Inventor · disambiguated record
Akihiro Nakae
Also filed as: NAKAE AKIHIRO
10 granted patents·2 pending applications·143 citations·filing 1997–2014
89Inventor score
Files withMITSUBISHI ELECTRIC CORP5RENESAS TECH CORP3RENESAS ELECTRONICS CORP2ISHII YASUSHI1TAOKA HIRONOBU1
Top patents by PatentIndex Score
12 records- 0176US6760892B2Apparatus for evaluating lithography process margin simulating layout pattern of semiconductor deviceRENESAS TECH CORP·Filed 2002·Granted Jul 6, 2004·18 cites·6 claims
- 0271US6048647APhase shift mask of attenuation type and manufacturing method thereofMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Apr 11, 2000·32 cites·1 claims
- 0364US5867253AMethod of correcting light proximity effectMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Feb 2, 1999·24 cites·6 claims
- 0462US5989756APhoto mask and method for fabricating semiconductor devices using the photo maskMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Nov 23, 1999·22 cites·5 claims
- 0559US6801297B2Exposure condition determination systemRENESAS TECH CORP·Filed 2002·Granted Oct 5, 2004·7 cites·14 claims
- 0658US5888677AExposure mask, method of fabricating same, and method of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Mar 30, 1999·18 cites·8 claims
- 0757US5955227APattern determination methodMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Sep 21, 1999·18 cites·3 claims
- 0853US6916749B2Method of manufacturing semiconductor deviceRENESAS TECH CORP·Filed 2003·Granted Jul 12, 2005·4 cites·8 claims
- 0945US2014377889A1Semiconductor device manufacturing methodRENESAS ELECTRONICS CORP·Filed 2014·Application pending·0 cites
- 1043US9368385B2Manufacturing method for semiconductor integrated circuit deviceRENESAS ELECTRONICS CORP·Filed 2013·Granted Jun 14, 2016·0 cites·14 claims
- 1141US2004225993A1Apparatus for evaluating lithography process margin simulating layout pattern of semiconductor deviceTAOKA HIRONOBU·Filed 2004·Application pending·0 cites
- 1239US8951860B2Manufacturing method of semiconductor deviceISHII YASUSHI·Filed 2012·Granted Feb 10, 2015·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →