777US11062956B2Low resistance source-drain contacts using high temperature silicidesIBM·Filed 2017·Granted Jul 13, 2021·1 cites·9 claims
- 2877US10825740B2Low resistance source-drain contacts using high temperature silicidesIBM·Filed 2017·Granted Nov 3, 2020·1 cites·5 claims
- 2977US9559202B2Method for forming metal semiconductor alloys in contact holes and trenchesIBM·Filed 2014·Granted Jan 31, 2017·2 cites·18 claims
- 3076US11862567B2Low resistance contacts including intermetallic alloy of nickel, platinum, titanium, aluminum and type IV semiconductor elementsIBM·Filed 2021·Granted Jan 2, 2024·0 cites·20 claims
- 3176US10453935B2Thermally stable salicide formation for salicide first contactsIBM·Filed 2017·Granted Oct 22, 2019·1 cites·6 claims
- 3275US11184245B2Configuring computing nodes in a three-dimensional mesh topologyIBM·Filed 2020·Granted Nov 23, 2021·1 cites·21 claims
- 3374US8927422B2Raised silicide contactALPTEKIN EMRE·Filed 2012·Granted Jan 6, 2015·3 cites·19 claims
- 3471US9230857B2Method to improve semiconductor surfaces and polishingIBM·Filed 2014·Granted Jan 5, 2016·2 cites·17 claims
- 3569US10147676B1Wafer-scale power deliveryIBM·Filed 2017·Granted Dec 4, 2018·1 cites·20 claims
- 3668US8456011B2Method to control metal semiconductor micro-structureLAVOIE CHRISTIAN·Filed 2011·Granted Jun 4, 2013·2 cites·6 claims
- 3768US8021971B2Structure and method to form a thermally stable silicide in narrow dimension gate stacksIBM·Filed 2009·Granted Sep 20, 2011·3 cites·30 claims
- 3867US11645206B2Distributed memory-augmented neural network architectureIBM·Filed 2021·Granted May 9, 2023·0 cites·20 claims
- 3965US9443772B2Diffusion-controlled semiconductor contact creationIBM·Filed 2014·Granted Sep 13, 2016·1 cites·18 claims
- 4064US10707148B2Elbow contact for field-effect transistor and manufacture thereofIBM·Filed 2019·Granted Jul 7, 2020·0 cites·5 claims
- 4164US9397181B2Diffusion-controlled oxygen depletion of semiconductor contact interfaceIBM·Filed 2014·Granted Jul 19, 2016·1 cites·2 claims
- 4264US8013419B2Structure and method to form dual silicide e-fuseIBM·Filed 2008·Granted Sep 6, 2011·2 cites·3 claims
- 4363US11646944B2Configuring computing nodes in a three-dimensional mesh topologyIBM·Filed 2021·Granted May 9, 2023·0 cites·20 claims
- 4463US9449827B2Metal semiconductor alloy contact resistance improvementIBM·Filed 2014·Granted Sep 20, 2016·1 cites·20 claims
- 4563US8809142B2Structure and method to form E-fuse with enhanced current crowdingKIM DEOK-KEE·Filed 2012·Granted Aug 19, 2014·1 cites·20 claims
- 4662US11176043B2Distributed memory-augmented neural network architectureIBM·Filed 2020·Granted Nov 16, 2021·0 cites·20 claims
- 4761US8603915B2Multi-stage silicidation processALPTEKIN EMRE·Filed 2011·Granted Dec 10, 2013·1 cites·18 claims
- 4860US10079148B2Material removal process for self-aligned contactsIBM·Filed 2017·Granted Sep 18, 2018·0 cites·11 claims
- 4960US9929016B2Material removal process for self-aligned contactsIBM·Filed 2017·Granted Mar 27, 2018·0 cites·1 claims
- 5060US9425309B2Method for forming metal semiconductor alloys in contact holes and trenchesIBM·Filed 2014·Granted Aug 23, 2016·0 cites·8 claims
Showing the top 50 of 108 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →