Inventor · disambiguated record
Akihiko Sekine
Also filed as: SEKINE AKIHIKO
25 granted patents·4 pending applications·416 citations·filing 1988–2024
96Inventor score
Top patents by PatentIndex Score
29 records- 0190US8724870B2Ophthalmic observation apparatusSEKINE AKIHIKO·Filed 2010·Granted May 13, 2014·20 cites·17 claims
- 0288US6104481ASurface inspection apparatusTOPCON CORP·Filed 1998·Granted Aug 15, 2000·113 cites·12 claims
- 0387US7379176B2Mask defect inspection apparatusTOPCON CORP·Filed 2005·Granted May 27, 2008·8 cites·17 claims
- 0484US5141302AIntraocular length measuring instrumentTOPCON CORP·Filed 1991·Granted Aug 25, 1992·54 cites·4 claims
- 0571US7551273B2Mask defect inspection apparatusTOPCON CORP·Filed 2008·Granted Jun 23, 2009·2 cites·17 claims
- 0671US7522276B2Pattern inspection methodTOSHIBA KK·Filed 2008·Granted Apr 21, 2009·2 cites·22 claims
- 0771US5912732ASurface detecting apparatusTOPCON CORP·Filed 1997·Granted Jun 15, 1999·37 cites·13 claims
- 0863US7372560B2Pattern inspection apparatusTOSHIBA KK·Filed 2004·Granted May 13, 2008·3 cites·22 claims
- 0960US7348585B2Surface inspection apparatusTOPCON CORP·Filed 2005·Granted Mar 25, 2008·4 cites·18 claims
- 1059US7245366B2Surface inspection method and surface inspection apparatusTOPCON CORP·Filed 2004·Granted Jul 17, 2007·3 cites·12 claims
- 1158US2025063954A1Quantum device and method of manufacturing quantum deviceFUJITSU LTD·Filed 2024·Application pending·0 cites
- 1256US2014078466A1Method of controlling ophthalmic observation apparatus and ophthalmic observation apparatusTOPCON CORP·Filed 2013·Application pending·0 cites
- 1354US7154597B2Method for inspecting surface and apparatus for inspecting itTOPCON CORP·Filed 2004·Granted Dec 26, 2006·5 cites·9 claims
- 1446US9476693B2Optical property measurement apparatus and optical property measurement methodKK TOPCON·Filed 2013·Granted Oct 25, 2016·0 cites·14 claims
- 1544US7760349B2Mask-defect inspecting apparatus with movable focusing lensTOPCON CORP·Filed 2005·Granted Jul 20, 2010·0 cites·2 claims
- 1644US5347328AApparatus for measuring an intraocular length between anterior and posterior portions of an eyeTOPCON CORP·Filed 1992·Granted Sep 13, 1994·37 cites·12 claims
- 1744US2004169853A1Surface inspection apparatusFiled 2004·Application pending·0 cites
- 1842US5347327AProcess and apparatus for measuring axial eye lengthTOPCON CORP·Filed 1992·Granted Sep 13, 1994·32 cites·8 claims
- 1941US4968130ALaser beam scanning type ophthalmological instrumentTOPCON CORP·Filed 1988·Granted Nov 6, 1990·23 cites·11 claims
- 2040US9456745B2Fundus observation apparatus and fundus image analyzing apparatusUNIV KYOTO·Filed 2013·Granted Oct 4, 2016·0 cites·27 claims
- 2140US5812259AMethod and apparatus for inspecting slight defects in a photomask patternTOPCON CORP·Filed 1996·Granted Sep 22, 1998·7 cites·7 claims
- 2239US6100970AApparatus for inspecting slight defects on a photomask patternTOPCON CORP·Filed 1998·Granted Aug 8, 2000·6 cites·8 claims
- 2339US2004095572A1Laser light source device and surface inspection apparatus using itTOPCON CORP·Filed 2003·Application pending·0 cites
- 2437US4933756AEye fundus cameraTOPCON CORP·Filed 1989·Granted Jun 12, 1990·14 cites·16 claims
- 2537US4854691ALaser beam scanning type eye fundus cameraTOKYO OPTICAL·Filed 1988·Granted Aug 8, 1989·15 cites·15 claims
- 2634US5349399AIntraocular length measuring instrument having phase compensating meansTOPCON CORP·Filed 1993·Granted Sep 20, 1994·13 cites·3 claims
- 2733US5066116AOptical system in a laser scanning eye fundus cameraTOPCON CORP·Filed 1990·Granted Nov 19, 1991·11 cites·26 claims
- 2830US5088811ALaser beam scanning type eye fundus observing deviceTOPCON CORP·Filed 1991·Granted Feb 18, 1992·6 cites·4 claims
- 2929US5107106AScanning and detecting optical deviceTOPCON CORP·Filed 1989·Granted Apr 21, 1992·1 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →