Inventor · disambiguated record
Akihiro Ohsawa
Also filed as: OHSAWA AKIHIRO
10 granted patents·5 pending applications·44 citations·filing 2000–2021
85Inventor score
Top patents by PatentIndex Score
15 records- 0180US10256017B2Rare earth based permanent magnetTDK CORP·Filed 2016·Granted Apr 9, 2019·2 cites·8 claims
- 0280US10242780B2Rare earth based permanent magnetTDK CORP·Filed 2016·Granted Mar 26, 2019·2 cites·2 claims
- 0374US7495542B2Film temperature sensor and temperature sensing substrateKELK LTD·Filed 2005·Granted Feb 24, 2009·10 cites·9 claims
- 0474US6626236B1Substrate temperature control plate and substrate temperature control apparatus comprising sameKOMATSU MFG CO LTD·Filed 2000·Granted Sep 30, 2003·20 cites·7 claims
- 0568US9353503B2Work vehicleKOMATSU MFG CO LTD·Filed 2014·Granted May 31, 2016·4 cites·12 claims
- 0667US9523182B2Work vehicleKOMATSU MFG CO LTD·Filed 2014·Granted Dec 20, 2016·4 cites·15 claims
- 0760US9528244B2Work vehicleKOMATSU MFG CO LTD·Filed 2014·Granted Dec 27, 2016·2 cites·20 claims
- 0857US12057262B2Extrusion die for hot-deformed magnet and method for manufacturing hot-deformed magnet using sameTDK CORP·Filed 2021·Granted Aug 6, 2024·0 cites·3 claims
- 0957US10192661B2R—T—B based sintered magnetTDK CORP·Filed 2014·Granted Jan 29, 2019·0 cites·5 claims
- 1048US2014311289A1R-t-b based sintered magnetTDK CORP·Filed 2014·Application pending·0 cites
- 1145US11363705B2Extreme ultraviolet light generation apparatus, extreme ultraviolet light generation system, and electronic device manufacturing methodGIGAPHOTON INC·Filed 2021·Granted Jun 14, 2022·0 cites·18 claims
- 1238US2019326054A1Method for producing rare earth magnetTDK CORP·Filed 2017·Application pending·0 cites
- 1338US2007009010A1Wafer temperature measuring method and apparatusSHIO KOJI·Filed 2006·Application pending·0 cites
- 1436US2009020263A1Cooling Apparatus for FluidOHSAWA AKIHIRO·Filed 2007·Application pending·0 cites
- 1535US2003231694A1Temperature-measuring deviceFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →