Inventor · disambiguated record
Alain Courteville
Also filed as: COURTEVILLE ALAIN
13 granted patents·2 pending applications·70 citations·filing 2006–2024
88Inventor score
Top patents by PatentIndex Score
15 records- 0196US9739600B1Chromatic confocal device and method for 2D/3D inspection of an object such as a waferFOGALE NANOTECH·Filed 2016·Granted Aug 22, 2017·33 cites·21 claims
- 0295US9494529B1Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer with variable spatial resolutionFOGALE NANOTECH·Filed 2016·Granted Nov 15, 2016·22 cites·18 claims
- 0386US12359910B2Device and method for measuring interfaces of an optical elementFOGALE NANOTECH·Filed 2021·Granted Jul 15, 2025·2 cites·20 claims
- 0482US11808656B2Device and method for measuring interfaces of an optical elementFOGALE NANOTECH·Filed 2019·Granted Nov 7, 2023·4 cites·14 claims
- 0575US12444039B2Method and a system for characterising structures through a substrateUNITY SEMICONDUCTOR·Filed 2024·Granted Oct 14, 2025·0 cites·17 claims
- 0670US7782468B2Method and device for measuring heights of patternsNANOTEC SOLUTION·Filed 2006·Granted Aug 24, 2010·7 cites·17 claims
- 0769US12079979B2Method and a system for characterising structures through a substrateUNITY SEMICONDUCTOR·Filed 2023·Granted Sep 3, 2024·0 cites·13 claims
- 0869US10240977B2Method for 2D/3D inspection of an object such as a waferFOGALE NANOTECH·Filed 2016·Granted Mar 26, 2019·1 cites·12 claims
- 0967US10919157B2Multi-distance detection device for a robot, and robot equipped with such (a) device(s)FOGALE NANOTECH·Filed 2018·Granted Feb 16, 2021·1 cites·14 claims
- 1061US12123698B1Method and a system for characterizing structures through a substrateUNITY SEMICONDUCTOR·Filed 2024·Granted Oct 22, 2024·0 cites·15 claims
- 1150US12163777B2Device and method for imaging and interferometry measurementsFOGALE NANOTECH·Filed 2020·Granted Dec 10, 2024·0 cites·17 claims
- 1245US11731285B2Apparatus provided with a capacitive detection and electric line(s) in the capacitive detection zoneFOGALE SENSORS·Filed 2019·Granted Aug 22, 2023·0 cites·15 claims
- 1341US11226188B2Low-coherence reflectometry method and device employing time-frequency detectionFOGALE NANOTECH·Filed 2018·Granted Jan 18, 2022·0 cites·16 claims
- 1440US2022130147A1Method and device for monitoring the environment of a robotFOGALE NANOTECH·Filed 2020·Application pending·0 cites
- 1533US2021178606A1Apparatus having a capacitive sensing system and electric line(s)FOGALE NANOTECH·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →