Inventor · disambiguated record
Akihiko Honma
Also filed as: HONMA AKIHIKO
6 granted patents·71 citations·filing 1994–2005
81Inventor score
Top patents by PatentIndex Score
6 records- 0172US5955660AMethod of controlling probe microscopeSEIKO INSTR INC·Filed 1996·Granted Sep 21, 1999·50 cites·6 claims
- 0255US6904791B2Scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2003·Granted Jun 14, 2005·8 cites·9 claims
- 0350US7066015B2Scanning probe microscopeSII NANOTECHNOLOGY INC·Filed 2005·Granted Jun 27, 2006·1 cites·3 claims
- 0446US6734426B2Probe scanning deviceSII NANOTECHNOLOGY INC·Filed 2002·Granted May 11, 2004·4 cites·26 claims
- 0535US5506400AScanning type probe microscopeSEIKO INSTR INC·Filed 1994·Granted Apr 9, 1996·5 cites·2 claims
- 0632US6242736B1Scanning probe microscopeSEIKO INSTR INC·Filed 1998·Granted Jun 5, 2001·3 cites·31 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →