Inventor · disambiguated record
Akira Ikegami
Also filed as: IKEGAMI AKIRA
56 granted patents·6 pending applications·748 citations·filing 1977–2024
98Inventor score
Top patents by PatentIndex Score
62 records- 0197US4457161AGas detection device and method for detecting gasHITACHI LTD·Filed 1981·Granted Jul 3, 1984·147 cites·21 claims
- 0296US6946656B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2002·Granted Sep 20, 2005·56 cites·32 claims
- 0395US7087899B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2005·Granted Aug 8, 2006·19 cites·19 claims
- 0493US7372028B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2006·Granted May 13, 2008·14 cites·20 claims
- 0592US4490429AProcess for manufacturing a multilayer circuit boardHITACHI LTD·Filed 1982·Granted Dec 25, 1984·82 cites·14 claims
- 0690US7700918B2Sample electrification measurement method and charged particle beam apparatusHITACHI LTD·Filed 2008·Granted Apr 20, 2010·8 cites·14 claims
- 0787US9704687B2Charged particle beam application deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Jul 11, 2017·5 cites·9 claims
- 0887US4424251AThick-film multi-layer wiring boardHITACHI LTD·Filed 1981·Granted Jan 3, 1984·47 cites·24 claims
- 0986US10832886B2Beam irradiation deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Nov 10, 2020·3 cites·11 claims
- 1086US8263934B2Method for detecting information of an electric potential on a sample and charged particle beam apparatusYAMAZAKI MINORU·Filed 2007·Granted Sep 11, 2012·7 cites·18 claims
- 1185US11056310B2Charged-particle beam deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Jul 6, 2021·4 cites·10 claims
- 1285US9997326B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Jun 12, 2018·4 cites·7 claims
- 1385US7566839B2Contact-breaker device, circuit and apparatus comprising the same, and method for assembling contact-breaker deviceHUKUBA DENTAL KABUSHIKI KAISHA·Filed 2005·Granted Jul 28, 2009·32 cites·7 claims
- 1484US11177108B2Charged particle beam application apparatusHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 16, 2021·4 cites·15 claims
- 1584US8080790B2Scanning electron microscopeYAMAZAKI MINORU·Filed 2009·Granted Dec 20, 2011·7 cites·20 claims
- 1684US7989768B2Scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2008·Granted Aug 2, 2011·6 cites·6 claims
- 1783US7763852B2Scanning electron microscope having time constant measurement capabilityHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 27, 2010·8 cites·12 claims
- 1882US10304654B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2016·Granted May 28, 2019·3 cites·15 claims
- 1981US4347166AThermistor compositionHITACHI LTD·Filed 1979·Granted Aug 31, 1982·22 cites·8 claims
- 2080US8729491B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted May 20, 2014·4 cites·7 claims
- 2180US4586143AGas detecting apparatusHITACHI LTD·Filed 1983·Granted Apr 29, 1986·36 cites·9 claims
- 2279US9653256B2Charged particle-beam deviceHITACHI HIGH TECH CORP·Filed 2014·Granted May 16, 2017·4 cites·12 claims
- 2379US8274048B2Scanning electron microscope having time constant measurement capabilityIKEGAMI AKIRA·Filed 2010·Granted Sep 25, 2012·5 cites·5 claims
- 2478US8481934B2Method for inspecting and measuring sample and scanning electron microscopeEZUMI MAKOTO·Filed 2011·Granted Jul 9, 2013·3 cites·8 claims
- 2577US7960696B2Method for inspecting and measuring sample and scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 14, 2011·4 cites·4 claims
- 2676US4547625AGlass multilayer wiring board and method for its manufactureHITACHI LTD·Filed 1983·Granted Oct 15, 1985·38 cites·13 claims
- 2775US4718999AAir-fuel ratio detectorHITACHI LTD·Filed 1985·Granted Jan 12, 1988·36 cites·17 claims
- 2874US4160227AThermistor composition and thick film thermistorHITACHI LTD·Filed 1977·Granted Jul 3, 1979·20 cites·10 claims
- 2971US11784023B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2021·Granted Oct 10, 2023·0 cites·5 claims
- 3070US11791124B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2021·Granted Oct 17, 2023·0 cites·3 claims
- 3169US11239042B2Beam irradiation deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Feb 1, 2022·0 cites·5 claims
- 3268US9941095B2Charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Apr 10, 2018·1 cites·10 claims
- 3366US12481142B2Photoelectron emission microscopeHITACHI HIGH TECH CORP·Filed 2023·Granted Nov 25, 2025·0 cites·11 claims
- 3465US4873022AElectrically conductive paste, electronic circuit component and method for producing sameHITACHI LTD·Filed 1987·Granted Oct 10, 1989·21 cites·30 claims
- 3565US4264889APressure transducerHITACHI LTD·Filed 1980·Granted Apr 28, 1981·20 cites·9 claims
- 3662US2020294757A1Charged Particle Beam ApparatusHITACHI HIGH TECH CORP·Filed 2020·Application pending·0 cites
- 3761US4816949AMagnetic head containing amorphous alloy and crystallizable glassHITACHI LTD·Filed 1987·Granted Mar 28, 1989·20 cites·8 claims
- 3861US2025020604A1Photoelectron emission microscopeHITACHI HIGH TECH CORP·Filed 2024·Application pending·0 cites
- 3959US8766182B2Method for detecting information of an electric potential on a sample and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 1, 2014·0 cites·8 claims
- 4059US4361597AProcess for making sensor for detecting fluid flow velocity or flow amountHITACHI LTD·Filed 1981·Granted Nov 30, 1982·17 cites·15 claims
- 4159US2024381593A1Power converterFUJI ELECTRIC CO LTD·Filed 2024·Application pending·0 cites
- 4258US12125667B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 22, 2024·0 cites·10 claims
- 4358US11915903B2Electron beam application apparatusHITACHI HIGH TECH CORP·Filed 2022·Granted Feb 27, 2024·0 cites·14 claims
- 4458US2014001359A1Method for inspecting and measuring sample and scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2013·Application pending·0 cites
- 4557US8487250B2Method for detecting information of an electronic potential on a sample and charged particle beam apparatusYAMAZAKI MINORU·Filed 2012·Granted Jul 16, 2013·0 cites·11 claims
- 4656US2023071801A1Electron beam application apparatus and inspection methodHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 4753US8487253B2Scanning electron microscopeYAMAZAKI MINORU·Filed 2011·Granted Jul 16, 2013·0 cites·6 claims
- 4852US11404970B2Power converterFUJI ELECTRIC CO LTD·Filed 2021·Granted Aug 2, 2022·0 cites·9 claims
- 4952US4587040AThick film thermistor compositionHITACHI LTD·Filed 1979·Granted May 6, 1986·7 cites·7 claims
- 5051US9484181B2Charged particle beam apparatus and trajectory correction method in charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2014·Granted Nov 1, 2016·0 cites·13 claims
Showing the top 50 of 62 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Akira Ikegami files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →