Inventor · disambiguated record
Akira Noda
Also filed as: NODA AKIRA
49 granted patents·21 pending applications·604 citations·filing 1986–2025
98Inventor score
Top patents by PatentIndex Score
70 records- 0194US5576602AMethod for extracting charged particle beam and small-sized accelerator for charged particle beamHITACHI LTD·Filed 1994·Granted Nov 19, 1996·122 cites·19 claims
- 0291US6791257B1Photoelectric conversion functional element and production method thereofJAPAN ENERGY CORP·Filed 2000·Granted Sep 14, 2004·105 cites·33 claims
- 0390US5089269ACosmetic containing fine soft microcapsulesSHISEIDO CO LTD·Filed 1988·Granted Feb 18, 1992·120 cites·2 claims
- 0487US10236167B1Peak waveform processing deviceSHIMADZU CORP·Filed 2018·Granted Mar 19, 2019·4 cites·2 claims
- 0586US9362431B2Compound semiconductor single crystal ingot for photoelectric conversion devices, photoelectric conversion device, and production method for compound semiconductor single crystal ingot for photoelectric conversion devicesJX NIPPON MINING & METALS CORP·Filed 2014·Granted Jun 7, 2016·2 cites·12 claims
- 0684US5514065AWear- and seizing-resistant roll for hot rolling and method of making the rollHITACHI METALS LTD·Filed 1994·Granted May 7, 1996·22 cites·14 claims
- 0777US10198630B2Peak detection methodSHIMADZU CORP·Filed 2013·Granted Feb 5, 2019·5 cites·28 claims
- 0876US11341404B2Analysis-data analyzing device and analysis-data analyzing method that calculates or updates a degree of usefulness of each dimension of an input in a machine-learning modelSHIMADZU CORP·Filed 2018·Granted May 24, 2022·2 cites·5 claims
- 0976US6166885AMagnetic recording medium and method for producing the sameKAO CORP·Filed 1999·Granted Dec 26, 2000·23 cites·11 claims
- 1075US2025314626A1Quantification Method, Analysis System, and Recording MediumSHIMADZU CORP·Filed 2025·Application pending·0 cites
- 1175US2025314625A1Quantification Method, Analysis System, and Recording MediumSHIMADZU CORP·Filed 2025·Application pending·0 cites
- 1271US8222617B2Laser-driven particle beam irradiation apparatus and methodISEKI YASUSHI·Filed 2009·Granted Jul 17, 2012·16 cites·6 claims
- 1371US6949689B2Absorbent articleKAO CORP·Filed 2001·Granted Sep 27, 2005·51 cites·4 claims
- 1468US11349037B2Indium phosphide wafer, photoelectric conversion element, and method for producing a monocrystalline indium phosphideJX NIPPON MINING & METALS CORP·Filed 2014·Granted May 31, 2022·0 cites·6 claims
- 1568US8666681B2Mass analysis data analyzing method and mass analysis data analyzing apparatusNODA AKIRA·Filed 2008·Granted Mar 4, 2014·2 cites·11 claims
- 1668US5106576AMethod of producing a wear-resistant compound rollHITACHI METALS LTD·Filed 1991·Granted Apr 21, 1992·11 cites·4 claims
- 1767US11926924B2Indium phosphide substrate, semiconductor epitaxial wafer, method for producing indium phosphide single-crystal ingot and method for producing indium phosphide substrateJX METALS CORP·Filed 2021·Granted Mar 12, 2024·0 cites·7 claims
- 1866US11967659B2Semiconductor wafer, radiation detection element, radiation detector, and production method for compound semiconductor monocrystalline substrateJX METALS CORP·Filed 2019·Granted Apr 23, 2024·0 cites·5 claims
- 1966US11211505B2Indium phosphide wafer, photoelectric conversion element, and method for producing a monocrystalline indium phosphideJX NIPPON MINING & METALS CORP·Filed 2017·Granted Dec 28, 2021·0 cites·4 claims
- 2065US12021160B2Semiconductor wafer, radiation detection element, radiation detector, and production method for compound semiconductor monocrystalline substrateJX METALS CORP·Filed 2019·Granted Jun 25, 2024·0 cites·5 claims
- 2165US7352461B2Particle detecting method and storage medium storing program for implementing the methodTOKYO ELECTRON LTD·Filed 2005·Granted Apr 1, 2008·2 cites·8 claims
- 2265US2024011950A1Chromatography quality control device and chromatography quality control methodSHIMADZU CORP·Filed 2023·Application pending·0 cites
- 2364US5053284AWear-resistant compound rollHITACHI METALS LTD·Filed 1990·Granted Oct 1, 1991·14 cites·4 claims
- 2464US2024264132A1Waveform shape learning device, waveform shape learning method, non-transitory computer readable medium storing waveform shape learning program and model function estimation deviceSHIMADZU CORP·Filed 2024·Application pending·0 cites
- 2564US2025327782A1Data Processing Method, Chromatograph Mass Spectrometer, and Computer Readable Medium Having Program Stored Thereon In Non-Transitory MannerSHIMADZU CORP·Filed 2025·Application pending·0 cites
- 2663US10557215B2CdTe-based compound single crystal and method for producing the sameJX NIPPON MINING & METALS CORP·Filed 2018·Granted Feb 11, 2020·0 cites·8 claims
- 2762US2023126478A1Peak area display device, peak area display method, peak area calculation device and peak area calculation methodSHIMADZU CORP·Filed 2022·Application pending·0 cites
- 2862US2024219204A1Measurement data analysis device, measurement data analysis method and non-transitory computer readable medium storing measurement data analysis programSHIMADZU CORP·Filed 2023·Application pending·0 cites
- 2961US12292425B2Peak tracking device, peak tracking method and non-transitory computer readable medium storing peak tracking programSHIMADZU CORP·Filed 2021·Granted May 6, 2025·0 cites·8 claims
- 3060US8373016B2Absorbent member and method of producing the sameKAO CORP·Filed 2007·Granted Feb 12, 2013·4 cites·9 claims
- 3160US6642922B1Interface apparatus for dynamic positioning and orientation of a robot through real-time parameter modificationsFUJITSU LTD·Filed 1999·Granted Nov 4, 2003·26 cites·26 claims
- 3260US2019196170A1Method for setting analysis target region by extracting, from an observed image divisional areas having a value of image characteristic quantity within a value rangeSHIMADZU CORP·Filed 2019·Application pending·0 cites
- 3360US2024393302A1Model function fitting device and model function fitting methodSHIMADZU CORP·Filed 2022·Application pending·0 cites
- 3459US11391852B2Radiation detection element, and method for manufacturing sameJX NIPPON MINING & METALS CORP·Filed 2018·Granted Jul 19, 2022·0 cites·11 claims
- 3558US7879789B2Surfactant and composition containing the sameSHISEIDO CO LTD·Filed 2007·Granted Feb 1, 2011·0 cites·7 claims
- 3658US6500201B1HeaterKAO CORP·Filed 1999·Granted Dec 31, 2002·21 cites·7 claims
- 3758US6043961AMagnetic recording medium and method for producing the sameKAO CORP·Filed 1996·Granted Mar 28, 2000·11 cites·17 claims
- 3857US12298285B2Sample measurement device and measurement parameter setting assistance deviceSHIMADZU CORP·Filed 2018·Granted May 13, 2025·0 cites·10 claims
- 3955US2023204548A1Peak tracking device, peak tracking method and peak tracking programSHIMADZU CORP·Filed 2021·Application pending·0 cites
- 4054US11371164B2Compound semiconductor and method for producing single crystal of compound semiconductorJX NIPPON MINING & METALS CORP·Filed 2017·Granted Jun 28, 2022·0 cites·7 claims
- 4153US7264037B2Molding of slurry-form semi-solidified metalHONDA MOTOR CO LTD·Filed 2004·Granted Sep 4, 2007·2 cites·23 claims
- 4253US5403670ACompound sleeve roll and method for producing same comprising chamfered axial endsHITACHI METALS LTD·Filed 1993·Granted Apr 4, 1995·9 cites·7 claims
- 4352US2015301323A1System for setting analysis target regionSHIMADZU CORP·Filed 2012·Application pending·0 cites
- 4451US10416134B2Chromatogram data processing method and chromatogram data processing apparatusSHIMADZU CORP·Filed 2014·Granted Sep 17, 2019·0 cites·9 claims
- 4551US6231873B1Cosmetic containing fine soft microcapsulesSHISEIDO CO LTD·Filed 1997·Granted May 15, 2001·14 cites·9 claims
- 4650US8815010B2InP single crystal wafer and method for producing InP single crystalNODA AKIRA·Filed 2005·Granted Aug 26, 2014·0 cites·9 claims
- 4750US2005176615A1Detergent compositionsFiled 2003·Application pending·0 cites
- 4849US10429365B2Chromatogram data processing systemSHIMADZU CORP·Filed 2013·Granted Oct 1, 2019·0 cites·12 claims
- 4948US10161793B2Spectrum analysis apparatus and calibration methodSHIMADZU CORP·Filed 2017·Granted Dec 25, 2018·0 cites·9 claims
- 5048US9995922B2Analysis target region setting apparatusSHIMADZU CORP·Filed 2013·Granted Jun 12, 2018·0 cites·18 claims
Showing the top 50 of 70 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →