Inventor · disambiguated record

Alain C. Diebold

Also filed as: DIEBOLD ALAIN C · DIEBOLD ALAIN CHARLES

2 granted patents·8 citations·filing 2005–2015

53Inventor score

Technology areasG01B G01N

Files withSEMATECH INC1 UNIV NEW YORK STATE RES FOUND1

Top patents by PatentIndex Score

2 records

0182US10883924B2Metallic gratings and measurement methods thereofUNIV NEW YORK STATE RES FOUND·Filed 2015·Granted Jan 5, 2021·4 cites·62 claims
0259US7430051B2Methods for characterizing semiconductor material using optical metrologySEMATECH INC·Filed 2005·Granted Sep 30, 2008·4 cites·7 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →