Inventor · disambiguated record
Akio Ishikawa
Also filed as: ISHIKAWA AKIO
37 granted patents·24 pending applications·310 citations·filing 1975–2022
97Inventor score
Top patents by PatentIndex Score
61 records- 0195US10109427B2Layer compositions with improved electrical parameters comprising PEDOT/PSS and a stabilizerISHIKAWA AKIO·Filed 2011·Granted Oct 23, 2018·16 cites·13 claims
- 0291US8204316B2Apparatus, method and computer program for classifying pixels in a motion picture as foreground or backgroundPANAHPOUR TEHRANI MEHRDAD·Filed 2008·Granted Jun 19, 2012·30 cites·8 claims
- 0390US8150140B2System and method for a semiconductor lithographic process control using statistical information in defect identificationKITAMURA TADASHI·Filed 2010·Granted Apr 3, 2012·15 cites·17 claims
- 0489US8311089B2Multi-view video compression coding method and apparatusISHIKAWA AKIO·Filed 2007·Granted Nov 13, 2012·15 cites·20 claims
- 0587US11600449B2Layer compositions with improved electrical parameters comprising PEDOT/PSS and a stabilizerHERAEUS DEUTSCHLAND GMBH & CO KG·Filed 2018·Granted Mar 7, 2023·1 cites·30 claims
- 0686US6665690B2System and method for determining respective lengths of recording units used for recording different types of data on disc mediumSONY CORP·Filed 1998·Granted Dec 16, 2003·40 cites·4 claims
- 0783US4019228ACrimping apparatusMITSUBISHI RAYON CO·Filed 1975·Granted Apr 26, 1977·21 cites·9 claims
- 0882US8422761B2Defect and critical dimension analysis systems and methods for a semiconductor lithographic processKITAMURA TADASHI·Filed 2009·Granted Apr 16, 2013·12 cites·8 claims
- 0981US8687000B2Image generating apparatus and computer programPANAHPOUR TEHRANI MEHRDAD·Filed 2010·Granted Apr 1, 2014·8 cites·10 claims
- 1076US8243122B2Video method for generating free viewpoint video image using divided local regionsISHIKAWA AKIO·Filed 2008·Granted Aug 14, 2012·8 cites·3 claims
- 1176US7096237B2Recording and/or reproduction apparatus, file management method and providing mediumSONY CORP·Filed 2002·Granted Aug 22, 2006·9 cites·4 claims
- 1274US7010504B2Competitive buying and selling system and its control methodDDI CORP·Filed 2001·Granted Mar 7, 2006·6 cites·8 claims
- 1373US8428350B2Color correction apparatus, method and computer programPANAHPOUR TEHRANI MEHRDAD·Filed 2008·Granted Apr 23, 2013·4 cites·17 claims
- 1471US7492942B2Image defect inspection method, image defect inspection apparatus, and appearance inspection apparatusTOKYO SEIMITSU CO LTD·Filed 2005·Granted Feb 17, 2009·4 cites·10 claims
- 1571US7330581B2Image defect inspection method, image defect inspection apparatus and appearance inspection apparatusTOKYO SEIMITSU CO LTD·Filed 2003·Granted Feb 12, 2008·16 cites·29 claims
- 1668US9453800B2Apparatus and method of inspecting a defect of an objectSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Sep 27, 2016·1 cites·16 claims
- 1768US6838413B2Oxysulfide photocatalyst for decomposition of water by visible lightJAPAN SCIENCE & TECH AGENCY·Filed 2002·Granted Jan 4, 2005·9 cites·12 claims
- 1866US10429315B2Imaging apparatus and imaging methodSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Oct 1, 2019·1 cites·8 claims
- 1966US7327871B2Defect inspecting method, defect inspecting apparatus and inspection machineTOKYO SEIMITSU CO LTD·Filed 2004·Granted Feb 5, 2008·11 cites·12 claims
- 2066US2004249744A1Competitive buying and selling system, its control method, and recording media having its control programs recorded thereonDDI CORP·Filed 2004·Application pending·0 cites
- 2165US5841185ASemiconductor device having CMOS transistorsNIPPON STEEL CORP·Filed 1996·Granted Nov 24, 1998·32 cites·10 claims
- 2264US8259160B2Method for generating free viewpoint video image in three-dimensional movement and recording mediumISHIKAWA AKIO·Filed 2009·Granted Sep 4, 2012·1 cites·8 claims
- 2363US8548227B2Image processing apparatus and computer programPANAHPOUR TEHRANI MEHRDAD·Filed 2010·Granted Oct 1, 2013·1 cites·4 claims
- 2463US7346207B2Image defect inspection method, image defect inspection apparatus, and appearance inspection apparatusTOKYO SEIMITSU CO LTD·Filed 2005·Granted Mar 18, 2008·3 cites·21 claims
- 2561US5828120ASemiconductor device and production method thereofNIPPON STEEL CORP·Filed 1997·Granted Oct 27, 1998·25 cites·26 claims
- 2659US12148140B2Process condition estimating apparatus, method, and programALITECS CORP·Filed 2022·Granted Nov 19, 2024·0 cites·15 claims
- 2759US8164633B2Calibration apparatus and method for imaging devices and computer programPANAHPOUR TEHRANI MEHRDAD·Filed 2009·Granted Apr 24, 2012·2 cites·13 claims
- 2855US6728175B2Information recording method and apparatusSONY CORP·Filed 2001·Granted Apr 27, 2004·2 cites·8 claims
- 2953US7356249B2Apparatus and method for recording/reproducing data, which enable reading of data recorded even when the apparatus stops due to a power failureSONY CORP·Filed 2001·Granted Apr 8, 2008·2 cites·18 claims
- 3051US6349080B1Method and apparatus for efficient reading of data from disc record medium by selecting reading order of data unitsSONY CORP·Filed 1999·Granted Feb 19, 2002·9 cites·6 claims
- 3151US2024404762A1Process for producing polymer capacitors for high reliability applicationsHERAEUS EPURIO GMBH·Filed 2022·Application pending·0 cites
- 3250US11972908B2Solid electrolytic capacitor with conductive polymer layer attaining excellent metal ion migration resistanceHERAEUS DEUTSCHLAND GMBH & CO KG·Filed 2020·Granted Apr 30, 2024·0 cites·14 claims
- 3348US2007296962A1Surface inspection apparatus and surface inspection methodISHIKAWA AKIO·Filed 2007·Application pending·0 cites
- 3447US10902530B2Production process analysis methodMITSUBISHI CHEM ENG CORP·Filed 2017·Granted Jan 26, 2021·0 cites·5 claims
- 3547US8811717B2Image generating apparatus and computer programPANAHPOUR TEHRANI MEHRDAD·Filed 2009·Granted Aug 19, 2014·0 cites·11 claims
- 3647US2007160135A1Multi-view video coding method and apparatusKDDI CORP·Filed 2006·Application pending·0 cites
- 3746US2016065958A1Method for encoding a plurality of input images, and storage medium having program stored thereon and apparatusNAT INST INF & COMM TECH·Filed 2014·Application pending·0 cites
- 3846US2007285437A1System for and method of managing image dataFUJIFILM CORP·Filed 2007·Application pending·0 cites
- 3946US2016057414A1Method for encoding a plurality of input images, and storage medium having program stored thereon and apparatusNAT INST INF & COMM TECH·Filed 2014·Application pending·0 cites
- 4046US2007296735A1System for and method of managing drawingsFUJIFILM CORP·Filed 2007·Application pending·0 cites
- 4146US2007276886A1Method of and apparatus for backing up data and method of and apparatus for restoring data in data management systemFUJIFILM CORP·Filed 2007·Application pending·0 cites
- 4246US2008001946A1Apparatus for and method of displaying imageFUJIFILM CORP·Filed 2007·Application pending·0 cites
- 4345US2008040064A1Surface inspection apparatus and surface inspection methodISHIKAWA AKIO·Filed 2007·Application pending·0 cites
- 4445US2015271522A1Method, program and apparatus for reducing data size of a plurality of images containing mutually similar information, and data structure representing a plurality of images containing mutually similar informationNAT INST INF & COMM TECH·Filed 2013·Application pending·0 cites
- 4545US2015256819A1Method, program and apparatus for reducing data size of a plurality of images containing mutually similar informationNAT INST INF & COMM TECH·Filed 2013·Application pending·0 cites
- 4645US2006222232A1Appearance inspection apparatus and appearance inspection methodISHIKAWA AKIO·Filed 2006·Application pending·0 cites
- 4744US2007165940A1Semiconductor surface inspection apparatus, surface inspection method, and semiconductor manufacturing apparatusISHIKAWA AKIO·Filed 2007·Application pending·0 cites
- 4844US2007165211A1Semiconductor manufacturing apparatus, semiconductor surface inspection apparatus, and surface inspection methodISHIKAWA AKIO·Filed 2007·Application pending·0 cites
- 4944US2003198145A1Recording and/or reproduction apparatus, file management method and providing mediumSONY CORP·Filed 2003·Application pending·0 cites
- 5043US2008175466A1Inspection apparatus and inspection methodISHIKAWA AKIO·Filed 2008·Application pending·0 cites
Showing the top 50 of 61 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →