Inventor · disambiguated record
Akie Yutani
Also filed as: YUTANI AKIE
14 granted patents·4 pending applications·36 citations·filing 1999–2024
87Inventor score
Files withMITSUBISHI ELECTRIC CORP6RENESAS ELECTRONICS CORP5RENESAS TECH CORP5ICHINOSE KAZUHITO1YUTANI AKIE1
Top patents by PatentIndex Score
18 records- 0180US6746876B2Capacitor manufacturing method having dielectric formed before electrodeRENESAS TECH CORP·Filed 2002·Granted Jun 8, 2004·27 cites·14 claims
- 0271US9064771B2Solid-state image sensing device and method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2014·Granted Jun 23, 2015·0 cites·2 claims
- 0364US8728853B2Solid-state image sensing device and method of manufacturing the sameYUTANI AKIE·Filed 2009·Granted May 20, 2014·1 cites·6 claims
- 0463US9281329B2Solid-state image sensing device and method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2015·Granted Mar 8, 2016·0 cites·6 claims
- 0559US2025142934A1Semiconductor device and method for manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 0657US10157955B2Solid-state image sensing device and method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2017·Granted Dec 18, 2018·0 cites·12 claims
- 0757US7834404B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2009·Granted Nov 16, 2010·0 cites·2 claims
- 0856US6344400B1Method of manufacturing capacitorMITSUBISHI ELECTRIC CORP·Filed 2000·Granted Feb 5, 2002·8 cites·7 claims
- 0954US9583532B2Solid-state image sensing device and method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2016·Granted Feb 28, 2017·0 cites·14 claims
- 1052US7598171B2Method of manufacturing a semiconductor deviceRENESAS TECH CORP·Filed 2007·Granted Oct 6, 2009·0 cites·11 claims
- 1147US8058166B2Method of manufacturing a semiconductor deviceICHINOSE KAZUHITO·Filed 2010·Granted Nov 15, 2011·0 cites·5 claims
- 1242US2007173050A1Semiconductor device and method of manufacturing the sameRENESAS TECH CORP·Filed 2007·Application pending·0 cites
- 1341US10439092B2Infrared ray detection element and method for manufacturing infrared ray detection elementMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Oct 8, 2019·0 cites·10 claims
- 1440US11508777B2Infrared solid state imaging deviceMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Nov 22, 2022·0 cites·9 claims
- 1539US2006113676A1Semiconductor device and method of manufacture thereofRENESAS TECH CORP·Filed 2005·Application pending·0 cites
- 1636US2002125524A1Semiconductor device and method of manufacturing sameMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 1733US6686621B2Semiconductor deviceRENESAS TECH CORP·Filed 2002·Granted Feb 3, 2004·0 cites·5 claims
- 1828US6437968B1Capacitive elementMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Aug 20, 2002·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →