Inventor · disambiguated record
Akira Yonezawa
Also filed as: NAKAGAWA SEIICHI · YONEZAWA AKIRA
22 granted patents·5 pending applications·482 citations·filing 1979–2023
96Inventor score
Files withYAMAICHI ELECTRONICS CO LTD8SEIKO INSTR INC7INT PRECISION INC3SII NANOTECHNOLOGY INC3ANAZAWA NORIMICHI1
Top patents by PatentIndex Score
27 records- 0191US6351885B2Method of making conductive bump on wiring boardYAMAICHI ELECTRONICS CO LTD·Filed 1998·Granted Mar 5, 2002·84 cites·3 claims
- 0284US6037589AElectron beam deviceSEIKO INSTR INC·Filed 1998·Granted Mar 14, 2000·45 cites·20 claims
- 0383US5973395AIC package having a single wiring sheet with a lead pattern disposed thereonYAMAICHI ELECTRONICS CO LTD·Filed 1997·Granted Oct 26, 1999·83 cites·28 claims
- 0481US7375328B2Charged particle beam apparatus and contamination removal method thereforHOLON CO LTD·Filed 2005·Granted May 20, 2008·7 cites·14 claims
- 0581US6617579B2Scanning electronic beam apparatusSEIKO INSTR INC·Filed 2001·Granted Sep 9, 2003·16 cites·32 claims
- 0681US4219732AMagnetic electron lensJEOL LTD·Filed 1979·Granted Aug 26, 1980·19 cites·5 claims
- 0780USD466554STape transfer deviceFUJI KAGAKU SHIKOGYO·Filed 2001·Granted Dec 3, 2002·26 cites·1 claims
- 0880US5950306ACircuit boardYAMAICHI ELECTRONICS CO LTD·Filed 1996·Granted Sep 14, 1999·53 cites·3 claims
- 0977US6504164B2Electron beam apparatusSEIKO INSTR INC·Filed 2000·Granted Jan 7, 2003·16 cites·27 claims
- 1076US6243946B1Method of forming an interlayer connection structureYAMAICHI ELECTRONICS CO LTD·Filed 1997·Granted Jun 12, 2001·42 cites·14 claims
- 1175US6897450B2Electromagnetic field superimposed lens and electron beam device using this electromagnetic field superimposed lensSII NANOTECHNOLOGY INC·Filed 2001·Granted May 24, 2005·11 cites·19 claims
- 1274US6740888B2Electron beam apparatusSII NANOTECHNOLOGY INC·Filed 2003·Granted May 25, 2004·10 cites·8 claims
- 1368US6949745B2Electron beam apparatusSII NANOTECHNOLOGY INC·Filed 2003·Granted Sep 27, 2005·7 cites·4 claims
- 1465US12512613B2High-frequency signal transmission device and electrical connection method for wiring board and connectorYAMAICHI ELECTRONICS CO LTD·Filed 2023·Granted Dec 30, 2025·0 cites·13 claims
- 1564US5241176AScanning electron beam microscope with high resolution at low accelerating voltageSEIKO INSTR INC·Filed 1991·Granted Aug 31, 1993·17 cites·4 claims
- 1662US4434367AElectron microscopeINT PRECISION INC·Filed 1981·Granted Feb 28, 1984·10 cites·4 claims
- 1760US5023457AElectron beam deviceSEIKO INSTR INC·Filed 1990·Granted Jun 11, 1991·15 cites·4 claims
- 1857US12477653B2High-frequency signal transmission device and high-frequency signal transmission cableYAMAICHI ELECTRONICS CO LTD·Filed 2021·Granted Nov 18, 2025·0 cites·20 claims
- 1957US4961003AScanning electron beam apparatusSEIKO INSTR INC·Filed 1989·Granted Oct 2, 1990·9 cites·4 claims
- 2048US2025024588A1Cable device and method of producing the sameYAMAICHI ELECTRONICS CO LTD·Filed 2021·Application pending·0 cites
- 2147US4429222ATransmission electron microscopeINT PRECISION INC·Filed 1981·Granted Jan 31, 1984·5 cites·2 claims
- 2247US2024195127A1Connector and high-frequency signal transmission deviceYAMAICHI ELECTRONICS CO LTD·Filed 2021·Application pending·0 cites
- 2345US2010006756A1Charged particle beam apparatus and method for generating charged particle beam imageANAZAWA NORIMICHI·Filed 2006·Application pending·0 cites
- 2439US6335530B1Objective lens for scanning electron microscopeSEIKO INSTR INC·Filed 1998·Granted Jan 1, 2002·4 cites·34 claims
- 2538US2005072529A1Coating film transfer toolFiled 2003·Application pending·0 cites
- 2637US2004067312A1Method for forming thin film and catalyzed treatment solution used thereforUNIV KANAGAWA·Filed 2003·Application pending·0 cites
- 2736US4383176AObjective lens for electron microscopeINT PRECISION INC·Filed 1981·Granted May 10, 1983·3 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →